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Patent Assignment Details
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Reel/Frame:047812/0081   Pages: 4
Recorded: 12/18/2018
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
NONE
Issue Dt:
Application #:
16311163
Filing Dt:
12/18/2018
Publication #:
Pub Dt:
06/13/2019
Title:
METHOD AND SYSTEM FOR TESTING OPTIMIZATION AND MOLDING OPTIMIZATION OF SEMICONDUCTOR DEVICES
Assignors
1
Exec Dt:
12/18/2018
2
Exec Dt:
12/18/2018
3
Exec Dt:
12/18/2018
4
Exec Dt:
12/18/2018
Assignees
1
NO.497, GAOSI ROAD, ZHANGJIANG HIGH-TECH PARK, PUDONG
SHANGHAI, CHINA 201210
2
22-23 ROOM, 3 FLOOR, 1 BUILDING NO.1268 TIANFU AVENUE, HI-TECH ZONE
CHENGDU, SICHUAN, CHINA 610041
Correspondence name and address
TIANCHEN LLC.
3302 TOWER1, NO.388 ZHONGJIANG ROAD, PUT
SHANGHAI, 200062 CHINA

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