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Patent #:
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Issue Dt:
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04/25/2000
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Application #:
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09050289
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Filing Dt:
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03/30/1998
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Title:
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MULTI-CHANNEL ARCHITECTURE WITH CHANNEL INDEPENDENT CLOCK SIGNALS
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Patent #:
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Issue Dt:
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04/10/2001
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Application #:
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09050505
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Filing Dt:
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03/30/1998
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Title:
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PERMANENT FAILURE MONITORING IN COMPLEX SYSTEMS
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Patent #:
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Issue Dt:
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03/27/2001
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Application #:
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09079985
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Filing Dt:
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05/15/1998
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Title:
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ONLINE DOCUMENTATION AND HELP SYSTEM FOR COMPUTER-BASED SYSTEMS
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Patent #:
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Issue Dt:
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02/06/2001
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Application #:
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09093485
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Filing Dt:
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06/08/1998
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Title:
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COMPRESSIBLE ELASTOMERIC CONTACT AND MECHANICAL ASSEMBLY THEREWITH
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Patent #:
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Issue Dt:
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02/26/2002
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Application #:
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09137439
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Filing Dt:
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08/20/1998
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Publication #:
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Pub Dt:
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08/09/2001
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Title:
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MEMORY LATENCY COMPENSATION
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Patent #:
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Issue Dt:
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10/16/2001
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Application #:
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09140427
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Filing Dt:
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08/26/1998
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Title:
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OPTIMIZED MEMORY ORGANIZATION IN A MULTI-CHANNEL ARCHITECTURE
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Patent #:
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Issue Dt:
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07/08/2003
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Application #:
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09175716
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Filing Dt:
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10/20/1998
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Title:
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LASER REPAIR APPARATUS AND METHOD
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Patent #:
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Issue Dt:
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08/15/2000
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Application #:
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09176405
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Filing Dt:
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10/20/1998
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Title:
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LASER MACHINING APPARATUS
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Patent #:
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Issue Dt:
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01/23/2001
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Application #:
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09183644
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Filing Dt:
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10/30/1998
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Title:
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EVALUATION SYSTEM AND METHOD FOR AD CONVERTER
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Patent #:
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Issue Dt:
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04/16/2002
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Application #:
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09185184
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Filing Dt:
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11/03/1998
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Title:
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FAILURE ANALYSIS MEMORY FOR SEMICONDUCTOR MEMORY TESTING DEVICES AND ITS STORAGE METHOD
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Patent #:
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Issue Dt:
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12/19/2000
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Application #:
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09193523
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Filing Dt:
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11/17/1998
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Title:
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METHOD FOR CALIBRATING VARIABLE DELAY CIRCUIT AND A VARIABLE DELAY CIRCUIT USING THE SAME
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Patent #:
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Issue Dt:
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02/06/2001
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Application #:
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09200909
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Filing Dt:
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11/27/1998
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Title:
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MAINTENANCE FREE TEST SYSTEM
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Patent #:
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Issue Dt:
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10/02/2001
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Application #:
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09201299
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Filing Dt:
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11/30/1998
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Title:
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METHOD FOR PRODUCING CONTACT STRUCTURES
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Patent #:
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Issue Dt:
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07/03/2001
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Application #:
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09240457
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Filing Dt:
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01/29/1999
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Title:
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PACKAGING AND INTERCONNECTION OF CONTACT STRUCTURE
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Patent #:
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Issue Dt:
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09/16/2003
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Application #:
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09246458
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Filing Dt:
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02/08/1999
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Title:
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APPARATUS FOR AND METHOD OF MEASURING A JITTER
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Patent #:
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Issue Dt:
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09/18/2001
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Application #:
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09251096
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Filing Dt:
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02/16/1999
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Title:
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APPARATUS FOR AND METHOD OF DETECTING A DELAY FAULT
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Patent #:
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Issue Dt:
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03/19/2002
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Application #:
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09259401
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Filing Dt:
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02/26/1999
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Title:
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DELTA TIME EVENT BASED TEST SYSTEM
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Patent #:
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Issue Dt:
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03/19/2002
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Application #:
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09268238
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Filing Dt:
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03/15/1999
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Title:
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EDITING APPARATUS AND GENERATING METHOD FOR PHYSICAL CONVERSION DEFINITION
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Patent #:
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Issue Dt:
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03/06/2001
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Application #:
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09272832
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Filing Dt:
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03/19/1999
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Title:
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"IC TESTING APPARATUS" BY TAKESHI ONISHI
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Patent #:
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Issue Dt:
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05/29/2001
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Application #:
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09277529
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Filing Dt:
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03/26/1999
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Title:
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APPARATUS FOR STORING CUSTOMER TRAYS
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Patent #:
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Issue Dt:
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12/04/2001
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Application #:
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09286358
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Filing Dt:
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04/05/1999
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Title:
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SKEW ADJUSTING METHOD IN IC TESTING APPARATUS AND PSEUDO DEVICE FOR USE IN THE METHOD
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Patent #:
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Issue Dt:
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02/18/2003
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Application #:
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09309306
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Filing Dt:
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05/11/1999
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Publication #:
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Pub Dt:
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12/27/2001
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Title:
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TRAY TRANSFER ARM, ELECTRONIC COMPONENT TESTING APPARATUS AND TRAY TRANSFER METHOD
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Patent #:
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Issue Dt:
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04/16/2002
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Application #:
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09312355
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Filing Dt:
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05/14/1999
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Title:
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SEMICONDUCTOR TEST SYSTEM
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Patent #:
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Issue Dt:
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07/09/2002
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Application #:
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09314887
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Filing Dt:
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05/19/1999
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Title:
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SEMICONDUCTOR DEVICE TESTING APPARATUS AND ITS CALIBRATION METHOD
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Patent #:
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Issue Dt:
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09/18/2001
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Application #:
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09315798
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Filing Dt:
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05/21/1999
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Title:
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VOLTAGE PROTECTION CIRCUIT FOR SEMICONDUCTOR TEST SYSTEM
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Patent #:
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Issue Dt:
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05/07/2002
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Application #:
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09330151
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Filing Dt:
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06/11/1999
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Title:
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IC PICKUP, IC CARRIER AND IC TESTING APPARATUS USING THE SAME
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Patent #:
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Issue Dt:
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06/26/2001
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Application #:
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09335398
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Filing Dt:
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06/17/1999
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Title:
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ELECTRON GUN USED IN AN ELECTRON BEAM EXPOSURE APPARATUS
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Patent #:
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Issue Dt:
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04/15/2003
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Application #:
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09338234
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Filing Dt:
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06/22/1999
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Title:
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CLOCK SIGNAL EXTRACTION CIRCUIT
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Patent #:
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Issue Dt:
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11/06/2001
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Application #:
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09339062
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Filing Dt:
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06/23/1999
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Title:
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DEVICE TESTING APPARATUS AND TEST METHOD
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Patent #:
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Issue Dt:
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04/17/2001
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Application #:
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09344851
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Filing Dt:
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06/28/1999
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Title:
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METHOD OF PRODUCING A CONTACT STRUCTURE
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Patent #:
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Issue Dt:
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09/18/2001
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Application #:
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09346045
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Filing Dt:
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07/07/1999
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Title:
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PROBE CARD FOR IC TESTING APPARATUS
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Patent #:
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Issue Dt:
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02/06/2001
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Application #:
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09347867
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Filing Dt:
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07/09/1999
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Title:
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SEMICONDUCTOR COMPONENT MOUNTING APPARATUS
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Patent #:
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Issue Dt:
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10/16/2001
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Application #:
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09348478
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Filing Dt:
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07/07/1999
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Title:
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OPTICAL SAMPLER
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Patent #:
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Issue Dt:
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04/02/2002
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Application #:
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09348489
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Filing Dt:
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07/07/1999
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Title:
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SEMICONDUCTOR DEVICE TESTING SYSTEM AND METHOD
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Patent #:
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Issue Dt:
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03/19/2002
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Application #:
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09368002
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Filing Dt:
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08/03/1999
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Title:
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PICK AND PLACE MECHANISM FOR CONTACTOR
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Patent #:
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Issue Dt:
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07/03/2001
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Application #:
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09368003
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Filing Dt:
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08/03/1999
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Title:
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CONTACT STRUCTURE FORMED BY MICROFABRICATION PROCESS
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Patent #:
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Issue Dt:
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09/04/2001
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Application #:
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09369046
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Filing Dt:
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08/04/1999
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Title:
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METHOD AND APPARATUS FOR DRIVING LASER DIODE
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Patent #:
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Issue Dt:
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07/10/2001
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Application #:
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09381062
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Filing Dt:
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09/10/1999
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Title:
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CONNECTOR
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Patent #:
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Issue Dt:
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12/03/2002
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Application #:
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09400929
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Filing Dt:
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09/22/1999
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Title:
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PARTICLE BEAM SYSTEM WITH A DEVICE FOR REDUCING THE ENERGY WIDTH OF A PARTICLE BEAM
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Patent #:
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Issue Dt:
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04/27/2004
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Application #:
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09408184
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Filing Dt:
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09/29/1999
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Title:
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ELECTRIC PART TEST SYSTEM
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Patent #:
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Issue Dt:
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02/03/2004
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Application #:
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09408280
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Filing Dt:
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09/29/1999
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Title:
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APPARATUS FOR AND METHOD OF MEASURING A JITTER
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Patent #:
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Issue Dt:
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06/18/2002
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Application #:
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09409109
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Filing Dt:
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09/30/1999
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Title:
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PARTICLE BEAM APPARATUS
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Patent #:
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Issue Dt:
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11/19/2002
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Application #:
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09409936
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Filing Dt:
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09/30/1999
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Title:
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SCAN PATH TEST SUPPORT
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Patent #:
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Issue Dt:
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04/09/2002
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Application #:
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09413768
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Filing Dt:
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10/07/1999
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Title:
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METHOD OF MEASURING A PROPAGATION DELAY TIME THROUGH A TRANSMISSION PATH IN A SEMICONDUCTOR INTEGRATED CIRCUIT TESTING APPARATUS AND SEMICONDUCTOR INTEGRATED CIRCUIT TESTING APPARATUS USING THE SAME
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Patent #:
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Issue Dt:
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05/15/2001
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Application #:
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09415913
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Filing Dt:
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10/12/1999
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Title:
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CONTACT STRUCTURE HAVING SILICON FINGER CONTACTORS AND TOTAL STACK-UP STRUCTURE USING SAME
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Patent #:
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Issue Dt:
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06/12/2001
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Application #:
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09428612
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Filing Dt:
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10/27/1999
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Title:
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OUTPUT AMPLITUDE CONTROL CIRCUIT
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Patent #:
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Issue Dt:
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01/21/2003
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Application #:
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09431441
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Filing Dt:
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11/01/1999
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Title:
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ELECTROSTATIC DEFLECTOR FOR ELECTRON BEAM EXPOSURE APPARATUS
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Patent #:
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Issue Dt:
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07/27/2004
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Application #:
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09437249
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Filing Dt:
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11/10/1999
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Title:
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TEST PATTERN GENERATOR, A TESTING DEVICE, AND A METHOD OF GENERATING A PLURALITY OF TEST PATTERNS
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Patent #:
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Issue Dt:
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02/11/2003
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Application #:
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09442272
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Filing Dt:
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11/17/1999
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Title:
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W - CDMA ANALYZING APPARATUS, METHOD OF DISPLAYING RESULTS OF W-CDMA ANALYSIS, AND RECORDING MEDIUM CARRYING RECORD OF PROGRAM FOR DISPLAYING RESULTS OF W-CDMA ANALYSIS
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Patent #:
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Issue Dt:
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02/06/2007
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Application #:
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09443021
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Filing Dt:
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11/18/1999
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Title:
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SEMICONDUCTOR TEST SYSTEM
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Patent #:
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Issue Dt:
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05/27/2003
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Application #:
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09444300
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Filing Dt:
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11/22/1999
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Title:
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FAIL INFORMATION OBTAINING DEVICE AND SEMICONDUCTOR MEMORY TESTER USING THE SAME
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Patent #:
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Issue Dt:
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04/10/2001
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Application #:
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09457764
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Filing Dt:
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12/10/1999
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Title:
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SOCKET AND CONNECTOR
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Patent #:
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Issue Dt:
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05/20/2003
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Application #:
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09497819
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Filing Dt:
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02/03/2000
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Title:
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METHOD OF REMOVING PARTICLES FROM STAGE AND CLEANING PLATE
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Patent #:
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Issue Dt:
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04/01/2003
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Application #:
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09503903
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Filing Dt:
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02/14/2000
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Title:
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CONTACT STRUCTURE AND PRODUCTION METHOD THEREOF
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Patent #:
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Issue Dt:
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05/29/2001
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Application #:
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09526916
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Filing Dt:
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03/16/2000
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Title:
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Attenuation Equailizer for Transmission lines
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Patent #:
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Issue Dt:
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04/17/2001
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Application #:
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09533734
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Filing Dt:
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03/23/2000
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Title:
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Data writing apparatus, data writing method, and tester
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Patent #:
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Issue Dt:
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09/30/2003
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Application #:
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09535030
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Filing Dt:
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03/24/2000
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Publication #:
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Pub Dt:
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01/16/2003
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Title:
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PARTICLE BEAM APPARATUS FOR TILTED OBSERVATION OF A SPECIMEN
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Patent #:
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Issue Dt:
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09/30/2003
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Application #:
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09536337
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Filing Dt:
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03/25/2000
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Title:
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COMPRESSED DATA RESTORATION APPARATUS, SEMICONDUCTOR TESTER EQUIPPED WITH SAME, AND DATA COMPRESSION/RESTORATION METHOD
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Patent #:
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Issue Dt:
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09/25/2001
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Application #:
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09577111
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Filing Dt:
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05/23/2000
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Title:
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Quadrature demodulator quadrature demodulation method and recording medium
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Patent #:
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Issue Dt:
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09/25/2001
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Application #:
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09588615
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Filing Dt:
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06/06/2000
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Title:
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Voltage drive circuit, voltage drive apparatus and semiconductor-device testing apparatus
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Patent #:
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Issue Dt:
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02/05/2002
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Application #:
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09596437
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Filing Dt:
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06/19/2000
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Title:
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Contact structure and assembly mechanism thereof
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Patent #:
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Issue Dt:
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09/21/2004
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Application #:
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09647908
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Filing Dt:
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10/05/2000
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Title:
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JITTER MEASURING DEVICE AND METHOD
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Patent #:
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Issue Dt:
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07/22/2003
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Application #:
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09650000
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Filing Dt:
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08/28/2000
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Title:
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JITTER MEASUREMENT APPARATUS AND ITS METHOD
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Patent #:
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Issue Dt:
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12/06/2005
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Application #:
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09659198
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Filing Dt:
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09/11/2000
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Title:
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METHOD AND APPARATUS FOR ADMINISTERING INVERSION PROPERTY IN A MEMORY TESTER
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Patent #:
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Issue Dt:
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11/22/2005
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Application #:
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09659256
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Filing Dt:
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09/11/2000
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Title:
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METHOD AND APPARATUS FOR NO-LATENCY CONDITIONAL BRANCHING
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Patent #:
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Issue Dt:
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07/22/2003
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Application #:
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09659259
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Filing Dt:
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09/11/2000
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Title:
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METHOD AND APPARATUS FOR EXECUTING A PROGRAM USING PRIMARY, SECONDARY, AND TERTIARY MEMORIES
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Patent #:
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Issue Dt:
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07/08/2003
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Application #:
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09659539
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Filing Dt:
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09/11/2000
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Title:
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METHOD AND APPARATUS FOR INSERTING PROGRAMMABLE LATENCY BETWEEN ADDRESS AND DATA INFORMATION IN A MEMORY TESTER
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Patent #:
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Issue Dt:
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02/01/2005
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Application #:
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09672650
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Filing Dt:
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09/28/2000
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Title:
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MEMORY TESTER HAS MEMORY SETS CONFIGURABLE FOR USE AS ERROR CATCH RAM, TAG RAM'S, BUFFER MEMORIES AND STIMULUS LOG RAM
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Patent #:
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Issue Dt:
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12/30/2003
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Application #:
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09677202
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Filing Dt:
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10/02/2000
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Title:
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MEMORY TESTER TESTS MULTIPLE DUT'S PER TEST SITE
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Patent #:
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Issue Dt:
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01/21/2003
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Application #:
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09690425
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Filing Dt:
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10/17/2000
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Title:
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DEFLECTION ARRANGEMENT FOR SEPARATING TWO PARTICLE BEAMS
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Patent #:
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Issue Dt:
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02/03/2004
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Application #:
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09693218
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Filing Dt:
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10/20/2000
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Title:
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APPARATUS AND METHOD FOR STORING INFORMATION DURING A TEST PROGRAM
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Patent #:
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Issue Dt:
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06/08/2004
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Application #:
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09702578
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Filing Dt:
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10/31/2000
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Title:
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MEMORY TESTER OMITS PROGRAMMING OF ADDRESSES IN DETECTED BAD COLUMNS
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Patent #:
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Issue Dt:
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02/03/2004
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Application #:
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09702631
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Filing Dt:
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10/31/2000
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Title:
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MEMORY TESTER WITH ENHANCED POST DECODE
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Patent #:
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Issue Dt:
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09/07/2004
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Application #:
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09761199
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Filing Dt:
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01/16/2001
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Publication #:
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Pub Dt:
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12/13/2001
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Title:
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METHOD AND APPARATUS FOR TESTING SEMICONDUCTOR DEVICES
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Patent #:
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Issue Dt:
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03/18/2003
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Application #:
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09761991
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Filing Dt:
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01/16/2001
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Publication #:
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Pub Dt:
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10/25/2001
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Title:
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WIDEBAND OPTICAL AMPLIFIER AND WIDEBAND VARIABLE WAVELENGTH OPTICAL SOURCE
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Patent #:
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Issue Dt:
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02/18/2003
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Application #:
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09774196
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Filing Dt:
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01/29/2001
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Publication #:
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Pub Dt:
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08/09/2001
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Title:
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JITTER MEASURING DEVICE AND METHOD
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Patent #:
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Issue Dt:
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05/04/2004
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Application #:
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09802440
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Filing Dt:
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03/09/2001
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Publication #:
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Pub Dt:
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10/31/2002
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Title:
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TEST VECTOR COMPRESSION METHOD
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Patent #:
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Issue Dt:
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07/26/2005
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Application #:
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09811153
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Filing Dt:
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03/16/2001
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Publication #:
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Pub Dt:
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11/07/2002
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Title:
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APPARATUS FOR AND METHOD OF MEASURING JITTER
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Patent #:
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Issue Dt:
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04/01/2003
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Application #:
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09814996
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Filing Dt:
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03/23/2001
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Publication #:
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Pub Dt:
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11/01/2001
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Title:
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METHOD OF EXTRACTING CHARACTERS AND COMPUTER-READABLE RECORDING MEDIUM
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Patent #:
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Issue Dt:
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03/09/2004
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Application #:
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09824874
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Filing Dt:
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04/04/2001
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Publication #:
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Pub Dt:
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10/11/2001
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Title:
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MULTI-BEAM EXPOSURE APPARATUS USING A MULTI-AXIS ELECTRON LENS, ELECTRON LENS CONVERGENCING A PLURALITY OF ELECTRON BEAM AND FABRICATION METHOD OF A SEMICONDUCTOR DEVICE
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Patent #:
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Issue Dt:
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09/07/2004
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Application #:
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09824880
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Filing Dt:
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04/04/2001
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Publication #:
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Pub Dt:
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10/11/2001
| | | | |
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Title:
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MULTI-BEAM EXPOSURE APPARATUS USING A MULTI-AXIS ELECTRON LENS, FABRICATION METHOD OF A SEMICONDUCTOR DEVICE
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Patent #:
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Issue Dt:
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07/15/2003
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Application #:
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09826295
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Filing Dt:
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04/03/2001
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Publication #:
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Pub Dt:
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01/23/2003
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Title:
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APPARATUS FOR AND METHOD OF MEASURING CROSS-CORRELATION COEFFICIENT BETWEEN SIGNALS
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Patent #:
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Issue Dt:
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12/03/2002
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Application #:
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09832726
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Filing Dt:
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04/10/2001
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Publication #:
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Pub Dt:
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10/10/2002
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Title:
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DIGITAL SIGNAL TRANSITION SPLITTING METHOD AND APPARATUS
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Patent #:
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Issue Dt:
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12/21/2004
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Application #:
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09838766
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Filing Dt:
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04/19/2001
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Publication #:
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Pub Dt:
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10/24/2002
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Title:
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ALGORITHMICALLY PROGRAMMABLE MEMORY TESTER WITH BREAKPOINT TRIGGER, ERROR JAMMING AND 'SCOPE MODE THAT MEMORIZES TARGET SEQUENCES
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Patent #:
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Issue Dt:
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06/03/2003
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Application #:
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09842433
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Filing Dt:
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04/25/2001
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Publication #:
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Pub Dt:
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10/31/2002
| | | | |
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Title:
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ALGORITHMICALLY PROGRAMMABLE MEMORY TESTER WITH HISTORY FIFO'S THAT AID IN ERROR ANALYSIS AND RECOVERY
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Patent #:
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Issue Dt:
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01/13/2004
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Application #:
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09865811
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Filing Dt:
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05/23/2001
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Publication #:
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Pub Dt:
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11/29/2001
| | | | |
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Title:
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SEMICONDUCTOR DEVICE TESTING APPARATUS
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Patent #:
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Issue Dt:
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11/15/2005
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Application #:
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09870955
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Filing Dt:
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05/30/2001
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Publication #:
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Pub Dt:
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06/13/2002
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Title:
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INTEGRATED CIRCUIT TESTER WITH MULTI-PORT TESTING FUNCTIONALITY
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Patent #:
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Issue Dt:
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01/31/2006
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Application #:
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09875567
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06/06/2001
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Publication #:
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Pub Dt:
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12/12/2002
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Title:
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METHOD AND APPARATUS FOR TESTING DIGITAL DEVICES USING TRANSITION TIMESTAMPS
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Patent #:
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Issue Dt:
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10/08/2002
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Application #:
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09875848
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Filing Dt:
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06/06/2001
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Title:
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ANALOG TO DIGITAL SIGNAL CONVERSION METHOD AND APPARATUS
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Patent #:
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Issue Dt:
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05/06/2003
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Application #:
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09878250
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Filing Dt:
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06/12/2001
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Publication #:
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Pub Dt:
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01/24/2002
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Title:
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CIRCUIT PATTERN DESIGN METHOD, CIRCUIT PATTERN DESIGN SYSTEM, AND RECORDING MEDIUM
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Patent #:
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Issue Dt:
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11/12/2002
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Application #:
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09878286
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Filing Dt:
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06/12/2001
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Publication #:
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Pub Dt:
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01/24/2002
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Title:
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CIRCUIT PATTERN DESIGN METHOD,EXPOSURE METHOD, CHARGED-PARTICLE BEAM EXPOSURE SYSTEM
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Patent #:
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Issue Dt:
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04/10/2007
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09882290
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06/14/2001
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Title:
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APPARATUS FOR AND METHOD OF MEASURING JITTER
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Patent #:
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Issue Dt:
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08/17/2004
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Application #:
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09896474
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Filing Dt:
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06/29/2001
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Publication #:
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Pub Dt:
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01/02/2003
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Title:
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ALGORITHMICALLY PROGRAMMABLE MEMORY TESTER WITH TEST SITES OPERATING IN A SLAVE MODE
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Patent #:
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Issue Dt:
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03/08/2005
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09900085
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07/05/2001
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Publication #:
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Pub Dt:
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01/10/2002
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Title:
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METHOD AND APPARATUS FOR TESTING
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Patent #:
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Issue Dt:
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08/06/2002
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Application #:
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09905747
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Filing Dt:
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07/14/2001
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Title:
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METHOD AND APPARATUS FOR ANALOG TO DIGITAL CONVERSION USING TIME-VARYING REFERENCE SIGNAL
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Patent #:
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11/14/2006
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09908948
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07/19/2001
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01/23/2003
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Title:
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METHODS AND APPARATUS FOR MINIMIZING CURRENT SURGES DURING INTEGRATED CIRCUIT TESTING
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04/29/2003
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09916713
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07/26/2001
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Pub Dt:
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01/31/2002
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Title:
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TIMING CALIBRATION METHOD AND SEMICONDUCTOR DEVICE TESTING APPARATUS HAVING TIMING CALIBRATION FUNCTION
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03/26/2002
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09922351
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08/02/2001
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02/07/2002
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Title:
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Semiconductor memory device tester
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12/28/2004
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09925138
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08/08/2001
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05/09/2002
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Title:
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SEMICONDUCTOR MEMORY TESTING METHOD AND APPARATUS
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11/14/2006
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09946857
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09/04/2001
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03/06/2003
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Title:
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BANDWIDTH MATCHING FOR SCAN ARCHITECTURES IN AN INTEGRATED CIRCUIT
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