Patent Assignment Details
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| Reel/Frame: | 047991/0525 | |
| Pages: | 3 |
| | Recorded: | 01/14/2019 | | |
| Attorney Dkt #: | 1012-2290 / 2017P51745 US |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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09/22/2020
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Application #:
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16213793
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Filing Dt:
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12/07/2018
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Publication #:
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Pub Dt:
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06/13/2019
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Title:
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Inspection Method for Semiconductor Substrates Using Slope Data and Inspection Apparatus
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Assignee
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| AM CAMPEON 1-15 |
| NEUBIBERG, GERMANY 85579 |
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Correspondence name and address
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MURPHY, BILAK & HOMILLER/INFINEON TECHNO
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1255 CRESCENT GREEN
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SUITE 200
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CARY, NC 27518
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