Patent Assignment Details
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Reel/Frame: | 048052/0894 | |
| Pages: | 7 |
| | Recorded: | 01/17/2019 | | |
Attorney Dkt #: | P56143 |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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06/29/2021
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Application #:
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16318638
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Filing Dt:
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01/17/2019
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Publication #:
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Pub Dt:
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05/30/2019
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Title:
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METHOD OF EVALUATING CARBON CONCENTRATION OF SILICON SAMPLE, METHOD OF EVALUATING SILICON WAFER MANUFACTURING PROCESS, METHOD OF MANUFACTURING SILICON WAFER, METHOD OF MANUFACTURING SILICON SINGLE CRYSTAL INGOT, SILICON SINGLE CRYSTAL INGOT AND SILICON WAFER
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Assignee
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1-2-1, SHIBAURA, MINATO-KU |
TOKYO, JAPAN 105-8634 |
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Correspondence name and address
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GREENBLUM & BERNSTEIN, P.L.C.
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1950 ROLAND CLARKE PLACE
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RESTON, VA 20191
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