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Reel/Frame:048052/0894   Pages: 7
Recorded: 01/17/2019
Attorney Dkt #:P56143
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
06/29/2021
Application #:
16318638
Filing Dt:
01/17/2019
Publication #:
Pub Dt:
05/30/2019
Title:
METHOD OF EVALUATING CARBON CONCENTRATION OF SILICON SAMPLE, METHOD OF EVALUATING SILICON WAFER MANUFACTURING PROCESS, METHOD OF MANUFACTURING SILICON WAFER, METHOD OF MANUFACTURING SILICON SINGLE CRYSTAL INGOT, SILICON SINGLE CRYSTAL INGOT AND SILICON WAFER
Assignors
1
Exec Dt:
10/25/2018
2
Exec Dt:
10/17/2018
3
Exec Dt:
10/18/2018
Assignee
1
1-2-1, SHIBAURA, MINATO-KU
TOKYO, JAPAN 105-8634
Correspondence name and address
GREENBLUM & BERNSTEIN, P.L.C.
1950 ROLAND CLARKE PLACE
RESTON, VA 20191

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