Patent Assignment Details
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| Reel/Frame: | 048785/0218 | |
| Pages: | 8 |
| | Recorded: | 04/03/2019 | | |
| Attorney Dkt #: | SAM-56245 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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10/27/2020
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Application #:
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16364251
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Filing Dt:
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03/26/2019
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Publication #:
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Pub Dt:
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03/19/2020
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Title:
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METHOD OF DETECTING A DEFECT ON A SUBSTRATE, APPARATUS FOR PERFORMING THE SAME AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME
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Assignee
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| 129, SAMSUNG-RO, YEONGTONG-GU |
| SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF 16677 |
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Correspondence name and address
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MUIR PATENT LAW, PLLC
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P.O. BOX 1213
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GREAT FALLS, VA 22066
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