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Patent Assignment Details
NOTE:Results display only for issued patents and published applications. For pending or abandoned applications please consult USPTO staff.

Reel/Frame:049266/0532   Pages: 7
Recorded: 05/23/2019
Attorney Dkt #:023919
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 27
1
Patent #:
6996658
Issue Dt:
02/07/2006
Application #:
10152656
Filing Dt:
05/21/2002
Publication #:
US20030101302
Pub Dt:
05/29/2003
Title:
MULTI-PORT SYSTEM AND METHOD FOR ROUTING A DATA ELEMENT WITHIN AN INTERCONNECTION FABRIC
2
Patent #:
7139213
Issue Dt:
11/21/2006
Application #:
10844002
Filing Dt:
05/12/2004
Publication #:
US20040240301
Pub Dt:
12/02/2004
Title:
MULTIPLE DATA PATH MEMORIES AND SYSTEMS
3
Patent #:
7062581
Issue Dt:
06/13/2006
Application #:
10945615
Filing Dt:
09/21/2004
Publication #:
US20050080959
Pub Dt:
04/14/2005
Title:
INTERCONNECTION FABRIC ENUMERATION
4
Patent #:
7646760
Issue Dt:
01/12/2010
Application #:
10945633
Filing Dt:
09/21/2004
Publication #:
US20050080976
Pub Dt:
04/14/2005
Title:
MULTI-PORT SYSTEM AND METHOD FOR ROUTING A DATA ELEMENT WITHIN AN INTERCONNECTION FABRIC
5
Patent #:
7146452
Issue Dt:
12/05/2006
Application #:
11271273
Filing Dt:
11/12/2005
Publication #:
US20060106967
Pub Dt:
05/18/2006
Title:
MULTI-PORT SYSTEM AND METHOD FOR ROUTING A DATA ELEMENT WITHIN AN INTERCONNECTION FABRIC
6
Patent #:
7502029
Issue Dt:
03/10/2009
Application #:
11333479
Filing Dt:
01/17/2006
Publication #:
US20070165028
Pub Dt:
07/19/2007
Title:
INSTRUCTION FOLDING MECHANISM, METHOD FOR PERFORMING THE SAME AND PIXEL PROCESSING SYSTEM EMPLOYING THE SAME
7
Patent #:
7383149
Issue Dt:
06/03/2008
Application #:
11637280
Filing Dt:
12/12/2006
Title:
SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE AND TEST METHOD
8
Patent #:
8049145
Issue Dt:
11/01/2011
Application #:
11708174
Filing Dt:
02/20/2007
Title:
SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE AND TEST METHOD
9
Patent #:
7603249
Issue Dt:
10/13/2009
Application #:
11708184
Filing Dt:
02/20/2007
Title:
SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE AND TEST METHOD
10
Patent #:
7535786
Issue Dt:
05/19/2009
Application #:
11708185
Filing Dt:
02/20/2007
Title:
SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE AND TEST METHOD
11
Patent #:
7480588
Issue Dt:
01/20/2009
Application #:
11708408
Filing Dt:
02/20/2007
Title:
SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE AND TEST METHOD
12
Patent #:
7760570
Issue Dt:
07/20/2010
Application #:
11708733
Filing Dt:
02/21/2007
Title:
SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE AND TEST METHOD
13
Patent #:
7720627
Issue Dt:
05/18/2010
Application #:
12150091
Filing Dt:
04/24/2008
Title:
SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE AND TEST METHOD
14
Patent #:
7654736
Issue Dt:
02/02/2010
Application #:
12315521
Filing Dt:
12/04/2008
Title:
SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE AND TEST METHOD
15
Patent #:
7639548
Issue Dt:
12/29/2009
Application #:
12391764
Filing Dt:
02/24/2009
Title:
SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE AND TEST METHOD
16
Patent #:
8520016
Issue Dt:
08/27/2013
Application #:
12400127
Filing Dt:
03/09/2009
Publication #:
US20100177096
Pub Dt:
07/15/2010
Title:
INSTRUCTION FOLDING MECHANISM, METHOD FOR PERFORMING THE SAME AND PIXEL PROCESSING SYSTEM EMPLOYING THE SAME
17
Patent #:
8005641
Issue Dt:
08/23/2011
Application #:
12540446
Filing Dt:
08/13/2009
Publication #:
US20110037138
Pub Dt:
02/17/2011
Title:
TEMPERATURE SENSING CIRCUIT WITH HYSTERESIS AND TIME DELAY
18
Patent #:
8040742
Issue Dt:
10/18/2011
Application #:
12635533
Filing Dt:
12/10/2009
Publication #:
US20110044118
Pub Dt:
02/24/2011
Title:
SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE AND TEST METHOD
19
Patent #:
8006024
Issue Dt:
08/23/2011
Application #:
12643385
Filing Dt:
12/21/2009
Publication #:
US20100169533
Pub Dt:
07/01/2010
Title:
MULTI-PORT SYSTEM AND METHOD FOR ROUTING A DATA ELEMENT WITHIN AN INTERCONNECTION FABRIC
20
Patent #:
8308359
Issue Dt:
11/13/2012
Application #:
12688662
Filing Dt:
01/15/2010
Publication #:
US20110044372
Pub Dt:
02/24/2011
Title:
SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE AND TEST METHOD
21
Patent #:
7953573
Issue Dt:
05/31/2011
Application #:
12753411
Filing Dt:
04/02/2010
Publication #:
US20110044119
Pub Dt:
02/24/2011
Title:
SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE AND TEST METHOD
22
Patent #:
8081532
Issue Dt:
12/20/2011
Application #:
12793845
Filing Dt:
06/04/2010
Publication #:
US20110046912
Pub Dt:
02/24/2011
Title:
SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE AND TEST METHOD
23
Patent #:
8402197
Issue Dt:
03/19/2013
Application #:
13215011
Filing Dt:
08/22/2011
Publication #:
US20120131255
Pub Dt:
05/24/2012
Title:
MULTI-PORT SYSTEM AND METHOD FOR ROUTING A DATA ELEMENT WITHIN AN INTERCONNECTION FABRIC
24
Patent #:
8497453
Issue Dt:
07/30/2013
Application #:
13235754
Filing Dt:
09/19/2011
Publication #:
US20120008447
Pub Dt:
01/12/2012
Title:
SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE
25
Patent #:
9766135
Issue Dt:
09/19/2017
Application #:
13490890
Filing Dt:
06/07/2012
Publication #:
US20120243574
Pub Dt:
09/27/2012
Title:
SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE AND TEST METHOD
26
Patent #:
8769181
Issue Dt:
07/01/2014
Application #:
13846515
Filing Dt:
03/18/2013
Publication #:
US20130297848
Pub Dt:
11/07/2013
Title:
MULTI-PORT SYSTEM AND METHOD FOR ROUTING A DATA ELEMENT WITHIN AN INTERCONNECTION FABRIC
27
Patent #:
10656028
Issue Dt:
05/19/2020
Application #:
15701777
Filing Dt:
09/12/2017
Publication #:
US20180003568
Pub Dt:
01/04/2018
Title:
SEMICONDUCTOR DEVICE HAVING VARIABLE PARAMETER SELECTION BASED ON TEMPERATURE AND TEST METHOD
Assignor
1
INTELLECTUAL VENTURES ASSETS
Exec Dt:
04/30/2019
Assignee
1
SAMSUNG ELECTRONCS CO., LTD.
129, SAMSUNG-RO, YEONGTONG-GU, GYEONGGI-DO,
SUWON-SI, KOREA, REPUBLIC OF 16677
Correspondence name and address
SUGHRUE MION, PLLC
2100 PENNSYLVANIA AVE. NW SUITE 800
WASHINGTON, DC 20037

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