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Reel/Frame:049632/0940   Pages: 50
Recorded: 06/28/2019
Conveyance: RELEASE OF SECURITY INTEREST IN INTELLECTUAL PROPERTY
Total properties: 540
Page 1 of 6
Pages: 1 2 3 4 5 6
1
Patent #:
Issue Dt:
09/04/2001
Application #:
08299753
Filing Dt:
09/01/1994
Title:
MEMORY ARCHITECTURE FOR AUTOMATIC TEST EQUIPMENT USING VECTOR MODULE TABLE
2
Patent #:
Issue Dt:
11/09/1999
Application #:
08414456
Filing Dt:
03/31/1995
Title:
WITH POSITIONING MODULES INCORPORATING KINEMATIC SURFACES
3
Patent #:
Issue Dt:
02/25/1997
Application #:
08481564
Filing Dt:
06/07/1995
Title:
MANIPULATOR FOR AUTOMATIC TEST EQUIPMENT TEST HEAD
4
Patent #:
Issue Dt:
04/07/1998
Application #:
08493399
Filing Dt:
06/22/1995
Title:
SYSTEM FOR DETECTING FAULTS IN CONNECTIONS BETWEEN INTEGRATED CIRCUITS AND CIRCUIT BOARD TRACES
5
Patent #:
Issue Dt:
10/22/2002
Application #:
08510079
Filing Dt:
08/01/1995
Title:
LOW COST CMOS TESTER
6
Patent #:
Issue Dt:
08/18/1998
Application #:
08516709
Filing Dt:
08/18/1995
Title:
METHOD OF MAKING MEMORY CHIPS USING MEMORY TESTER PROVIDING FAST REPAIR
7
Patent #:
Issue Dt:
09/22/1998
Application #:
08517573
Filing Dt:
08/21/1995
Title:
TEST SYSTEM FOR DETERMINING THE ORIENTATION OF COMPONENTS ON A CIRCUIT BOARD
8
Patent #:
Issue Dt:
04/07/1998
Application #:
08526302
Filing Dt:
09/11/1995
Title:
CONFIGURABLE PROBE CARD FOR AUTOMATIC TEST EQUIPMENT
9
Patent #:
Issue Dt:
06/30/1998
Application #:
08536206
Filing Dt:
09/29/1995
Title:
INTEGRATED CIRCUIT TEST POWER SUPPLY
10
Patent #:
Issue Dt:
02/15/2000
Application #:
08546236
Filing Dt:
10/20/1995
Title:
INTEGRATED PROBER, HANDLER AND TESTER FOR SEMICONDUCTOR COMPONENTS
11
Patent #:
Issue Dt:
06/29/1999
Application #:
08546751
Filing Dt:
10/23/1995
Title:
INTEGRATED CIRCUIT TEST METHOD AND STRUCTURE
12
Patent #:
Issue Dt:
03/25/1997
Application #:
08552141
Filing Dt:
11/02/1995
Title:
SYSTEM AND METHOD OF PROGRAMMING A MULTISTATION TESTING SYSTEM
13
Patent #:
Issue Dt:
02/18/1997
Application #:
08555438
Filing Dt:
11/09/1995
Title:
TIME LINEARITY MEASUREMENT USING A FREQUENCY LOCKED, DUAL SEQUENCER AUTOMATIC TEST SYSTEM
14
Patent #:
Issue Dt:
02/25/1997
Application #:
08565337
Filing Dt:
11/30/1995
Title:
METHOD AND APPARATUS FOR PERFORMING SERIAL AND PARALLEL SCAN TESTING ON AN INTEGRATED CIRCUIT
15
Patent #:
Issue Dt:
08/12/1997
Application #:
08569020
Filing Dt:
12/07/1995
Title:
AUTOMATIC TEST EQUIPMENT WITH PIPELINED SEQUENCER
16
Patent #:
Issue Dt:
01/19/1999
Application #:
08576008
Filing Dt:
12/21/1995
Title:
HYBRID SCANNER FOR USE IN AN IMPROVED MDA TESTER
17
Patent #:
Issue Dt:
09/30/1997
Application #:
08600837
Filing Dt:
02/13/1996
Title:
APPARATUS AND METHOD FOR PERFORMING DIGITAL SIGNAL PROCESSING IN AN ELECTRONIC CIRCUIT TESTER
18
Patent #:
Issue Dt:
03/10/1998
Application #:
08627858
Filing Dt:
04/03/1996
Title:
APPARATUS AND METHOD FOR PROVIDING A PROGRAMMABLE DELAY WITH LOW FIXED DELAY
19
Patent #:
Issue Dt:
11/18/1997
Application #:
08638026
Filing Dt:
04/26/1996
Title:
HIGH SPEED SERIAL DATA PIN FOR AUTOMATIC TEST EQUIPMENT
20
Patent #:
Issue Dt:
06/02/1998
Application #:
08653588
Filing Dt:
09/12/1996
Title:
INTEGRATED CIRCUIT TRAY WITH FLEXURAL BEARINGS
21
Patent #:
Issue Dt:
04/07/1998
Application #:
08653949
Filing Dt:
05/22/1996
Title:
FAST VECTOR LOADING FOR AUTOMATIC TEST EQUIPMENT
22
Patent #:
Issue Dt:
05/19/1998
Application #:
08683397
Filing Dt:
07/18/1996
Title:
SEMICONDUCTOR MEMORY TESTER WITH HARDWARE ACCELERATORS
23
Patent #:
Issue Dt:
11/24/1998
Application #:
08726069
Filing Dt:
10/03/1996
Title:
EXPANDING GRIPPER WITH ELASTICALLY VARIABLE PITCH SCREW
24
Patent #:
Issue Dt:
03/19/2002
Application #:
08752414
Filing Dt:
11/19/1996
Title:
MEMORY TESTER WITH DATA COMPRESSION
25
Patent #:
Issue Dt:
07/27/1999
Application #:
08760537
Filing Dt:
12/05/1996
Title:
APPARATUS AND METHOD FOR PERFORMING AMPLITUDE CALIBRATION IN AN ELECTR ONIC CIRCUIT TESTER
26
Patent #:
Issue Dt:
06/16/1998
Application #:
08760887
Filing Dt:
12/06/1996
Title:
FAST UNDERSAMPLING
27
Patent #:
Issue Dt:
12/01/1998
Application #:
08769556
Filing Dt:
12/19/1996
Title:
BOARD TEST APPARATUS AND METHOD FOR FAST CAPACITANCE MEASUREMENT
28
Patent #:
Issue Dt:
07/13/1999
Application #:
08803111
Filing Dt:
02/20/1997
Title:
SEMICONDUCTOR TESTER FOR TESTING DEVICES WITH EMBEDDED MEMORY
29
Patent #:
Issue Dt:
07/13/1999
Application #:
08832303
Filing Dt:
04/03/1997
Title:
FLEXIBLE SHIELDED LAMINATED BEAM FOR ELECTRICAL CONTACTS AND THE LIKE AND METHOD OF CONTACT OPERATION
30
Patent #:
Issue Dt:
06/08/1999
Application #:
08874615
Filing Dt:
06/13/1997
Title:
LOW COST, EASY TO USE AUTOMATIC TEST SYSTEM SOFTWARE
31
Patent #:
Issue Dt:
03/14/2000
Application #:
08890917
Filing Dt:
07/10/1997
Title:
HEAT-TRANSFER ENHANCING FEATURES FOR SEMICONDUCTOR CARRIERS AND DEVICES
32
Patent #:
Issue Dt:
06/06/2000
Application #:
08906532
Filing Dt:
08/05/1997
Title:
LOW COST CMOS TESTER WITH HIGH CHANNEL DENSITY
33
Patent #:
Issue Dt:
12/29/1998
Application #:
08906533
Filing Dt:
08/05/1997
Title:
TESTER WITH FAST REFIRE RECOVERY TIME
34
Patent #:
Issue Dt:
10/26/1999
Application #:
08924354
Filing Dt:
09/05/1997
Title:
SEMICONDUCTOR CHIP TRAY WITH ROLLING CONTACT RETENTION MECHANISM
35
Patent #:
Issue Dt:
08/11/1998
Application #:
08926117
Filing Dt:
09/09/1997
Title:
LOW COST, HIGHLY PARALLEL MEMORY TESTER
36
Patent #:
Issue Dt:
04/11/2000
Application #:
08931164
Filing Dt:
09/16/1997
Title:
TEST SYSTEM FOR INTEGRATED CIRCUITS USING A SINGLE MEMORY FOR BOTH THE PARALLEL AND SCAN MODES OF TESTING
37
Patent #:
Issue Dt:
04/04/2000
Application #:
08931784
Filing Dt:
09/16/1997
Title:
SYSTEM FOR STORING AND SEARCHING NAMED DEVICE PARAMETER DATA IN A TEST SYSTEM FOR TESTING AN INTEGRATED CIRCUIT
38
Patent #:
Issue Dt:
10/27/1998
Application #:
08931793
Filing Dt:
09/16/1997
Title:
PRODUCTION INTERFACE FOR INTEGRATED CIRCUIT TEST SYSTEM
39
Patent #:
Issue Dt:
08/17/1999
Application #:
08933391
Filing Dt:
09/19/1997
Title:
METHOD FOR CAPTURING DIGITAL DATA IN AN AUTOMATIC TEST SYSTEM
40
Patent #:
Issue Dt:
08/15/2000
Application #:
08947680
Filing Dt:
09/19/1997
Title:
INTERFACE APPARATUS FOR AUTOMATIC TEST EQUIPMENT
41
Patent #:
Issue Dt:
04/18/2000
Application #:
08951782
Filing Dt:
10/16/1997
Title:
METHOD FOR GENERATING TEST PATTERNS
42
Patent #:
Issue Dt:
06/19/2001
Application #:
08955782
Filing Dt:
10/22/1997
Title:
AUTOMATED MICROWAVE TEST SYSTEM WITH IMPROVED ACCURACY
43
Patent #:
Issue Dt:
08/01/2000
Application #:
08962605
Filing Dt:
10/31/1997
Title:
SYSTEM TO SIMULTANEOUSLY TEST TRAYS OF INTEGRATED CIRCUIT PACKAGES
44
Patent #:
Issue Dt:
09/07/1999
Application #:
08968316
Filing Dt:
11/12/1997
Title:
MANIPULATOR FOR AUTOMATIC TEST EQUIPMENT WITH ACTIVE COMPLIANCE
45
Patent #:
Issue Dt:
07/13/1999
Application #:
08970184
Filing Dt:
11/14/1997
Title:
METHOD OF MANUFACTURING BALL GRID ARRAYS FOR IMPROVED TESTABILITY
46
Patent #:
Issue Dt:
10/26/1999
Application #:
09012838
Filing Dt:
01/23/1998
Title:
SMALL CONTACTOR FOR TEST PROBES, CHIP PACKAGING AND THE LIKE
47
Patent #:
Issue Dt:
07/18/2000
Application #:
09014214
Filing Dt:
01/27/1998
Title:
METHOD AND APPARATUS FPR TEMPERATURE CONTROL OF A SEMICONDUCTOR ELECTRICAL-TEST CONTRACTOR ASSEMBLY
48
Patent #:
Issue Dt:
10/03/2000
Application #:
09045436
Filing Dt:
03/20/1998
Title:
FLEXIBLE TEST ENVIRONMENT FOR AUTOMATIC TEST EQUITMENT
49
Patent #:
Issue Dt:
03/14/2000
Application #:
09047089
Filing Dt:
03/24/1998
Title:
HIGH PERFORMANCE PROBE INTERFACE FOR AUTOMATIC TEST EQIPMENT
50
Patent #:
Issue Dt:
10/17/2000
Application #:
09048727
Filing Dt:
03/26/1998
Title:
COMPENSATING FOR THE EFFECTS OF ROUND-TRIP DELAY IN AUTOMATIC TEST EQUIPMENT
51
Patent #:
Issue Dt:
08/22/2000
Application #:
09060987
Filing Dt:
04/15/1998
Title:
HIGH SPEED, REAL-TIME, STATE INTERCONNECT FOR AUTOMATIC TEST EQUIPMENT
52
Patent #:
Issue Dt:
02/27/2001
Application #:
09104099
Filing Dt:
06/24/1998
Title:
RELAYLESS VOLTAGE MEASUREMENT IN AUTOMATIC TEST EQUIPMENT
53
Patent #:
Issue Dt:
02/13/2001
Application #:
09167883
Filing Dt:
10/07/1998
Title:
ANALOG CLOCK MODULE
54
Patent #:
Issue Dt:
08/17/1999
Application #:
09170490
Filing Dt:
10/13/1998
Title:
PRODUCTION INTERFACE FOR AN INTEGRATED CIRCUIT TEST SYSTEM
55
Patent #:
Issue Dt:
03/26/2002
Application #:
09174866
Filing Dt:
10/19/1998
Title:
INTEGRATED MULTI-CHANNEL ANALOG TEST INSTRUMENT ARCHITECTURE PROVIDING FLEXIBLE TRIGGERING
56
Patent #:
Issue Dt:
04/10/2001
Application #:
09178247
Filing Dt:
10/23/1998
Title:
HIGH DENSITY PRINTED CIRCUIT BOARD
57
Patent #:
Issue Dt:
08/14/2001
Application #:
09178257
Filing Dt:
10/23/1998
Title:
REMOTE TEST MODULE FOR AUTOMATIC TEST EQUIPMENT
58
Patent #:
Issue Dt:
03/20/2001
Application #:
09186012
Filing Dt:
11/04/1998
Title:
LOW COST MEMORY TESTER WITH HIGH THROUGHPUT
59
Patent #:
Issue Dt:
12/19/2000
Application #:
09204977
Filing Dt:
12/03/1998
Title:
ADJUSTABLE TOOLING PIN
60
Patent #:
Issue Dt:
05/14/2002
Application #:
09227690
Filing Dt:
01/08/1999
Title:
PATTERN GENERATOR FOR A PACKET-BASED MEMORY TESTER
61
Patent #:
Issue Dt:
09/05/2000
Application #:
09231001
Filing Dt:
01/14/1999
Title:
DIRECT-MEASUREMENT PROVISION OF SAFE BACKDRIVE LEVELS
62
Patent #:
Issue Dt:
01/16/2001
Application #:
09231049
Filing Dt:
01/14/1999
Title:
CIRCUIT-BOARD TESTER WITH BACKDRIVE-BASED BURST TIMING
63
Patent #:
Issue Dt:
08/28/2001
Application #:
09245223
Filing Dt:
02/05/1999
Title:
AUTOMATIC TEST EQUIPMENT USING SIGMA DELTA MODULATION TO CREATE REFERENCE LEVELS
64
Patent #:
Issue Dt:
04/16/2002
Application #:
09245519
Filing Dt:
02/05/1999
Title:
LOW-COST CONFIGURATION FOR MONITORING AND CONTROLLING PARAMETRIC MEASUREMENT UNITS IN AUTOMATIC TEST EQUIPMENT
65
Patent #:
Issue Dt:
10/24/2000
Application #:
09253175
Filing Dt:
02/19/1999
Title:
SERIAL SWITCH DRIVER ARCHITECTURE FOR AUTOMATIC TEST EQUIPMENT
66
Patent #:
Issue Dt:
06/11/2002
Application #:
09282224
Filing Dt:
03/31/1999
Title:
FAIL ARRAY MEMORY CONTROL CIRCUIT WITH SELECTIVE INPUT DISABLE
67
Patent #:
Issue Dt:
08/27/2002
Application #:
09285857
Filing Dt:
04/02/1999
Title:
FAILURE CAPTURE APPARATUS AND METHOD FOR AUTOMATIC TEST EQUIPMENT
68
Patent #:
Issue Dt:
03/19/2002
Application #:
09309134
Filing Dt:
05/10/1999
Title:
DRIVER WITH TRANSMISSION PATH LOSS COMPENSATION
69
Patent #:
Issue Dt:
05/28/2002
Application #:
09325834
Filing Dt:
06/04/1999
Title:
POWER SENSOR MODULE FOR MICROWAVE TEST SYSTEMS
70
Patent #:
Issue Dt:
07/31/2001
Application #:
09326449
Filing Dt:
06/04/1999
Title:
NOISE SOURCE MODULE FOR MICROWAVE TEST SYSTEMS
71
Patent #:
Issue Dt:
11/05/2002
Application #:
09340832
Filing Dt:
06/28/1999
Title:
SEMICONDUCTOR PARALLEL TESTER
72
Patent #:
Issue Dt:
01/14/2003
Application #:
09354137
Filing Dt:
07/15/1999
Title:
EXTENDING SYNCHRONOUS BUSSES BY ARBITRARY LENGTHS USING NATIVE BUS PROTOCOL
73
Patent #:
Issue Dt:
03/27/2001
Application #:
09360180
Filing Dt:
07/23/1999
Title:
INTEGRATED TEST CELL COOLING SYSTEM
74
Patent #:
Issue Dt:
04/22/2003
Application #:
09360215
Filing Dt:
07/23/1999
Title:
LOW COST TIMING SYSTEM FOR HIGHLY ACCURATE MULTI-MODAL SEMICONDUCTOR TESTING
75
Patent #:
Issue Dt:
04/15/2003
Application #:
09409618
Filing Dt:
10/01/1999
Title:
PRE-CONDITIONER FOR MEASURING HIGH-SPEED TIME INTERVALS OVER A LOW-BANDWIDTH PATH
76
Patent #:
Issue Dt:
10/30/2001
Application #:
09410857
Filing Dt:
10/01/1999
Title:
INTEGRATED TEST CELL
77
Patent #:
Issue Dt:
03/12/2002
Application #:
09416578
Filing Dt:
10/12/1999
Title:
LOW JITTER PHASE-LOCKED LOOP WITH DUTY-CYCLE CONTROL
78
Patent #:
Issue Dt:
01/20/2004
Application #:
09417034
Filing Dt:
10/12/1999
Title:
EASY TO PROGRAM AUTOMATIC TEST EQUIPMENT
79
Patent #:
Issue Dt:
12/18/2001
Application #:
09420497
Filing Dt:
10/19/1999
Title:
CIRCUIT AND METHOD FOR IMPROVED TEST AND CALIBRATION IN AUTOMATED TEST EQUIPMENT
80
Patent #:
Issue Dt:
03/18/2003
Application #:
09426486
Filing Dt:
10/26/1999
Title:
HIGH-SPEED FAILURE CAPTURE APPARATUS AND METHOD FOR AUTOMATIC TEST EQUIPMENT
81
Patent #:
Issue Dt:
10/08/2002
Application #:
09457883
Filing Dt:
12/10/1999
Title:
SHUNT CAPACITANCE COMPENSATION STRUCTURE AND METHOD FOR A SIGNAL CHANNEL
82
Patent #:
Issue Dt:
09/18/2001
Application #:
09496690
Filing Dt:
02/02/2000
Title:
Dynamic pin driver combining high voltage mode and high speed mode
83
Patent #:
Issue Dt:
05/21/2002
Application #:
09497775
Filing Dt:
02/03/2000
Title:
COMMON-MODE DETECTION CIRCUIT WITH CROSS-COUPLED COMPENSATION
84
Patent #:
Issue Dt:
10/09/2001
Application #:
09501471
Filing Dt:
02/09/2000
Title:
Differential comparator with dispersion reduction circuitry
85
Patent #:
Issue Dt:
11/23/2004
Application #:
09503352
Filing Dt:
02/14/2000
Title:
NETWORK FAULT ANALYSIS TOOL
86
Patent #:
Issue Dt:
09/16/2003
Application #:
09523431
Filing Dt:
03/10/2000
Title:
AUTOMATIC TEST EQUIPMENT METHODS AND APPARATUS FOR INTERFACING WITH AN EXTERNAL DEVICE
87
Patent #:
Issue Dt:
08/28/2001
Application #:
09525557
Filing Dt:
03/15/2000
Title:
Detector with common mode comparator for automatic test equipment
88
Patent #:
Issue Dt:
10/24/2006
Application #:
09552105
Filing Dt:
04/19/2000
Title:
PC CONFIGURATION FAULT ANALYSIS
89
Patent #:
Issue Dt:
05/11/2004
Application #:
09571563
Filing Dt:
05/15/2000
Title:
LOW COMPLIANCE TESTER INTERFACE
90
Patent #:
Issue Dt:
12/24/2002
Application #:
09574689
Filing Dt:
05/17/2000
Title:
REDUNDANCY ANALYSIS METHOD AND APPARATUS FOR ATE
91
Patent #:
Issue Dt:
11/26/2002
Application #:
09577255
Filing Dt:
05/19/2000
Title:
METHOD AND APPARATUS FOR TESTING INTEGRATED CIRCUIT CHIPS THAT OUTPUT CLOCKS FOR TIMING
92
Patent #:
Issue Dt:
08/19/2003
Application #:
09584636
Filing Dt:
05/31/2000
Title:
ATE TIMING MEASUREMENT UNIT AND METHOD
93
Patent #:
Issue Dt:
04/06/2004
Application #:
09585453
Filing Dt:
06/01/2000
Title:
SEMICONDUCTOR HANDLER FOR RAPID TESTING
94
Patent #:
Issue Dt:
09/10/2002
Application #:
09605941
Filing Dt:
06/28/2000
Title:
SINGLE CARRIAGE ROBOTIC MONORAIL MATERIAL TRANSFER SYSTEM
95
Patent #:
Issue Dt:
05/13/2003
Application #:
09608040
Filing Dt:
06/30/2000
Title:
TESTING FREQUENCY HOPPING DEVICES
96
Patent #:
Issue Dt:
09/10/2002
Application #:
09612745
Filing Dt:
07/10/2000
Title:
FLEXIBLE TEST ENVIRONMENT FOR AUTOMATIC TEST EQUIPMENT
97
Patent #:
Issue Dt:
01/04/2005
Application #:
09615292
Filing Dt:
07/13/2000
Title:
AUTOMATIC TEST MANIPULATOR WITH SUPPORT INTERNAL TO TEST HEAD
98
Patent #:
Issue Dt:
09/18/2001
Application #:
09625827
Filing Dt:
07/26/2000
Title:
Automatic test equipment with narrow output pulses
99
Patent #:
Issue Dt:
02/17/2004
Application #:
09635334
Filing Dt:
08/09/2000
Title:
CAPTURING AND EVALUATING HIGH SPEED DATA STREAMS
100
Patent #:
Issue Dt:
10/15/2002
Application #:
09638829
Filing Dt:
08/14/2000
Title:
TEST SYSTEM FOR SMART CARD AND IDENTIFICATION DEVICES AND THE LIKE
Assignor
1
Exec Dt:
06/27/2019
Assignees
1
600 RIVERPARK DRIVE
NORTH READING, MASSACHUSETTS 01864
2
2200 MILLBROOK DRIVE
BUFFALO GROVE, ILLINOIS 60089
3
965 WEST MAUDE AVENUE
SUNNYVALE, CALIFORNIA 94085
4
875 EMBEDDED WAY
SAN JOSE, CALIFORNIA 95138
5
600 RIVERPARK DRIVE
NORTH READING, MASSACHUSETTS 01864
6
213 BURLINGTON ROAD
BEDFORD, MASSACHUSETTS 01730
Correspondence name and address
VAISHALI MAHNA
WEIL, GOTSHAL & MANGES LLP
767 FIFTH AVENUE
NEW YORK, NY 10153

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