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Reel/Frame:	052259/0227			Pages:	68
		Recorded:	03/30/2020
Attorney Dkt #:	T&A-GENERAL/Z-1830(USMA)
Conveyance:	CHANGE OF NAME AND ADDRESS

Total properties: 2251
Page 1 of 23
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Patent #:	6597448	Issue Dt:	07/22/2003	Application #:	09644069	Filing Dt:	08/23/2000
Title:	APPARATUS METHOD OF INSPECTING FOREIGN PARTICLE OR DEFECT ON A SAMPLE

Patent #:	6888959	Issue Dt:	05/03/2005	Application #:	09791682	Filing Dt:	02/26/2001
Publication #:	US20010048761	Pub Dt:	12/06/2001
Title:	METHOD OF INSPECTING A SEMICONDUCTOR DEVICE AND AN APPARATUS THEREOF

Patent #:	6952492	Issue Dt:	10/04/2005	Application #:	09942213	Filing Dt:	08/30/2001
Publication #:	US20020195574	Pub Dt:	12/26/2002
Title:	METHOD AND APPARATUS FOR INSPECTING A SEMICONDUCTOR DEVICE

Patent #:	6613593	Issue Dt:	09/02/2003	Application #:	09942862	Filing Dt:	08/31/2001
Publication #:	US20020197750	Pub Dt:	12/26/2002
Title:	METHOD OF FABRICATING A SEMICONDUCTOR DEVICE

Patent #:	6798504	Issue Dt:	09/28/2004	Application #:	09961513	Filing Dt:	09/24/2001
Publication #:	US20020036771	Pub Dt:	03/28/2002
Title:	APPARATUS AND METHOD FOR INSPECTING SURFACE OF SEMICONDUCTOR WAFER OR THE LIKE

Patent #:	6703613	Issue Dt:	03/09/2004	Application #:	09988339	Filing Dt:	11/19/2001
Publication #:	US20020096632	Pub Dt:	07/25/2002
Title:	ENERGY SPECTRUM MEASURING APPARATUS, ELECTRON ENERGY LOSS SPECTROMETER, ELECTRON MICROSCOPE PROVIDED THEREWITH, AND ELECTRON ENERGY LOSS SPECTRUM MEASURING METHOD

Patent #:	6570151	Issue Dt:	05/27/2003	Application #:	10081243	Filing Dt:	02/21/2002
Title:	METHODS AND APPARATUS TO CONTROL CHARGE NEUTRALIZATION REACTIONS IN ION TRAPS

Patent #:	6713885	Issue Dt:	03/30/2004	Application #:	10082160	Filing Dt:	02/26/2002
Publication #:	US20030162309	Pub Dt:	08/28/2003
Title:	POWER SUPPLY, A SEMICONDUCTOR MAKING APPARATUS AND A SEMICONDUCTOR WAFER FABRICATING METHOD USING THE SAME

Patent #:	6664738	Issue Dt:	12/16/2003	Application #:	10083381	Filing Dt:	02/27/2002
Publication #:	US20030160568	Pub Dt:	08/28/2003
Title:	PLASMA PROCESSING APPARATUS

Patent #:	6908529	Issue Dt:	06/21/2005	Application #:	10087771	Filing Dt:	03/05/2002
Publication #:	US20030170984	Pub Dt:	09/11/2003
Title:	PLASMA PROCESSING APPARATUS AND METHOD

Patent #:	6776872	Issue Dt:	08/17/2004	Application #:	10087982	Filing Dt:	03/05/2002
Publication #:	US20030168171	Pub Dt:	09/11/2003
Title:	DATA PROCESSING APPARATUS FOR SEMICONDUCTOR PROCESSING APPARATUS

Patent #:	6586887	Issue Dt:	07/01/2003	Application #:	10090757	Filing Dt:	03/06/2002
Title:	HIGH-FREQUENCY POWER SUPPLY APPARATUS FOR PLASMA GENERATION APPARATUS

Patent #:	6876445	Issue Dt:	04/05/2005	Application #:	10119018	Filing Dt:	04/10/2002
Publication #:	US20020181756	Pub Dt:	12/05/2002
Title:	METHOD FOR ANALYZING DEFECT DATA AND INSPECTION APPARATUS AND REVIEW SYSTEM

Patent #:	7912650	Issue Dt:	03/22/2011	Application #:	10153691	Filing Dt:	05/24/2002
Publication #:	US20020197635	Pub Dt:	12/26/2002
Title:	INFORMATION PROCESSING SYSTEM USING NUCLEOTIDE SEQUENCE-RELATED INFORMATION

Patent #:	6674067	Issue Dt:	01/06/2004	Application #:	10188577	Filing Dt:	07/02/2002
Publication #:	US20030155502	Pub Dt:	08/21/2003
Title:	METHODS AND APPARATUS TO CONTROL CHARGE NEUTRALIZATION REACTIONS IN ION TRAPS

Patent #:	7022986	Issue Dt:	04/04/2006	Application #:	10196274	Filing Dt:	07/17/2002
Publication #:	US20030127593	Pub Dt:	07/10/2003
Title:	APPARATUS AND METHOD FOR WAFER PATTERN INSPECTION

Patent #:	6875306	Issue Dt:	04/05/2005	Application #:	10218406	Filing Dt:	08/15/2002
Publication #:	US20030168173	Pub Dt:	09/11/2003
Title:	VACUUM PROCESSING DEVICE AND VACUUM PROCESSING METHOD

Patent #:	7025895	Issue Dt:	04/11/2006	Application #:	10218422	Filing Dt:	08/15/2002
Publication #:	US20040031566	Pub Dt:	02/19/2004
Title:	PLASMA PROCESSING APPARATUS AND METHOD

Patent #:	6809316	Issue Dt:	10/26/2004	Application #:	10221844	Filing Dt:	02/11/2003
Publication #:	US20030155497	Pub Dt:	08/21/2003
Title:	ELECTROSPRAY IONIZATION MASS ANALYSIS APPARATUS AND SYSTEM THEREOF

Patent #:	6737640	Issue Dt:	05/18/2004	Application #:	10221845	Filing Dt:	09/16/2002
Publication #:	US20030183757	Pub Dt:	10/02/2003
Title:	ELECTROSPRAY IONIZATION MASS ANALYSIS APPARATUS AND METHOD THEREOF

Patent #:	6916396	Issue Dt:	07/12/2005	Application #:	10224652	Filing Dt:	08/21/2002
Publication #:	US20030230551	Pub Dt:	12/18/2003
Title:	ETCHING SYSTEM AND ETCHING METHOD

Patent #:	6936835	Issue Dt:	08/30/2005	Application #:	10230416	Filing Dt:	08/29/2002
Publication #:	US20030001120	Pub Dt:	01/02/2003
Title:	METHOD AND ITS APPARATUS FOR INSPECTING PARTICLES OR DEFECTS OF A SEMICONDUCTOR DEVICE

Patent #:	6797526	Issue Dt:	09/28/2004	Application #:	10232871	Filing Dt:	08/30/2002
Publication #:	US20030054573	Pub Dt:	03/20/2003
Title:	METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICES AND METHOD AND ITS APPARATUS FOR PROCESSING DETECTED DEFECT DATA

Patent #:	7034296	Issue Dt:	04/25/2006	Application #:	10239062	Filing Dt:	10/22/2002
Publication #:	US20030111602	Pub Dt:	06/19/2003
Title:	METHOD OF FORMING A SAMPLE IMAGE AND CHARGED PARTICLE BEAM APPARATUS

Patent #:	7081620	Issue Dt:	07/25/2006	Application #:	10239063	Filing Dt:	10/04/2002
Publication #:	US20030122069	Pub Dt:	07/03/2003
Title:	ATMOSPHERIC PRESSURE IONIZATION MASS SPECTROMETER SYSTEM

Patent #:	7081191	Issue Dt:	07/25/2006	Application #:	10239308	Filing Dt:	09/20/2002
Publication #:	US20040003994	Pub Dt:	01/08/2004
Title:	CAPILLARY ELECTROPHORESIS DEVICE

Patent #:	7189315	Issue Dt:	03/13/2007	Application #:	10246458	Filing Dt:	09/19/2002
Publication #:	US20030152486	Pub Dt:	08/14/2003
Title:	ION SENSOR AND CLINICAL ANALYZER USING THE SAME

Patent #:	6737641	Issue Dt:	05/18/2004	Application #:	10252547	Filing Dt:	09/24/2002
Publication #:	US20030155498	Pub Dt:	08/21/2003
Title:	MASS SPECTROMETER SYSTEM

Patent #:	7005053	Issue Dt:	02/28/2006	Application #:	10252557	Filing Dt:	09/24/2002
Publication #:	US20030116438	Pub Dt:	06/26/2003
Title:	MULTI-CAPILLARY ELECTROPHORESIS APPARATUS

Patent #:	6759652	Issue Dt:	07/06/2004	Application #:	10252699	Filing Dt:	09/24/2002
Publication #:	US20030150989	Pub Dt:	08/14/2003
Title:	ION TRAP MASS ANALYZING APPARATUS

Patent #:	6797949	Issue Dt:	09/28/2004	Application #:	10288450	Filing Dt:	11/06/2002
Publication #:	US20030155507	Pub Dt:	08/21/2003
Title:	MASS SPECTROMETER

Patent #:	7038767	Issue Dt:	05/02/2006	Application #:	10289401	Filing Dt:	11/07/2002
Publication #:	US20030090651	Pub Dt:	05/15/2003
Title:	THREE-DIMENSIONAL MICROPATTERN PROFILE MEASURING SYSTEM AND METHOD

Patent #:	6894790	Issue Dt:	05/17/2005	Application #:	10291675	Filing Dt:	11/12/2002
Publication #:	US20030090684	Pub Dt:	05/15/2003
Title:	MICROPATTERN SHAPE MEASURING SYSTEM AND METHOD

Patent #:	7459068	Issue Dt:	12/02/2008	Application #:	10309729	Filing Dt:	12/04/2002
Publication #:	US20030127328	Pub Dt:	07/10/2003
Title:	MULTI-CAPILLARY ELECTROPHORESIS APPARATUS

Patent #:	7722815	Issue Dt:	05/25/2010	Application #:	10347384	Filing Dt:	01/21/2003
Publication #:	US20030166260	Pub Dt:	09/04/2003
Title:	CHEMICAL ANALYSIS APPARATUS AND CHEMICAL ANALYSIS METHOD

Patent #:	6841403	Issue Dt:	01/11/2005	Application #:	10348747	Filing Dt:	01/21/2003
Publication #:	US20030138978	Pub Dt:	07/24/2003
Title:	METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICES AND METHOD AND ITS APPARATUS FOR PROCESSING DETECTED DEFECT DATA

Patent #:	6838665	Issue Dt:	01/04/2005	Application #:	10351446	Filing Dt:	01/27/2003
Publication #:	US20040061050	Pub Dt:	04/01/2004
Title:	ION TRAP TYPE MASS SPECTROMETER

Patent #:	7284906	Issue Dt:	10/23/2007	Application #:	10351992	Filing Dt:	01/28/2003
Publication #:	US20030141667	Pub Dt:	07/31/2003
Title:	EXHAUST APPARATUS AND CONTROL METHOD FOR SAME, AND VACUUM-USE HYDROSTATIC BEARING

Patent #:	7169255	Issue Dt:	01/30/2007	Application #:	10358894	Filing Dt:	02/06/2003
Publication #:	US20030155075	Pub Dt:	08/21/2003
Title:	PLASMA PROCESSING APPARATUS

Patent #:	7164126	Issue Dt:	01/16/2007	Application #:	10359236	Filing Dt:	02/06/2003
Publication #:	US20030141451	Pub Dt:	07/31/2003
Title:	METHOD OF FORMING A SAMPLE IMAGE AND CHARGED PARTICLE BEAM APPARATUS

Patent #:	8103368	Issue Dt:	01/24/2012	Application #:	10372923	Filing Dt:	02/26/2003
Publication #:	US20030125883	Pub Dt:	07/03/2003
Title:	INFORMATION PROCESSING SYSTEM USING NUCLEOTIDE SEQUENCE-RELATED INFORMATION

Patent #:	6972848	Issue Dt:	12/06/2005	Application #:	10377823	Filing Dt:	03/04/2003
Publication #:	US20040174530	Pub Dt:	09/09/2004
Title:	SEMICONDUCTOR FABRICATING APPARATUS WITH FUNCTION OF DETERMINING ETCHING PROCESSING STATE

Patent #:	7122096	Issue Dt:	10/17/2006	Application #:	10377824	Filing Dt:	03/04/2003
Publication #:	US20040175849	Pub Dt:	09/09/2004
Title:	METHOD AND APPARATUS FOR PROCESSING SEMICONDUCTOR

Patent #:	7010374	Issue Dt:	03/07/2006	Application #:	10377827	Filing Dt:	03/04/2003
Publication #:	US20040175880	Pub Dt:	09/09/2004
Title:	METHOD FOR CONTROLLING SEMICONDUCTOR PROCESSING APPARATUS

Patent #:	7384602	Issue Dt:	06/10/2008	Application #:	10400445	Filing Dt:	03/28/2003
Publication #:	US20030211010	Pub Dt:	11/13/2003
Title:	CHEMICAL ANALYSIS APPARATUS AND GENETIC DIAGNOSTIC APPARATUS

Patent #:	7064319	Issue Dt:	06/20/2006	Application #:	10401944	Filing Dt:	03/31/2003
Publication #:	US20040195502	Pub Dt:	10/07/2004
Title:	MASS SPECTROMETER

Patent #:	6756590	Issue Dt:	06/29/2004	Application #:	10421140	Filing Dt:	04/23/2003
Publication #:	US20030197873	Pub Dt:	10/23/2003
Title:	SHAPE MEASUREMENT METHOD AND APPARATUS

Patent #:	7156971	Issue Dt:	01/02/2007	Application #:	10421887	Filing Dt:	04/24/2003
Publication #:	US20030201180	Pub Dt:	10/30/2003
Title:	CAPILLARY ARRAY AND ELECTROPHORESIS APPARATUS, AND METHODS

Patent #:	7300628	Issue Dt:	11/27/2007	Application #:	10445918	Filing Dt:	05/28/2003
Publication #:	US20030235514	Pub Dt:	12/25/2003
Title:	AUTOMATIC ANALYZING APPARATUS

Patent #:	6707033	Issue Dt:	03/16/2004	Application #:	10446079	Filing Dt:	05/28/2003
Publication #:	US20030222211	Pub Dt:	12/04/2003
Title:	MASS SPECTROMETER

Patent #:	7217352	Issue Dt:	05/15/2007	Application #:	10446107	Filing Dt:	05/28/2003
Publication #:	US20030221965	Pub Dt:	12/04/2003
Title:	CAPILLARY ELECTROPHORESIS DEVICE

Patent #:	7250096	Issue Dt:	07/31/2007	Application #:	10448187	Filing Dt:	05/30/2003
Publication #:	US20040018638	Pub Dt:	01/29/2004
Title:	CAPILLARY ELECTROPHORESIS APPARATUS AND METHOD

Patent #:	6949926	Issue Dt:	09/27/2005	Application #:	10456520	Filing Dt:	06/09/2003
Publication #:	US20030231016	Pub Dt:	12/18/2003
Title:	BIOMAGNETIC MEASUREMENT APPARATUS

Patent #:	6984589	Issue Dt:	01/10/2006	Application #:	10460217	Filing Dt:	06/13/2003
Publication #:	US20040040930	Pub Dt:	03/04/2004
Title:	METHOD FOR DETERMINING ETCHING PROCESS CONDITIONS AND CONTROLLING ETCHING PROCESS

Patent #:	7091496	Issue Dt:	08/15/2006	Application #:	10462791	Filing Dt:	06/17/2003
Publication #:	US20040036489	Pub Dt:	02/26/2004
Title:	ELECTRON MICROSCOPIC INSPECTION APPARATUS

Patent #:	7053367	Issue Dt:	05/30/2006	Application #:	10494335	Filing Dt:	04/30/2004
Publication #:	US20040262512	Pub Dt:	12/30/2004
Title:	MASS SPECTROMETER

Patent #:	8126655	Issue Dt:	02/28/2012	Application #:	10496588	Filing Dt:	05/24/2004
Publication #:	US20040259099	Pub Dt:	12/23/2004
Title:	INFORMATION PROCESSING SYSTEM USING INFORMATION ON BASE SEQUENCE

Patent #:	7285777	Issue Dt:	10/23/2007	Application #:	10504869	Filing Dt:	06/28/2005
Publication #:	US20050247876	Pub Dt:	11/10/2005
Title:	SAMPLE DIMENSION MEASURING METHOD AND SCANNING ELECTRON MICROSCOPE

Patent #:	7747394	Issue Dt:	06/29/2010	Application #:	10521351	Filing Dt:	01/12/2005
Publication #:	US20060147917	Pub Dt:	07/06/2006
Title:	INFORMATION PROCESSING SYSTEM USING BASE SEQUENCE RELEVANT INFORMATION

Patent #:	7273704	Issue Dt:	09/25/2007	Application #:	10522991	Filing Dt:	02/02/2005
Publication #:	US20060088839	Pub Dt:	04/27/2006
Title:	METHOD OF DETECTING NUCLEIC ACID BY USING DNA MICROARRAYS AND NUCLEIC ACID DETECTION APPARATUS

Patent #:	7337071	Issue Dt:	02/26/2008	Application #:	10534979	Filing Dt:	05/16/2005
Publication #:	US20060008805	Pub Dt:	01/12/2006
Title:	INFORMATION PROCESSING SYSTEM USING BASE SEQUENCE-RELATED INFORMATION

Patent #:	7417721	Issue Dt:	08/26/2008	Application #:	10536715	Filing Dt:	10/21/2005
Publication #:	US20060124874	Pub Dt:	06/15/2006
Title:	DEFECT DETECTOR AND DEFECT DETECTING METHOD

Patent #:	7365306	Issue Dt:	04/29/2008	Application #:	10544668	Filing Dt:	05/03/2006
Publication #:	US20060237644	Pub Dt:	10/26/2006
Title:	STANDARD MEMBER FOR LENGTH MEASUREMENT, METHOD FOR PRODUCING THE SAME, AND ELECTRON BEAM LENGTH MEASURING DEVICE USING THE SAME

Patent #:	8067205	Issue Dt:	11/29/2011	Application #:	10550788	Filing Dt:	11/16/2005
Publication #:	US20060246453	Pub Dt:	11/02/2006
Title:	METHOD OF SYNTHESIZING CDNA

Patent #:	7691643	Issue Dt:	04/06/2010	Application #:	10561771	Filing Dt:	12/21/2005
Publication #:	US20070059842	Pub Dt:	03/15/2007
Title:	MASS ANALYSIS METHOD AND MASS ANALYSIS APPARATUS

Patent #:	6765205	Issue Dt:	07/20/2004	Application #:	10601531	Filing Dt:	06/24/2003
Publication #:	US20040099805	Pub Dt:	05/27/2004
Title:	ELECTRON MICROSCOPE INCLUDING APPARATUS FOR X-RAY ANALYSIS AND METHOD OF ANALYZING SPECIMENS USING SAME

Patent #:	7384601	Issue Dt:	06/10/2008	Application #:	10603624	Filing Dt:	06/26/2003
Publication #:	US20050175506	Pub Dt:	08/11/2005
Title:	AUTOMATIC ANALYZER

Patent #:	7556771	Issue Dt:	07/07/2009	Application #:	10606835	Filing Dt:	06/27/2003
Publication #:	US20040091396	Pub Dt:	05/13/2004
Title:	AUTOMATIC ANALYZING SYSTEM

Patent #:	7067830	Issue Dt:	06/27/2006	Application #:	10629623	Filing Dt:	07/30/2003
Publication #:	US20040143356	Pub Dt:	07/22/2004
Title:	MULTI-ELECTRON BEAM EXPOSURE METHOD AND APPARATUS

Patent #:	7340289	Issue Dt:	03/04/2008	Application #:	10634772	Filing Dt:	08/06/2003
Publication #:	US20040034299	Pub Dt:	02/19/2004
Title:	BIOMAGNETIC FIELD MEASURING APPARATUS

Patent #:	7027935	Issue Dt:	04/11/2006	Application #:	10634775	Filing Dt:	08/06/2003
Publication #:	US20040034479	Pub Dt:	02/19/2004
Title:	SAMPLE DISPENSING APPARATUS AND AUTOMATIC ANALYZER USING THE SAME

Patent #:	7424146	Issue Dt:	09/09/2008	Application #:	10640343	Filing Dt:	08/12/2003
Publication #:	US20040032979	Pub Dt:	02/19/2004
Title:	DEFECT INSPECTION METHOD

Patent #:	6957159	Issue Dt:	10/18/2005	Application #:	10643545	Filing Dt:	08/19/2003
Publication #:	US20040111228	Pub Dt:	06/10/2004
Title:	SYSTEM FOR ANALYZING COMPOUND STRUCTURE

Patent #:	7216311	Issue Dt:	05/08/2007	Application #:	10648231	Filing Dt:	08/27/2003
Publication #:	US20040156223	Pub Dt:	08/12/2004
Title:	SYSTEM AND METHOD FOR EVALUATING A SEMICONDUCTOR DEVICE PATTERN, METHOD FOR CONTROLLING PROCESS OF FORMING A SEMICONDUCTOR DEVICE PATTERN AND METHOD FOR MONITORING A SEMICONDUCTOR DEVICE MANUFACTURING PROCESS

Patent #:	7125730	Issue Dt:	10/24/2006	Application #:	10653907	Filing Dt:	09/04/2003
Publication #:	US20040056706	Pub Dt:	03/25/2004
Title:	POWER SUPPLY, A SEMICONDUCTOR MAKING APPARATUS AND A SEMICONDUCTOR WAFER FABRICATING METHOD USING THE SAME

Patent #:	6956211	Issue Dt:	10/18/2005	Application #:	10656166	Filing Dt:	09/08/2003
Publication #:	US20040119022	Pub Dt:	06/24/2004
Title:	CHARGED PARTICLE BEAM APPARATUS AND CHARGED PARTICLE BEAM IRRADIATION METHOD

Patent #:	7331751	Issue Dt:	02/19/2008	Application #:	10658291	Filing Dt:	09/10/2003
Publication #:	US20040074603	Pub Dt:	04/22/2004
Title:	VACUUM PROCESSING METHOD

Patent #:	7029594	Issue Dt:	04/18/2006	Application #:	10658398	Filing Dt:	09/10/2003
Publication #:	US20040045673	Pub Dt:	03/11/2004
Title:	PLASMA PROCESSING METHOD

Patent #:	6838833	Issue Dt:	01/04/2005	Application #:	10670288	Filing Dt:	09/26/2003
Publication #:	US20040061449	Pub Dt:	04/01/2004
Title:	PLASMA PROCESSING APPARATUS

Patent #:	7813539	Issue Dt:	10/12/2010	Application #:	10672010	Filing Dt:	09/25/2003
Publication #:	US20040064269	Pub Dt:	04/01/2004
Title:	METHOD AND APPARATUS FOR ANALYZING DEFECT DATA AND A REVIEW SYSTEM

Patent #:	7625524	Issue Dt:	12/01/2009	Application #:	10676020	Filing Dt:	10/02/2003
Publication #:	US20040067165	Pub Dt:	04/08/2004
Title:	AUTOMATIC ANALYZER

Patent #:	7483560	Issue Dt:	01/27/2009	Application #:	10679290	Filing Dt:	10/07/2003
Publication #:	US20050100205	Pub Dt:	05/12/2005
Title:	METHOD FOR MEASURING THREE DIMENSIONAL SHAPE OF A FINE PATTERN

Patent #:	6828551	Issue Dt:	12/07/2004	Application #:	10679454	Filing Dt:	10/07/2003
Publication #:	US20040069943	Pub Dt:	04/15/2004
Title:	MASS SPECTROMETER SYSTEM

Patent #:	6914207	Issue Dt:	07/05/2005	Application #:	10688991	Filing Dt:	10/21/2003
Publication #:	US20040079733	Pub Dt:	04/29/2004
Title:	PLASMA PROCESSING METHOD

Patent #:	7022981	Issue Dt:	04/04/2006	Application #:	10690750	Filing Dt:	10/23/2003
Publication #:	US20040089802	Pub Dt:	05/13/2004
Title:	MASS ANALYSIS APPARATUS AND METHOD FOR MASS ANALYSIS

Patent #:	7588423	Issue Dt:	09/15/2009	Application #:	10695992	Filing Dt:	10/30/2003
Publication #:	US20040164013	Pub Dt:	08/26/2004
Title:	PUMP FOR LIQUID CHROMATOGRAPH

Patent #:	7081625	Issue Dt:	07/25/2006	Application #:	10700525	Filing Dt:	11/05/2003
Publication #:	US20040129879	Pub Dt:	07/08/2004
Title:	CHARGED PARTICLE BEAM APPARATUS

Patent #:	6914239	Issue Dt:	07/05/2005	Application #:	10705612	Filing Dt:	11/10/2003
Publication #:	US20040181347	Pub Dt:	09/16/2004
Title:	SYSTEM FOR ANALYZING MASS SPECTROMETRIC DATA

Patent #:	7788108	Issue Dt:	08/31/2010	Application #:	10716474	Filing Dt:	11/20/2003
Publication #:	US20040102997	Pub Dt:	05/27/2004
Title:	CROSS-CONTAMINATION PREVENTION SYSTEM AND AUTOMATIC ANALYZER WICH EQUIP FOR IT

Patent #:	6972405	Issue Dt:	12/06/2005	Application #:	10717485	Filing Dt:	11/21/2003
Publication #:	US20050017162	Pub Dt:	01/27/2005
Title:	NANOSCALE STANDARD SAMPLE AND ITS MANUFACTURING METHOD

Patent #:	7422672	Issue Dt:	09/09/2008	Application #:	10732221	Filing Dt:	12/11/2003
Publication #:	US20040144652	Pub Dt:	07/29/2004
Title:	CAPILLARY ARRAY APPARATUS, METHOD OF MANUFACTURING THE SAME, AND ELECTROPHORESIS ANALYSIS METHOD

Patent #:	7030376	Issue Dt:	04/18/2006	Application #:	10742901	Filing Dt:	12/23/2003
Publication #:	US20040135082	Pub Dt:	07/15/2004
Title:	ELECTRON BEAM APPARATUS AND METHOD FOR PRODUCTION OF ITS SPECIMEN CHAMBER

Patent #:	6963067	Issue Dt:	11/08/2005	Application #:	10750838	Filing Dt:	01/05/2004
Publication #:	US20040188611	Pub Dt:	09/30/2004
Title:	SCANNING ELECTRON MICROSCOPE AND SAMPLE OBSERVING METHOD USING IT

Patent #:	7105816	Issue Dt:	09/12/2006	Application #:	10751987	Filing Dt:	01/07/2004
Publication #:	US20040183017	Pub Dt:	09/23/2004
Title:	ELECTRON BEAM DEVICE

Patent #:	7364698	Issue Dt:	04/29/2008	Application #:	10756511	Filing Dt:	01/14/2004
Publication #:	US20040185549	Pub Dt:	09/23/2004
Title:	AUTOMATIC ANALYZER

Patent #:	6963069	Issue Dt:	11/08/2005	Application #:	10767262	Filing Dt:	01/30/2004
Publication #:	US20040238752	Pub Dt:	12/02/2004
Title:	CHARGED PARTICLE BEAM DEVICE

Patent #:	6917037	Issue Dt:	07/12/2005	Application #:	10770551	Filing Dt:	02/04/2004
Publication #:	US20040169138	Pub Dt:	09/02/2004
Title:	MASS SPECTRUM ANALYZING SYSTEM

Patent #:	7067805	Issue Dt:	06/27/2006	Application #:	10778327	Filing Dt:	02/17/2004
Publication #:	US20040183011	Pub Dt:	09/23/2004
Title:	ENERGY SPECTRUM MEASURING APPARATUS, ELECTRON ENERGY LOSS SPECTROMETER, ELECTRON MICROSCOPE PROVIDED THEREWITH, AND ELECTRON ENERGY LOSS SPECTRUM MEASURING METHOD

Patent #:	6953929	Issue Dt:	10/11/2005	Application #:	10780634	Filing Dt:	02/19/2004
Publication #:	US20040159785	Pub Dt:	08/19/2004
Title:	MASS ANALYZING METHOD USING AN ION TRAP TYPE MASS SPECTROMETER

100

Patent #:	7824915	Issue Dt:	11/02/2010	Application #:	10780743	Filing Dt:	02/19/2004
Publication #:	US20040245275	Pub Dt:	12/09/2004
Title:	SAMPLE DISPENSING APPARATUS AND AUTOMATIC ANALYZER INCLUDING THE SAME

Assignor

HITACHI HIGH-TECHNOLOGIES CORPORATION

Exec Dt:

02/12/2020

Assignee

HITACHI HIGH-TECH CORPORATION

17-1, TORANOMON 1-CHOME, MINATO-KU

TOKYO, JAPAN

Correspondence name and address
	MATTINGLY & MALUR PC
	1800 DIAGONAL ROAD
	SUITE 210
	ALEXANDRIA, VA 22314

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