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Reel/Frame:	052259/0227			Pages:	68
		Recorded:	03/30/2020
Attorney Dkt #:	T&A-GENERAL/Z-1830(USMA)
Conveyance:	CHANGE OF NAME AND ADDRESS

Total properties: 2251
Page 10 of 23
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Patent #:	8740011	Issue Dt:	06/03/2014	Application #:	13282561	Filing Dt:	10/27/2011
Publication #:	US20120091386	Pub Dt:	04/19/2012
Title:	VACUUM PROCESSING APPARATUS

Patent #:	9039970	Issue Dt:	05/26/2015	Application #:	13288332	Filing Dt:	11/03/2011
Publication #:	US20120070343	Pub Dt:	03/22/2012
Title:	AUTOMATIC ANALYZER

Patent #:	8866070	Issue Dt:	10/21/2014	Application #:	13289633	Filing Dt:	11/04/2011
Publication #:	US20120112061	Pub Dt:	05/10/2012
Title:	MASS SPECTROMETER

Patent #:	8363923	Issue Dt:	01/29/2013	Application #:	13294828	Filing Dt:	11/11/2011
Publication #:	US20120057774	Pub Dt:	03/08/2012
Title:	PATTERN GENERATING APPARATUS AND PATTERN SHAPE EVALUATING APPARATUS

Patent #:	8487253	Issue Dt:	07/16/2013	Application #:	13300117	Filing Dt:	11/18/2011
Publication #:	US20120061566	Pub Dt:	03/15/2012
Title:	SCANNING ELECTRON MICROSCOPE

Patent #:	8975582	Issue Dt:	03/10/2015	Application #:	13311734	Filing Dt:	12/06/2011
Publication #:	US20120074319	Pub Dt:	03/29/2012
Title:	METHOD AND APPARATUS FOR REVIEWING DEFECTS

Patent #:	9310388	Issue Dt:	04/12/2016	Application #:	13318535	Filing Dt:	11/30/2011
Publication #:	US20120109534	Pub Dt:	05/03/2012
Title:	AUTOMATIC ANALYZER AND ANALYSIS METHOD

Patent #:	9136189	Issue Dt:	09/15/2015	Application #:	13318718	Filing Dt:	11/03/2011
Publication #:	US20120044262	Pub Dt:	02/23/2012
Title:	SURFACE OBSERVATION APPARATUS AND SURFACE OBSERVATION METHOD

Patent #:	9488667	Issue Dt:	11/08/2016	Application #:	13318819	Filing Dt:	11/30/2011
Publication #:	US20120065898	Pub Dt:	03/15/2012
Title:	AUTOMATIC ANALYZER

Patent #:	9476893	Issue Dt:	10/25/2016	Application #:	13321072	Filing Dt:	11/17/2011
Publication #:	US20120064636	Pub Dt:	03/15/2012
Title:	AUTOMATIC ANALYSIS DEVICE AND ANALYSIS METHOD

Patent #:	8552373	Issue Dt:	10/08/2013	Application #:	13321583	Filing Dt:	11/21/2011
Publication #:	US20120061565	Pub Dt:	03/15/2012
Title:	CHARGED PARTICLE BEAM DEVICE AND SAMPLE OBSERVATION METHOD

Patent #:	8544723	Issue Dt:	10/01/2013	Application #:	13322166	Filing Dt:	12/14/2011
Publication #:	US20120080516	Pub Dt:	04/05/2012
Title:	AUTOMATIC ANALYZER WITH THE FUNCTION OF RENDERING REAGENT INFORMATION UNREADABLE

Patent #:	8742375	Issue Dt:	06/03/2014	Application #:	13322394	Filing Dt:	11/23/2011
Publication #:	US20120104251	Pub Dt:	05/03/2012
Title:	SCANNING ELECTRON MICROSCOPE DEVICE, EVALUATION POINT GENERATING METHOD, AND PROGRAM

Patent #:	9377478	Issue Dt:	06/28/2016	Application #:	13322773	Filing Dt:	02/13/2012
Publication #:	US20120144009	Pub Dt:	06/07/2012
Title:	SAMPLE-TEST-DEVICE MANAGEMENT SERVER, SAMPLE TEST DEVICE, SAMPLE TEST SYSTEM, AND SAMPLE TEST METHOD

Patent #:	8563958	Issue Dt:	10/22/2013	Application #:	13328768	Filing Dt:	12/16/2011
Publication #:	US20120154797	Pub Dt:	06/21/2012
Title:	INSPECTION APPARATUS AND INSPECTION METHOD

Patent #:	8515153	Issue Dt:	08/20/2013	Application #:	13333638	Filing Dt:	12/21/2011
Publication #:	US20120092483	Pub Dt:	04/19/2012
Title:	SYSTEM AND METHOD OF IMAGE PROCESSING, AND SCANNING ELECTRON MICROSCOPE

Patent #:	8747608	Issue Dt:	06/10/2014	Application #:	13338722	Filing Dt:	12/28/2011
Publication #:	US20120101621	Pub Dt:	04/26/2012
Title:	Plasma Processing Apparatus

Patent #:	8571810	Issue Dt:	10/29/2013	Application #:	13342448	Filing Dt:	01/03/2012
Publication #:	US20120101601	Pub Dt:	04/26/2012
Title:	INFORMATION PROCESSING SYSTEM USING NUCLEOTIDE SEQUENCE-RELATED INFORMATION

Patent #:	8577124	Issue Dt:	11/05/2013	Application #:	13344409	Filing Dt:	01/05/2012
Publication #:	US20120099781	Pub Dt:	04/26/2012
Title:	METHOD AND APPARATUS OF PATTERN INSPECTION AND SEMICONDUCTOR INSPECTION SYSTEM USING THE SAME

Patent #:	8269959	Issue Dt:	09/18/2012	Application #:	13347245	Filing Dt:	01/10/2012
Publication #:	US20120133929	Pub Dt:	05/31/2012
Title:	INSPECTION METHOD AND INSPECTION APPARATUS

Patent #:	8481936	Issue Dt:	07/09/2013	Application #:	13348813	Filing Dt:	01/12/2012
Publication #:	US20120112067	Pub Dt:	05/10/2012
Title:	SCANNING ELECTRON MICROSCOPE SYSTEM AND METHOD FOR MEASURING DIMENSIONS OF PATTERNS FORMED ON SEMICONDUCTOR DEVICE BY USING THE SYSTEM

Patent #:	8280148	Issue Dt:	10/02/2012	Application #:	13349402	Filing Dt:	01/12/2012
Publication #:	US20120114221	Pub Dt:	05/10/2012
Title:	PATTERN DEFECT ANALYSIS EQUIPMENT, PATTERN DEFECT ANALYSIS METHOD AND PATTERN DEFECT ANALYSIS PROGRAM

Patent #:	8582864	Issue Dt:	11/12/2013	Application #:	13354041	Filing Dt:	01/19/2012
Publication #:	US20120207382	Pub Dt:	08/16/2012
Title:	FAULT INSPECTION METHOD

Patent #:	8530865	Issue Dt:	09/10/2013	Application #:	13355104	Filing Dt:	01/20/2012
Publication #:	US20120119086	Pub Dt:	05/17/2012
Title:	GAS FIELD ION SOURCE, CHARGED PARTICLE MICROSCOPE, AND APPARATUS

Patent #:	8828184	Issue Dt:	09/09/2014	Application #:	13356676	Filing Dt:	01/24/2012
Publication #:	US20130119016	Pub Dt:	05/16/2013
Title:	PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD

Patent #:	9274133	Issue Dt:	03/01/2016	Application #:	13360202	Filing Dt:	01/27/2012
Publication #:	US20120301359	Pub Dt:	11/29/2012
Title:	AUTOMATIC ANALYZER

Patent #:	8452076	Issue Dt:	05/28/2013	Application #:	13362181	Filing Dt:	01/31/2012
Publication #:	US20120128233	Pub Dt:	05/24/2012
Title:	DEFECT CLASSIFIER USING CLASSIFICATION RECIPE BASED ON CONNECTION BETWEEN RULE-BASED AND EXAMPLE-BASED CLASSIFIERS

Patent #:	8461527	Issue Dt:	06/11/2013	Application #:	13362536	Filing Dt:	01/31/2012
Publication #:	US20120126117	Pub Dt:	05/24/2012
Title:	SCANNING ELECTRON MICROSCOPE AND METHOD FOR PROCESSING AN IMAGE OBTAINED BY THE SCANNING ELECTRON MICROSCOPE

Patent #:	8828254	Issue Dt:	09/09/2014	Application #:	13363415	Filing Dt:	02/01/2012
Publication #:	US20130029492	Pub Dt:	01/31/2013
Title:	PLASMA PROCESSING METHOD

Patent #:	10541115	Issue Dt:	01/21/2020	Application #:	13363427	Filing Dt:	02/01/2012
Publication #:	US20130087288	Pub Dt:	04/11/2013
Title:	PLASMA PROCESSING APPARATUS

Patent #:	8580131	Issue Dt:	11/12/2013	Application #:	13363488	Filing Dt:	02/01/2012
Publication #:	US20130109184	Pub Dt:	05/02/2013
Title:	PLASMA ETCHING METHOD

Patent #:	9076638	Issue Dt:	07/07/2015	Application #:	13365355	Filing Dt:	02/03/2012
Publication #:	US20120223223	Pub Dt:	09/06/2012
Title:	MASS SPECTROMETER METHOD AND MASS SPECTROMETER

Patent #:	8482727	Issue Dt:	07/09/2013	Application #:	13366704	Filing Dt:	02/06/2012
Publication #:	US20120133926	Pub Dt:	05/31/2012
Title:	DEFECT INSPECTION METHOD

Patent #:	8664588	Issue Dt:	03/04/2014	Application #:	13368549	Filing Dt:	02/08/2012
Publication #:	US20120248305	Pub Dt:	10/04/2012
Title:	MASS SPECTROMETER

Patent #:	8355123	Issue Dt:	01/15/2013	Application #:	13368585	Filing Dt:	02/08/2012
Publication #:	US20120133927	Pub Dt:	05/31/2012
Title:	DEFECT INSPECTION APPARATUS AND ITS METHOD

Patent #:	8929665	Issue Dt:	01/06/2015	Application #:	13375131	Filing Dt:	11/29/2011
Publication #:	US20120070089	Pub Dt:	03/22/2012
Title:	METHOD OF MANUFACTURING A TEMPLATE MATCHING TEMPLATE, AS WELL AS A DEVICE FOR MANUFACTURING A TEMPLATE

Patent #:	8885037	Issue Dt:	11/11/2014	Application #:	13375239	Filing Dt:	12/05/2011
Publication #:	US20120092484	Pub Dt:	04/19/2012
Title:	DEFECT INSPECTION METHOD AND APPARATUS THEREFOR

Patent #:	8831306	Issue Dt:	09/09/2014	Application #:	13375249	Filing Dt:	11/30/2011
Publication #:	US20120076349	Pub Dt:	03/29/2012
Title:	FLOW TYPE PARTICLE IMAGE ANALYSIS METHOD AND DEVICE

Patent #:	8995748	Issue Dt:	03/31/2015	Application #:	13375880	Filing Dt:	02/22/2012
Publication #:	US20120141011	Pub Dt:	06/07/2012
Title:	DEFECT IMAGE PROCESSING APPARATUS, DEFECT IMAGE PROCESSING METHOD, SEMICONDUCTOR DEFECT CLASSIFYING APPARATUS, AND SEMICONDUCTOR DEFECT CLASSIFYING METHOD

Patent #:	8892494	Issue Dt:	11/18/2014	Application #:	13376390	Filing Dt:	01/20/2012
Publication #:	US20120117010	Pub Dt:	05/10/2012
Title:	DEVICE FOR CLASSIFYING DEFECTS AND METHOD FOR ADJUSTING CLASSIFICATION

Patent #:	8426835	Issue Dt:	04/23/2013	Application #:	13376473	Filing Dt:	12/06/2011
Publication #:	US20120085925	Pub Dt:	04/12/2012
Title:	CHARGED PARTICLE RADIATION DEVICE

Patent #:	9207152	Issue Dt:	12/08/2015	Application #:	13377154	Filing Dt:	12/27/2011
Publication #:	US20120079875	Pub Dt:	04/05/2012
Title:	PRETREATMENT APPARATUS AND MASS ANALYZING APPARATUS EQUIPPED WITH THE SAME

Patent #:	8438660	Issue Dt:	05/07/2013	Application #:	13378286	Filing Dt:	12/14/2011
Publication #:	US20120090056	Pub Dt:	04/12/2012
Title:	MICROCONTACT PROBER

Patent #:	8599369	Issue Dt:	12/03/2013	Application #:	13378418	Filing Dt:	01/18/2012
Publication #:	US20120133928	Pub Dt:	05/31/2012
Title:	DEFECT INSPECTION DEVICE AND INSPECTION METHOD

Patent #:	8629410	Issue Dt:	01/14/2014	Application #:	13378827	Filing Dt:	12/16/2011
Publication #:	US20120091362	Pub Dt:	04/19/2012
Title:	CHARGED PARTICLE RADIATION DEVICE

Patent #:	9343264	Issue Dt:	05/17/2016	Application #:	13379042	Filing Dt:	01/10/2012
Publication #:	US20120098953	Pub Dt:	04/26/2012
Title:	SCANNING ELECTRON MICROSCOPE DEVICE AND PATTERN DIMENSION MEASURING METHOD USING SAME

Patent #:	9341584	Issue Dt:	05/17/2016	Application #:	13379663	Filing Dt:	12/21/2011
Publication #:	US20120098952	Pub Dt:	04/26/2012
Title:	CHARGED-PARTICLE MICROSCOPE DEVICE AND METHOD FOR INSPECTING SAMPLE USING SAME

Patent #:	8680484	Issue Dt:	03/25/2014	Application #:	13380251	Filing Dt:	12/22/2011
Publication #:	US20120097864	Pub Dt:	04/26/2012
Title:	FLUORESCENCE ANALYZING APPARATUS AND FLUORESCENCE DETECTING APPARATUS

Patent #:	8455841	Issue Dt:	06/04/2013	Application #:	13381623	Filing Dt:	12/29/2011
Publication #:	US20120097863	Pub Dt:	04/26/2012
Title:	ION MICROSCOPE

Patent #:	8852511	Issue Dt:	10/07/2014	Application #:	13382316	Filing Dt:	02/01/2012
Publication #:	US20120141330	Pub Dt:	06/07/2012
Title:	AUTOMATIC ANALYZER

Patent #:	8595666	Issue Dt:	11/26/2013	Application #:	13382437	Filing Dt:	02/07/2012
Publication #:	US20120131529	Pub Dt:	05/24/2012
Title:	SEMICONDUCTOR DEFECT CLASSIFYING METHOD, SEMICONDUCTOR DEFECT CLASSIFYING APPARATUS, AND SEMICONDUCTOR DEFECT CLASSIFYING PROGRAM

Patent #:	8835834	Issue Dt:	09/16/2014	Application #:	13383371	Filing Dt:	01/10/2012
Publication #:	US20120112059	Pub Dt:	05/10/2012
Title:	MASS SPECTROMETER AND MASS SPECTROMETRY METHOD

Patent #:	9291633	Issue Dt:	03/22/2016	Application #:	13383508	Filing Dt:	01/27/2012
Publication #:	US20120174687	Pub Dt:	07/12/2012
Title:	AUTOMATED SAMPLE PROCESSING SYSTEM

Patent #:	9129775	Issue Dt:	09/08/2015	Application #:	13383546	Filing Dt:	01/11/2012
Publication #:	US20120119085	Pub Dt:	05/17/2012
Title:	SPECIMEN POTENTIAL MEASURING METHOD, AND CHARGED PARTICLE BEAM DEVICE

Patent #:	NONE	Issue Dt:		Application #:	13384363	Filing Dt:	01/27/2012
Publication #:	US20120128534	Pub Dt:	05/24/2012
Title:	AUTOMATIC ANALYZER

Patent #:	8833186	Issue Dt:	09/16/2014	Application #:	13384833	Filing Dt:	01/27/2012
Publication #:	US20120266698	Pub Dt:	10/25/2012
Title:	SAMPLE CONVEYING SYSTEM

Patent #:	9182359	Issue Dt:	11/10/2015	Application #:	13386243	Filing Dt:	02/02/2012
Publication #:	US20120268742	Pub Dt:	10/25/2012
Title:	APPARATUS AND METHOD FOR INSPECTING PATTERN DEFECT

Patent #:	8816277	Issue Dt:	08/26/2014	Application #:	13386540	Filing Dt:	08/13/2012
Publication #:	US20130026361	Pub Dt:	01/31/2013
Title:	PATTERN EVALUATION METHOD, DEVICE THEREFOR, AND ELECTRON BEAM DEVICE

Patent #:	NONE	Issue Dt:		Application #:	13386541	Filing Dt:	02/02/2012
Publication #:	US20120129673	Pub Dt:	05/24/2012
Title:	CENTRIFUGAL SEPARATOR WITH ROTOR BALANCING MECHANISM

Patent #:	8760264	Issue Dt:	06/24/2014	Application #:	13386718	Filing Dt:	02/07/2012
Publication #:	US20120133492	Pub Dt:	05/31/2012
Title:	ARTICLE CONVEYING SYSTEM AND SAMPLE PROCESSING SYSTEM

Patent #:	NONE	Issue Dt:		Application #:	13386846	Filing Dt:	02/02/2012
Publication #:	US20120134559	Pub Dt:	05/31/2012
Title:	PARTICLE IMAGE ANALYSIS APPARATUS

Patent #:	8552407	Issue Dt:	10/08/2013	Application #:	13386980	Filing Dt:	01/25/2012
Publication #:	US20120126146	Pub Dt:	05/24/2012
Title:	ION MILLING DEVICE

Patent #:	8633841	Issue Dt:	01/21/2014	Application #:	13387122	Filing Dt:	02/14/2012
Publication #:	US20120154190	Pub Dt:	06/21/2012
Title:	SIGNAL PROCESSING DEVICE, MASS SPECTROMETER, AND PHOTOMETER

Patent #:	9991092	Issue Dt:	06/05/2018	Application #:	13387183	Filing Dt:	03/01/2012
Publication #:	US20120153145	Pub Dt:	06/21/2012
Title:	SCANNING ELECTRON MICROSCOPE AND SAMPLE OBSERVATION METHOD

Patent #:	9176037	Issue Dt:	11/03/2015	Application #:	13387229	Filing Dt:	02/15/2012
Publication #:	US20120134895	Pub Dt:	05/31/2012
Title:	SPECIMEN PROCESSING SYSTEM

Patent #:	9075026	Issue Dt:	07/07/2015	Application #:	13387369	Filing Dt:	05/16/2012
Publication #:	US20120229618	Pub Dt:	09/13/2012
Title:	DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

Patent #:	8867818	Issue Dt:	10/21/2014	Application #:	13387382	Filing Dt:	01/27/2012
Publication #:	US20120121160	Pub Dt:	05/17/2012
Title:	METHOD OF CREATING TEMPLATE FOR MATCHING, AS WELL AS DEVICE FOR CREATING TEMPLATE

Patent #:	8809782	Issue Dt:	08/19/2014	Application #:	13387424	Filing Dt:	01/27/2012
Publication #:	US20120127299	Pub Dt:	05/24/2012
Title:	SCANNING ELECTRON MICROSCOPE

Patent #:	8679421	Issue Dt:	03/25/2014	Application #:	13388451	Filing Dt:	02/17/2012
Publication #:	US20120156098	Pub Dt:	06/21/2012
Title:	DISPENSING DEVICE AND ANALYZER

Patent #:	9040251	Issue Dt:	05/26/2015	Application #:	13388671	Filing Dt:	02/03/2012
Publication #:	US20120130050	Pub Dt:	05/24/2012
Title:	BIOMOLECULE FIXING BOARD AND METHOD OF MANUFACTURING THE SAME

Patent #:	9389238	Issue Dt:	07/12/2016	Application #:	13388801	Filing Dt:	02/03/2012
Publication #:	US20130009988	Pub Dt:	01/10/2013
Title:	AUTOMATIC ANALYZING DEVICE, INFORMATION DISPLAY METHOD THEREOF, AND INFORMATION DISPLAY SYSTEM

Patent #:	9097690	Issue Dt:	08/04/2015	Application #:	13388813	Filing Dt:	02/29/2012
Publication #:	US20120179405	Pub Dt:	07/12/2012
Title:	SAMPLE PREPROCESSING AND CONVEYING SYSTEM

Patent #:	8877128	Issue Dt:	11/04/2014	Application #:	13389942	Filing Dt:	03/09/2012
Publication #:	US20120177547	Pub Dt:	07/12/2012
Title:	AUTOMATED SAMPLE TESTING SYSTEM

Patent #:	8547546	Issue Dt:	10/01/2013	Application #:	13390342	Filing Dt:	02/14/2012
Publication #:	US20120147363	Pub Dt:	06/14/2012
Title:	SURFACE-DEFECT INSPECTION DEVICE

Patent #:	9176075	Issue Dt:	11/03/2015	Application #:	13390958	Filing Dt:	02/17/2012
Publication #:	US20120147364	Pub Dt:	06/14/2012
Title:	CONTAMINATION INSPECTION METHOD AND CONTAMINATION INSPECTION DEVICE

Patent #:	8591752	Issue Dt:	11/26/2013	Application #:	13399030	Filing Dt:	02/17/2012
Publication #:	US20130146563	Pub Dt:	06/13/2013
Title:	PLASMA PROCESSING METHOD

Patent #:	8558171	Issue Dt:	10/15/2013	Application #:	13404492	Filing Dt:	02/24/2012
Publication #:	US20120153146	Pub Dt:	06/21/2012
Title:	CHARGED PARTICLE BEAM APPARATUS INCLUDING ABERRATION CORRECTOR

Patent #:	8310665	Issue Dt:	11/13/2012	Application #:	13404749	Filing Dt:	02/24/2012
Publication #:	US20120162665	Pub Dt:	06/28/2012
Title:	INSPECTING METHOD AND INSPECTING APPARATUS FOR SUBSTRATE SURFACE

Patent #:	9384946	Issue Dt:	07/05/2016	Application #:	13410331	Filing Dt:	03/02/2012
Publication #:	US20130180662	Pub Dt:	07/18/2013
Title:	PLASMA PROCESSING APPARATUS

Patent #:	9513302	Issue Dt:	12/06/2016	Application #:	13423651	Filing Dt:	03/19/2012
Publication #:	US20120183438	Pub Dt:	07/19/2012
Title:	REAGENT TRANSFER DEVICE

Patent #:	8462327	Issue Dt:	06/11/2013	Application #:	13432153	Filing Dt:	03/28/2012
Publication #:	US20120194808	Pub Dt:	08/02/2012
Title:	APPEARANCE INSPECTION APPARATUS

Patent #:	8642957	Issue Dt:	02/04/2014	Application #:	13432176	Filing Dt:	03/28/2012
Publication #:	US20120181426	Pub Dt:	07/19/2012
Title:	SCANNING ELECTRON MICROSCOPE AND A METHOD FOR IMAGING A SPECIMEN USING THE SAME

Patent #:	9230775	Issue Dt:	01/05/2016	Application #:	13451596	Filing Dt:	04/20/2012
Publication #:	US20120286160	Pub Dt:	11/15/2012
Title:	CHARGED PARTICLE INSTRUMENT

Patent #:	8686383	Issue Dt:	04/01/2014	Application #:	13454897	Filing Dt:	04/24/2012
Publication #:	US20120205850	Pub Dt:	08/16/2012
Title:	Object Holding Apparatus, and Inspection Apparatus

Patent #:	8507856	Issue Dt:	08/13/2013	Application #:	13457359	Filing Dt:	04/26/2012
Publication #:	US20120211653	Pub Dt:	08/23/2012
Title:	PATTERN MEASURING METHOD AND PATTERN MEASURING DEVICE

Patent #:	9003868	Issue Dt:	04/14/2015	Application #:	13466841	Filing Dt:	05/08/2012
Publication #:	US20120279284	Pub Dt:	11/08/2012
Title:	LIQUID CHROMATOGRAPH AND SAMPLE INTRODUCING APPARATUS

Patent #:	8525984	Issue Dt:	09/03/2013	Application #:	13469071	Filing Dt:	05/10/2012
Publication #:	US20120224173	Pub Dt:	09/06/2012
Title:	INSPECTION APPARATUS AND INSPECTION METHOD

Patent #:	8537351	Issue Dt:	09/17/2013	Application #:	13473314	Filing Dt:	05/16/2012
Publication #:	US20120287425	Pub Dt:	11/15/2012
Title:	INSPECTION APPARATUS AND INSPECTION METHOD

Patent #:	8691148	Issue Dt:	04/08/2014	Application #:	13473666	Filing Dt:	05/17/2012
Publication #:	US20120230873	Pub Dt:	09/13/2012
Title:	SAMPLE DISPENSING APPARATUS AND AUTOMATIC ANALYZER INCLUDING THE SAME

Patent #:	8812151	Issue Dt:	08/19/2014	Application #:	13479518	Filing Dt:	05/24/2012
Publication #:	US20120303158	Pub Dt:	11/29/2012
Title:	VACUUM PROCESS DEVICE AND VACUUM PROCESS METHOD

Patent #:	8483035	Issue Dt:	07/09/2013	Application #:	13482065	Filing Dt:	05/29/2012
Publication #:	US20120307605	Pub Dt:	12/06/2012
Title:	Thermally Assisted Magnetic Recording Head Inspection Method and Apparatus

Patent #:	8416402	Issue Dt:	04/09/2013	Application #:	13483104	Filing Dt:	05/30/2012
Publication #:	US20120236296	Pub Dt:	09/20/2012
Title:	METHOD AND APPARATUS FOR INSPECTING DEFECTS

Patent #:	9093890	Issue Dt:	07/28/2015	Application #:	13489522	Filing Dt:	06/06/2012
Publication #:	US20120305766	Pub Dt:	12/06/2012
Title:	LINEAR MOTOR, MOVABLE STAGE AND ELECTRON MICROSCOPE

Patent #:	8680465	Issue Dt:	03/25/2014	Application #:	13498994	Filing Dt:	03/29/2012
Publication #:	US20120187292	Pub Dt:	07/26/2012
Title:	CHARGED PARTICLE BEAM APPARATUS AND FILM THICKNESS MEASUREMENT METHOD

Patent #:	8729467	Issue Dt:	05/20/2014	Application #:	13500592	Filing Dt:	04/05/2012
Publication #:	US20120193550	Pub Dt:	08/02/2012
Title:	CHARGED PARTICLE RADIATION DEVICE

Patent #:	8809801	Issue Dt:	08/19/2014	Application #:	13501561	Filing Dt:	04/12/2012
Publication #:	US20120199758	Pub Dt:	08/09/2012
Title:	GAS FIELD IONIZATION ION SOURCE AND ION BEAM DEVICE

Patent #:	8730459	Issue Dt:	05/20/2014	Application #:	13501941	Filing Dt:	05/03/2012
Publication #:	US20120206713	Pub Dt:	08/16/2012
Title:	EXAMINATION DEVICE AND EXAMINATION METHOD

Patent #:	NONE	Issue Dt:		Application #:	13502216	Filing Dt:	05/11/2012
Publication #:	US20120220026	Pub Dt:	08/30/2012
Title:	GAS TEMPERATURE/HUMIDITY REGULATION METHOD AND GAS SUPPLY DEVICE

Patent #:	8709364	Issue Dt:	04/29/2014	Application #:	13502271	Filing Dt:	04/16/2012
Publication #:	US20120207646	Pub Dt:	08/16/2012
Title:	HEAT RETAINING DEVICE

100

Patent #:	8772732	Issue Dt:	07/08/2014	Application #:	13502754	Filing Dt:	04/19/2012
Publication #:	US20120199739	Pub Dt:	08/09/2012
Title:	SCANNING CHARGED PARTICLE BEAM DEVICE AND METHOD FOR CORRECTING CHROMATIC SPHERICAL COMBINATION ABERRATION

Assignor

HITACHI HIGH-TECHNOLOGIES CORPORATION

Exec Dt:

02/12/2020

Assignee

HITACHI HIGH-TECH CORPORATION

17-1, TORANOMON 1-CHOME, MINATO-KU

TOKYO, JAPAN

Correspondence name and address
	MATTINGLY & MALUR PC
	1800 DIAGONAL ROAD
	SUITE 210
	ALEXANDRIA, VA 22314

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