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Reel/Frame:052259/0227   Pages: 68
Recorded: 03/30/2020
Attorney Dkt #:T&A-GENERAL/Z-1830(USMA)
Conveyance: CHANGE OF NAME AND ADDRESS
Total properties: 2251
Page 13 of 23
Pages: 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23
1
Patent #:
9104913
Issue Dt:
08/11/2015
Application #:
13882147
Filing Dt:
04/26/2013
Publication #:
US20130216121
Pub Dt:
08/22/2013
Title:
PATTERN MEASURING METHOD, PATTERN MEASURING APPARATUS, AND PROGRAM USING SAME
2
Patent #:
9588054
Issue Dt:
03/07/2017
Application #:
13882542
Filing Dt:
07/26/2013
Publication #:
US20130321798
Pub Dt:
12/05/2013
Title:
DEFECT INSPECTION METHOD, LOW LIGHT DETECTING METHOD AND LOW LIGHT DETECTOR
3
Patent #:
9224574
Issue Dt:
12/29/2015
Application #:
13883034
Filing Dt:
06/04/2013
Publication #:
US20130256531
Pub Dt:
10/03/2013
Title:
CHARGED PARTICLE OPTICAL EQUIPMENT AND METHOD FOR MEASURING LENS ABERRATION
4
Patent #:
9440235
Issue Dt:
09/13/2016
Application #:
13883612
Filing Dt:
05/06/2013
Publication #:
US20130224753
Pub Dt:
08/29/2013
Title:
GENETIC TESTING METHOD AND TESTING APPARATUS
5
Patent #:
8822952
Issue Dt:
09/02/2014
Application #:
13883764
Filing Dt:
05/07/2013
Publication #:
US20130228686
Pub Dt:
09/05/2013
Title:
CHARGED PARTICLE BEAM APPARATUS HAVING NOISE ABSORBING ARRANGEMENTS
6
Patent #:
9221055
Issue Dt:
12/29/2015
Application #:
13883830
Filing Dt:
05/07/2013
Publication #:
US20130230908
Pub Dt:
09/05/2013
Title:
REACTION PLATE ASSEMBLY, REACTION PLATE AND NUCLEIC ACID ANALYSIS DEVICE
7
Patent #:
8704177
Issue Dt:
04/22/2014
Application #:
13883989
Filing Dt:
05/07/2013
Publication #:
US20130234024
Pub Dt:
09/12/2013
Title:
ELECTRON MICROSCOPE, ELECTRON-MICROSCOPE IMAGE-RECONSTRUCTION SYSTEM AND ELECTRON-MICROSCOPE IMAGE-RECONSTRUCTION METHOD
8
Patent #:
8829434
Issue Dt:
09/09/2014
Application #:
13885435
Filing Dt:
05/15/2013
Publication #:
US20130228682
Pub Dt:
09/05/2013
Title:
MASS SPECTROMETER AND MASS SPECTROMETRY METHOD
9
Patent #:
8699017
Issue Dt:
04/15/2014
Application #:
13886302
Filing Dt:
05/03/2013
Publication #:
US20130242293
Pub Dt:
09/19/2013
Title:
APPEARANCE INSPECTION APPARATUS
10
Patent #:
9521372
Issue Dt:
12/13/2016
Application #:
13898620
Filing Dt:
05/21/2013
Publication #:
US20130321610
Pub Dt:
12/05/2013
Title:
PATTERN MEASURING APPARATUS, PATTERN MEASURING METHOD, AND COMPUTER-READABLE RECORDING MEDIUM ON WHICH A PATTERN MEASURING PROGRAM IS RECORDED
11
Patent #:
8953868
Issue Dt:
02/10/2015
Application #:
13905164
Filing Dt:
05/30/2013
Publication #:
US20130322737
Pub Dt:
12/05/2013
Title:
DEFECT INSPECTION METHOD AND DEFECT INSPECTION APPARATUS
12
Patent #:
9006679
Issue Dt:
04/14/2015
Application #:
13909299
Filing Dt:
06/04/2013
Publication #:
US20130320207
Pub Dt:
12/05/2013
Title:
MASS SPECTROMETER
13
Patent #:
8766182
Issue Dt:
07/01/2014
Application #:
13924213
Filing Dt:
06/21/2013
Publication #:
US20130284921
Pub Dt:
10/31/2013
Title:
Method for Detecting Information of an Electric Potential on a Sample and Charged Particle Beam Apparatus
14
Patent #:
8779400
Issue Dt:
07/15/2014
Application #:
13926352
Filing Dt:
06/25/2013
Publication #:
US20130284593
Pub Dt:
10/31/2013
Title:
ION SOURCE, ION BEAM PROCESSING/OBSERVATION APPARATUS, CHARGED PARTICLE BEAM APPARATUS, AND METHOD FOR OBSERVING CROSS SECTION OF SAMPLE
15
Patent #:
8632725
Issue Dt:
01/21/2014
Application #:
13927209
Filing Dt:
06/26/2013
Publication #:
US20130287629
Pub Dt:
10/31/2013
Title:
AUTOMATIC ANALYZER
16
Patent #:
9046499
Issue Dt:
06/02/2015
Application #:
13929030
Filing Dt:
06/27/2013
Publication #:
US20140009756
Pub Dt:
01/09/2014
Title:
SURFACE INSPECTING APPARATUS AND SURFACE INSPECTING METHOD
17
Patent #:
8890096
Issue Dt:
11/18/2014
Application #:
13935853
Filing Dt:
07/05/2013
Publication #:
US20140008534
Pub Dt:
01/09/2014
Title:
MEASURING/INSPECTING APPARATUS AND MEASURING/INSPECTING METHOD ENABLING BLANKING CONTROL OF ELECTRON BEAM
18
Patent #:
8648300
Issue Dt:
02/11/2014
Application #:
13939767
Filing Dt:
07/11/2013
Publication #:
US20140014836
Pub Dt:
01/16/2014
Title:
CHARGED PARTICLE BEAM APPARATUS
19
Patent #:
9091595
Issue Dt:
07/28/2015
Application #:
13945285
Filing Dt:
07/18/2013
Publication #:
US20140022540
Pub Dt:
01/23/2014
Title:
ANALYSIS METHOD, ANALYSIS DEVICE, AND ETCHING PROCESSING SYSTEM
20
Patent #:
10665448
Issue Dt:
05/26/2020
Application #:
13953924
Filing Dt:
07/30/2013
Publication #:
US20140102640
Pub Dt:
04/17/2014
Title:
PLASMA PROCESSING APPARATUS
21
Patent #:
NONE
Issue Dt:
Application #:
13956492
Filing Dt:
08/01/2013
Publication #:
US20140202995
Pub Dt:
07/24/2014
Title:
PLASMA HEAT TREATMENT APPARATUS
22
Patent #:
9019490
Issue Dt:
04/28/2015
Application #:
13956858
Filing Dt:
08/01/2013
Publication #:
US20130314700
Pub Dt:
11/28/2013
Title:
SURFACE-DEFECT INSPECTION DEVICE
23
Patent #:
9099349
Issue Dt:
08/04/2015
Application #:
13958685
Filing Dt:
08/05/2013
Publication #:
US20140175534
Pub Dt:
06/26/2014
Title:
SEMICONDUCTOR DEVICE MANUFACTURING METHOD
24
Patent #:
8655050
Issue Dt:
02/18/2014
Application #:
13959384
Filing Dt:
08/05/2013
Publication #:
US20130315468
Pub Dt:
11/28/2013
Title:
PATTERN GENERATING APPARATUS AND PATTERN SHAPE EVALUATING APPARATUS
25
Patent #:
8969211
Issue Dt:
03/03/2015
Application #:
13960831
Filing Dt:
08/07/2013
Publication #:
US20140302682
Pub Dt:
10/09/2014
Title:
METHOD AND APPARATUS FOR PLASMA PROCESSING
26
Patent #:
8787132
Issue Dt:
07/22/2014
Application #:
13964455
Filing Dt:
08/12/2013
Publication #:
US20140092716
Pub Dt:
04/03/2014
Title:
METHOD AND APPARATUS FOR INSPECTING THERMAL ASSIST TYPE MAGNETIC HEAD
27
Patent #:
8921781
Issue Dt:
12/30/2014
Application #:
13971408
Filing Dt:
08/20/2013
Publication #:
US20130327939
Pub Dt:
12/12/2013
Title:
MEASUREMENT OR INSPECTING APPARATUS
28
Patent #:
9257318
Issue Dt:
02/09/2016
Application #:
13975612
Filing Dt:
08/26/2013
Publication #:
US20140294555
Pub Dt:
10/02/2014
Title:
OPERATION METHOD FOR VACUUM PROCESSING APPARATUS
29
Patent #:
10408787
Issue Dt:
09/10/2019
Application #:
13976157
Filing Dt:
07/17/2013
Publication #:
US20130292251
Pub Dt:
11/07/2013
Title:
ELECTROPHORESIS APPARATUS, CAPILLARY ARRAY, AND CAPILLARY UNIT
30
Patent #:
8922764
Issue Dt:
12/30/2014
Application #:
13976178
Filing Dt:
07/17/2013
Publication #:
US20130301042
Pub Dt:
11/14/2013
Title:
DEFECT INSPECTION METHOD AND DEFECT INSPECTION APPARATUS
31
Patent #:
9651570
Issue Dt:
05/16/2017
Application #:
13976672
Filing Dt:
06/27/2013
Publication #:
US20130281279
Pub Dt:
10/24/2013
Title:
AUTOMATIC CENTRIFUGE, PRE-ANALYSIS SYSTEM WITH AUTOMATIC CENTRIFUGE AND THE CONTROL TECHNIQUES OF THAT SYSTEM
32
Patent #:
8952324
Issue Dt:
02/10/2015
Application #:
13978445
Filing Dt:
07/05/2013
Publication #:
US20130277542
Pub Dt:
10/24/2013
Title:
MASS ANALYZING APPARATUS, ANALYZING METHOD AND CALIBRATION SAMPLE
33
Patent #:
9080972
Issue Dt:
07/14/2015
Application #:
13979668
Filing Dt:
07/15/2013
Publication #:
US20130301048
Pub Dt:
11/14/2013
Title:
AUTOMATIC ANALYZER
34
Patent #:
9287083
Issue Dt:
03/15/2016
Application #:
13979964
Filing Dt:
07/16/2013
Publication #:
US20130299715
Pub Dt:
11/14/2013
Title:
CHARGED PARTICLE BEAM DEVICE
35
Patent #:
9129353
Issue Dt:
09/08/2015
Application #:
13980481
Filing Dt:
07/18/2013
Publication #:
US20130301954
Pub Dt:
11/14/2013
Title:
CHARGED PARTICLE BEAM DEVICE, AND IMAGE ANALYSIS DEVICE
36
Patent #:
9483048
Issue Dt:
11/01/2016
Application #:
13980897
Filing Dt:
08/06/2013
Publication #:
US20130310964
Pub Dt:
11/21/2013
Title:
SAMPLE TRANSPORT SYSTEM AND METHOD FOR CONTROLLING THE SAME
37
Patent #:
9978044
Issue Dt:
05/22/2018
Application #:
13980909
Filing Dt:
07/22/2013
Publication #:
US20130311243
Pub Dt:
11/21/2013
Title:
ANALYZING DEVICE
38
Patent #:
10297419
Issue Dt:
05/21/2019
Application #:
13981175
Filing Dt:
07/23/2013
Publication #:
US20130306866
Pub Dt:
11/21/2013
Title:
SCANNING ELECTRON MICROSCOPE
39
Patent #:
8957959
Issue Dt:
02/17/2015
Application #:
13981326
Filing Dt:
07/24/2013
Publication #:
US20130300854
Pub Dt:
11/14/2013
Title:
CHARGED PARTICLE MICROSCOPE AND MEASUREMENT IMAGE CORRECTION METHOD THEREOF
40
Patent #:
8834814
Issue Dt:
09/16/2014
Application #:
13981337
Filing Dt:
08/07/2013
Publication #:
US20130305846
Pub Dt:
11/21/2013
Title:
AUTOMATIC ANALYSIS SYSTEM WITH REMOVAL, TRACKING, AND MOUNTING OF STOPPER BODIES
41
Patent #:
9202665
Issue Dt:
12/01/2015
Application #:
13981952
Filing Dt:
10/14/2013
Publication #:
US20140027635
Pub Dt:
01/30/2014
Title:
CHARGED PARTICLE BEAM APPARATUS FOR REMOVING CHARGES DEVELOPED ON A REGION OF A SAMPLE
42
Patent #:
10535129
Issue Dt:
01/14/2020
Application #:
13981963
Filing Dt:
10/09/2013
Publication #:
US20140023265
Pub Dt:
01/23/2014
Title:
PATTERN MATCHING APPARATUS AND COMPUTER PROGRAM
43
Patent #:
9290804
Issue Dt:
03/22/2016
Application #:
13981983
Filing Dt:
07/26/2013
Publication #:
US20130309675
Pub Dt:
11/21/2013
Title:
Microparticle having single-molecule nucleic acid probe, method for producing same, method for analyzing nucleic acid using same, device for nucleic acid analysis, and apparatus for analyzing nucleic acid
44
Patent #:
9347096
Issue Dt:
05/24/2016
Application #:
13982544
Filing Dt:
07/30/2013
Publication #:
US20130316441
Pub Dt:
11/28/2013
Title:
GENETIC ANALYZER
45
Patent #:
9442129
Issue Dt:
09/13/2016
Application #:
13982745
Filing Dt:
10/14/2013
Publication #:
US20140037503
Pub Dt:
02/06/2014
Title:
AUTOMATIC ANALYZER
46
Patent #:
8802032
Issue Dt:
08/12/2014
Application #:
13982768
Filing Dt:
10/14/2013
Publication #:
US20140030167
Pub Dt:
01/30/2014
Title:
ANALYZER
47
Patent #:
9543111
Issue Dt:
01/10/2017
Application #:
13982805
Filing Dt:
07/31/2013
Publication #:
US20130313430
Pub Dt:
11/28/2013
Title:
CHARGED PARTICLE BEAM DEVICE
48
Patent #:
9393562
Issue Dt:
07/19/2016
Application #:
13983340
Filing Dt:
08/02/2013
Publication #:
US20130316336
Pub Dt:
11/28/2013
Title:
ANALYZER
49
Patent #:
9164042
Issue Dt:
10/20/2015
Application #:
13984286
Filing Dt:
08/08/2013
Publication #:
US20130320216
Pub Dt:
12/05/2013
Title:
DEVICE FOR DETECTING FOREIGN MATTER AND METHOD FOR DETECTING FOREIGN MATTER
50
Patent #:
9006653
Issue Dt:
04/14/2015
Application #:
13984329
Filing Dt:
08/08/2013
Publication #:
US20130313431
Pub Dt:
11/28/2013
Title:
ELECTRON MICROSCOPE
51
Patent #:
9355817
Issue Dt:
05/31/2016
Application #:
13988506
Filing Dt:
05/20/2013
Publication #:
US20130240353
Pub Dt:
09/19/2013
Title:
ION MILLING DEVICE AND ION MILLING PROCESSING METHOD
52
Patent #:
9057873
Issue Dt:
06/16/2015
Application #:
13988547
Filing Dt:
05/21/2013
Publication #:
US20130234019
Pub Dt:
09/12/2013
Title:
GLOBAL ALIGNMENT USING MULTIPLE ALIGNMENT PATTERN CANDIDATES
53
Patent #:
9429586
Issue Dt:
08/30/2016
Application #:
13988767
Filing Dt:
07/11/2013
Publication #:
US20130280129
Pub Dt:
10/24/2013
Title:
AUTOMATIC ANALYZER
54
Patent #:
9423412
Issue Dt:
08/23/2016
Application #:
13988775
Filing Dt:
07/11/2013
Publication #:
US20130280130
Pub Dt:
10/24/2013
Title:
AUTOMATIC ANALYZER
55
Patent #:
NONE
Issue Dt:
Application #:
13988812
Filing Dt:
06/05/2013
Publication #:
US20130243652
Pub Dt:
09/19/2013
Title:
AUTOMATIC ANALYZER
56
Patent #:
9019492
Issue Dt:
04/28/2015
Application #:
13989835
Filing Dt:
05/28/2013
Publication #:
US20130242294
Pub Dt:
09/19/2013
Title:
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
57
Patent #:
9342878
Issue Dt:
05/17/2016
Application #:
13991948
Filing Dt:
06/06/2013
Publication #:
US20130265408
Pub Dt:
10/10/2013
Title:
CHARGED PARTICLE BEAM APPARATUS
58
Patent #:
9234861
Issue Dt:
01/12/2016
Application #:
13992514
Filing Dt:
06/07/2013
Publication #:
US20130248378
Pub Dt:
09/26/2013
Title:
ELECTRODE FOR ELECTROCHEMICAL MEASUREMENT, ELECTROLYSIS CELL FOR ELECTROCHEMICAL MEASUREMENT, ANALYZER FOR ELECTROCHEMICAL MEASUREMENT, AND METHODS FOR PRODUCING SAME
59
Patent #:
8958076
Issue Dt:
02/17/2015
Application #:
13993630
Filing Dt:
07/15/2013
Publication #:
US20130278926
Pub Dt:
10/24/2013
Title:
Surface Shape Measuring Apparatus
60
Patent #:
8848049
Issue Dt:
09/30/2014
Application #:
13993797
Filing Dt:
06/13/2013
Publication #:
US20130278745
Pub Dt:
10/24/2013
Title:
CHARGED PARTICLE BEAM DEVICE AND METHOD FOR CORRECTING DETECTED SIGNAL THEREOF
61
Patent #:
8902417
Issue Dt:
12/02/2014
Application #:
13993814
Filing Dt:
06/27/2013
Publication #:
US20130271754
Pub Dt:
10/17/2013
Title:
INSPECTION APPARATUS
62
Patent #:
8907278
Issue Dt:
12/09/2014
Application #:
13993822
Filing Dt:
07/23/2013
Publication #:
US20130299697
Pub Dt:
11/14/2013
Title:
CHARGED PARTICLE BEAM APPLIED APPARATUS, AND IRRADIATION METHOD
63
Patent #:
9773641
Issue Dt:
09/26/2017
Application #:
13993838
Filing Dt:
06/13/2013
Publication #:
US20130277553
Pub Dt:
10/24/2013
Title:
METHOD AND APPARATUS FOR OBSERVING DEFECTS
64
Patent #:
9239283
Issue Dt:
01/19/2016
Application #:
13993888
Filing Dt:
07/25/2013
Publication #:
US20130293879
Pub Dt:
11/07/2013
Title:
DEFECT INSPECTION METHOD AND DEVICE THEREFOR
65
Patent #:
8766184
Issue Dt:
07/01/2014
Application #:
13994811
Filing Dt:
06/20/2013
Publication #:
US20130284923
Pub Dt:
10/31/2013
Title:
SCANNING ELECTRON MICROSCOPE
66
Patent #:
8835884
Issue Dt:
09/16/2014
Application #:
13994812
Filing Dt:
06/17/2013
Publication #:
US20130264496
Pub Dt:
10/10/2013
Title:
CHARGED PARTICLE BEAM APPARATUS WITH CLEANING PHOTO-IRRADIATION APPARATUS
67
Patent #:
8735816
Issue Dt:
05/27/2014
Application #:
13995627
Filing Dt:
06/19/2013
Publication #:
US20130299699
Pub Dt:
11/14/2013
Title:
STANDARD MEMBER FOR CALIBRATION AND METHOD OF MANUFACTURING THE SAME AND SCANNING ELECTRON MICROSCOPE USING THE SAME
68
Patent #:
8908171
Issue Dt:
12/09/2014
Application #:
13996613
Filing Dt:
06/21/2013
Publication #:
US20130286387
Pub Dt:
10/31/2013
Title:
DEFECT INSPECTION METHOD AND DEFECT INSPECTION DEVICE
69
Patent #:
9523124
Issue Dt:
12/20/2016
Application #:
13996638
Filing Dt:
06/21/2013
Publication #:
US20130296197
Pub Dt:
11/07/2013
Title:
Device for Nucleic Acid Analysis and Nucleic Acid Analyzer
70
Patent #:
9602780
Issue Dt:
03/21/2017
Application #:
13997496
Filing Dt:
06/24/2013
Publication #:
US20130286191
Pub Dt:
10/31/2013
Title:
APPARATUS FOR INSPECTING DEFECT WITH TIME/SPATIAL DIVISION OPTICAL SYSTEM
71
Patent #:
8972911
Issue Dt:
03/03/2015
Application #:
14000212
Filing Dt:
08/17/2013
Publication #:
US20130326439
Pub Dt:
12/05/2013
Title:
IMAGE PROCESSING DEVICE AND COMPUTER PROGRAM FOR PERFORMING IMAGE PROCESSING
72
Patent #:
9343260
Issue Dt:
05/17/2016
Application #:
14000236
Filing Dt:
08/19/2013
Publication #:
US20130320227
Pub Dt:
12/05/2013
Title:
MULTIPOLE AND CHARGED PARTICLE RADIATION APPARATUS USING THE SAME
73
Patent #:
9222890
Issue Dt:
12/29/2015
Application #:
14000610
Filing Dt:
08/21/2013
Publication #:
US20130321803
Pub Dt:
12/05/2013
Title:
PLASMA SPECTROMETER
74
Patent #:
9297649
Issue Dt:
03/29/2016
Application #:
14001433
Filing Dt:
10/22/2013
Publication #:
US20140048706
Pub Dt:
02/20/2014
Title:
PATTERN DIMENSION MEASUREMENT METHOD AND CHARGED PARTICLE BEAM APPARATUS
75
Patent #:
8941060
Issue Dt:
01/27/2015
Application #:
14001711
Filing Dt:
08/27/2013
Publication #:
US20130334416
Pub Dt:
12/19/2013
Title:
MASS SPECTROMETER AND ION SOURCE USED THEREFOR
76
Patent #:
9159530
Issue Dt:
10/13/2015
Application #:
14002056
Filing Dt:
09/20/2013
Publication #:
US20140014835
Pub Dt:
01/16/2014
Title:
ELECTRON MICROSCOPE SAMPLE HOLDER AND SAMPLE OBSERVATION METHOD
77
Patent #:
9957562
Issue Dt:
05/01/2018
Application #:
14002125
Filing Dt:
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Assignor
1
HITACHI HIGH-TECHNOLOGIES CORPORATION
Exec Dt:
02/12/2020
Assignee
1
HITACHI HIGH-TECH CORPORATION
17-1, TORANOMON 1-CHOME, MINATO-KU
TOKYO, JAPAN
Correspondence name and address
MATTINGLY & MALUR PC
1800 DIAGONAL ROAD
SUITE 210
ALEXANDRIA, VA 22314

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