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07/10/2014
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05/29/2014
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ELECTRON GUN AND CHARGED PARTICLE BEAM DEVICE HAVING AN APERTURE WITH FLARE-SUPPRESSING COATING
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Patent #:
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Issue Dt:
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04/12/2016
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Application #:
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14240669
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Filing Dt:
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02/24/2014
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Publication #:
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Pub Dt:
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07/17/2014
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Title:
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SURFACE SHAPE MEASURING APPARATUS
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Patent #:
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Issue Dt:
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05/12/2015
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Application #:
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14241121
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Filing Dt:
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05/27/2014
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Publication #:
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Pub Dt:
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12/11/2014
| | | | |
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Title:
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SCANNING ELECTRON MICROSCOPE
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Patent #:
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Issue Dt:
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09/26/2017
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Application #:
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14241148
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Filing Dt:
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03/20/2014
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Publication #:
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Pub Dt:
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07/17/2014
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Title:
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AUTOMATIC ANALYZER
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Patent #:
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Issue Dt:
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05/10/2016
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Application #:
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14244802
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Filing Dt:
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04/03/2014
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Publication #:
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Pub Dt:
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10/09/2014
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Title:
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CHARGED PARTICLE BEAM DEVICE AND MEASURING METHOD USING THE SAME
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Patent #:
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Issue Dt:
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06/28/2016
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Application #:
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14248376
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Filing Dt:
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04/09/2014
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Publication #:
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Pub Dt:
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08/07/2014
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Title:
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Plasma Etching Method
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Patent #:
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Issue Dt:
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11/18/2014
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Application #:
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14248844
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Filing Dt:
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04/09/2014
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Publication #:
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Pub Dt:
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08/07/2014
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Title:
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PLASMA ETCHING METHOD
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Patent #:
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Issue Dt:
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01/24/2017
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Application #:
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14249512
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Filing Dt:
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04/10/2014
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Publication #:
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Pub Dt:
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08/07/2014
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Title:
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SURFACE INSPECTION APPARATUS AND METHOD THEREOF
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Patent #:
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Issue Dt:
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04/05/2016
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Application #:
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14250438
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Filing Dt:
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04/11/2014
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Publication #:
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Pub Dt:
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10/16/2014
| | | | |
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Title:
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OBSERVATION DEVICE AND OBSERVATION METHOD
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Patent #:
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Issue Dt:
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09/12/2017
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Application #:
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14251823
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Filing Dt:
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04/14/2014
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Publication #:
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Pub Dt:
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10/23/2014
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Title:
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LIQUID CHROMATOGRAPH APPARATUS AND LIQUID CHROMATOGRAPH ANALYSIS METHOD
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Patent #:
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Issue Dt:
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11/17/2015
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Application #:
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14252839
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Filing Dt:
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04/15/2014
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Publication #:
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Pub Dt:
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10/30/2014
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Title:
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CHARGED PARTICLE MICROSCOPE APPARATUS AND IMAGE ACQUISITION METHOD OF CHARGED PARTICLE MICROSCOPE APPARATUS UTILIZING IMAGE CORRECTION BASED ON ESTIMATED DIFFUSION OF CHARGED PARTICLES
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Patent #:
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Issue Dt:
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05/26/2015
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Application #:
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14262466
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Filing Dt:
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04/25/2014
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Publication #:
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Pub Dt:
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08/21/2014
| | | | |
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Title:
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PLASMA PROCESSING APPARATUS
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Patent #:
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Issue Dt:
|
10/06/2015
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Application #:
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14287016
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Filing Dt:
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05/24/2014
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Publication #:
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Pub Dt:
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11/20/2014
| | | | |
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Title:
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BACK SCATTERED ELECTRON DETECTOR
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Patent #:
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Issue Dt:
|
09/08/2015
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Application #:
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14289092
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Filing Dt:
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05/28/2014
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Publication #:
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Pub Dt:
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09/18/2014
| | | | |
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Title:
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TRANSMISSION ELECTRON MICROSCOPE, AND METHOD OF OBSERVING SPECIMEN
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Patent #:
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Issue Dt:
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04/16/2019
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Application #:
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14289773
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Filing Dt:
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05/29/2014
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Publication #:
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Pub Dt:
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09/18/2014
| | | | |
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Title:
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PLASMA PROCESSING APPARATUS
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Patent #:
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Issue Dt:
|
01/26/2016
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Application #:
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14291029
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Filing Dt:
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05/30/2014
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Publication #:
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Pub Dt:
|
09/18/2014
| | | | |
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Title:
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AUTOMATED ANALYZER
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Patent #:
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Issue Dt:
|
11/03/2015
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Application #:
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14301403
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Filing Dt:
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06/11/2014
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Publication #:
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Pub Dt:
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02/12/2015
| | | | |
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Title:
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PROCESSING APPARATUS AND METHOD USING A SCANNING ELECTRON MICROSCOPE
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Patent #:
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Issue Dt:
|
04/16/2019
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Application #:
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14303636
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Filing Dt:
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06/13/2014
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Publication #:
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Pub Dt:
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03/26/2015
| | | | |
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Title:
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ANALYSIS METHOD AND SEMICONDUCTOR ETCHING APPARATUS
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Patent #:
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Issue Dt:
|
09/15/2015
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Application #:
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14307546
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Filing Dt:
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06/18/2014
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Publication #:
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Pub Dt:
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10/02/2014
| | | | |
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Title:
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AUTOMATIC ANALYZER USING A SAMPLE CONTAINER HAVING AN INFORMATION RECORDING MEMBER
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Patent #:
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Issue Dt:
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11/29/2016
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Application #:
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14328754
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Filing Dt:
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07/11/2014
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Publication #:
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Pub Dt:
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10/30/2014
| | | | |
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Title:
|
ION BEAM DEVICE
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Patent #:
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Issue Dt:
|
03/07/2017
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Application #:
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14331681
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Filing Dt:
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07/15/2014
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Publication #:
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Pub Dt:
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03/05/2015
| | | | |
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Title:
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DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
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Patent #:
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Issue Dt:
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11/24/2015
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Application #:
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14332923
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Filing Dt:
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07/16/2014
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Publication #:
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Pub Dt:
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11/06/2014
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Title:
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GAS FIELD IONIZATION ION SOURCE AND ION BEAM DEVICE
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Patent #:
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Issue Dt:
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09/19/2017
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Application #:
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14333502
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Filing Dt:
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07/16/2014
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Publication #:
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Pub Dt:
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01/22/2015
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Title:
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PLASMA PROCESSING APPARATUS AND OPERATIONAL METHOD THEREOF
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Patent #:
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Issue Dt:
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10/13/2015
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Application #:
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14334837
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Filing Dt:
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07/18/2014
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Publication #:
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Pub Dt:
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11/06/2014
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Title:
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CHARGED PARTICLE BEAM APPARATUS PERMITTING HIGH-RESOLUTION AND HIGH-CONTRAST OBSERVATION
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Patent #:
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Issue Dt:
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07/18/2017
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Application #:
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14346342
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Filing Dt:
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03/21/2014
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Publication #:
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Pub Dt:
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10/16/2014
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Title:
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METHOD AND SUBSTRATE FOR NUCLEIC ACID AMPLIFICATION, AND METHOD AND APPARATUS FOR NUCLEIC ACID ANALYSIS
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Patent #:
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Issue Dt:
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05/17/2016
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Application #:
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14347127
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Filing Dt:
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03/25/2014
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Publication #:
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Pub Dt:
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08/07/2014
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Title:
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Method and Apparatus for Reviewing Defect
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Patent #:
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Issue Dt:
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11/24/2015
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Application #:
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14347450
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Filing Dt:
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03/26/2014
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Publication #:
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Pub Dt:
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08/28/2014
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Title:
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AUTOMATIC ANALYSIS DEVICE
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Patent #:
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Issue Dt:
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04/05/2016
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Application #:
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14349375
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Filing Dt:
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04/03/2014
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Publication #:
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Pub Dt:
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09/04/2014
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Title:
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MEASURING METHOD, DATA PROCESSING APPARATUS AND ELECTRON MICROSCOPE USING SAME
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Patent #:
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Issue Dt:
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11/21/2017
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Application #:
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14349520
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Filing Dt:
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04/03/2014
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Publication #:
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Pub Dt:
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10/02/2014
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Title:
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METHOD FOR ANALYZING BIOMOLECULES AND BIOMOLECULE ANALYZER
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Patent #:
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Issue Dt:
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01/13/2015
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Application #:
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14349630
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Filing Dt:
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04/03/2014
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Publication #:
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Pub Dt:
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09/04/2014
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Title:
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INSPECTION OR OBSERVATION APPARATUS AND SAMPLE INSPECTION OR OBSERVATION METHOD
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Issue Dt:
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10/25/2016
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14349633
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04/03/2014
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11/06/2014
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Title:
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SAMPLE PROCESSING SYSTEM
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07/12/2016
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14350314
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04/07/2014
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Pub Dt:
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10/09/2014
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Title:
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PHASE SHIFT MASK, METHOD OF FORMING ASYMMETRIC PATTERN, METHOD OF MANUFACTURING DIFFRACTION GRATING, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
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03/03/2015
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14351900
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04/15/2014
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Pub Dt:
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10/09/2014
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Title:
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SCANNING ELECTRON MICROSCOPE
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09/13/2016
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14352192
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04/16/2014
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09/25/2014
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Title:
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AUTOMATED ANALYZER
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08/30/2016
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14353042
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04/21/2014
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Pub Dt:
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09/04/2014
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Title:
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AUTOMATED ANALYSIS SYSTEM
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Issue Dt:
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10/09/2018
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14353798
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04/24/2014
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Pub Dt:
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10/02/2014
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Title:
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SPECIMEN TRANSFER DEVICE AND SYSTEM
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Issue Dt:
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12/01/2015
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14354917
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04/28/2014
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Pub Dt:
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09/18/2014
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Title:
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OBSERVATION SPECIMEN FOR USE IN ELECTRON MICROSCOPY, ELECTRON MICROSCOPY, ELECTRON MICROSCOPE, AND DEVICE FOR PRODUCING OBSERVATION SPECIMEN
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Issue Dt:
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12/15/2015
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14355083
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04/29/2014
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10/09/2014
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Title:
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HOLDER FOR TRANSFERRING TEST TUBE
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06/13/2017
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14356166
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05/04/2014
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Pub Dt:
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02/26/2015
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Title:
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CHARGED PARTICLE BEAM APPARATUS AND METHOD OF CORRECTING LANDING ANGLE OF CHARGED PARTICLE BEAM
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Issue Dt:
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06/09/2015
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14356191
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05/05/2014
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Pub Dt:
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09/25/2014
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Title:
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CHARGED-PARTICLE RADIATION APPARATUS
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Issue Dt:
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02/09/2016
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14359221
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05/19/2014
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09/11/2014
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Title:
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DEFECT INSPECTION METHOD AND DEVICE FOR SAME
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02/12/2019
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14360636
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05/26/2014
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11/06/2014
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Title:
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DEFECT CLASSIFICATION APPARATUS AND DEFECT CLASSIFICATION METHOD
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11/08/2016
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14360649
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05/26/2014
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10/30/2014
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Title:
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PATTERN EVALUATION METHOD AND PATTERN EVALUATION DEVICE
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08/11/2015
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14360987
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05/28/2014
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Pub Dt:
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11/06/2014
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Title:
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EXPOSURE DEVICE AND METHOD FOR PRODUCING STRUCTURE
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10/06/2015
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14361657
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05/29/2014
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11/13/2014
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Title:
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INSPECTION APPARATUS
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03/22/2016
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14362645
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06/04/2014
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Pub Dt:
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11/20/2014
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Title:
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METHOD FOR MEASURING CELLS, AND REAGENT FOR CELL MEASUREMENT
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