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Reel/Frame:	052259/0227			Pages:	68
		Recorded:	03/30/2020
Attorney Dkt #:	T&A-GENERAL/Z-1830(USMA)
Conveyance:	CHANGE OF NAME AND ADDRESS

Total properties: 2251
Page 20 of 23
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Patent #:	10539584	Issue Dt:	01/21/2020	Application #:	15534628	Filing Dt:	06/09/2017
Publication #:	US20170370957	Pub Dt:	12/28/2017
Title:	SAMPLING NOZZLE, AUTOMATIC ANALYZER USING THE SAME, AND METHOD OF MANUFACTURING SAMPLING NOZZLE

Patent #:	NONE	Issue Dt:		Application #:	15537541	Filing Dt:	06/19/2017
Publication #:	US20170343540	Pub Dt:	11/30/2017
Title:	ANALYSIS METHOD AND ANALYSIS DEVICE

Patent #:	10168281	Issue Dt:	01/01/2019	Application #:	15539228	Filing Dt:	06/23/2017
Publication #:	US20180011021	Pub Dt:	01/11/2018
Title:	MULTICOLOR FLUORESCENCE ANALYSIS DEVICE

Patent #:	10192713	Issue Dt:	01/29/2019	Application #:	15542163	Filing Dt:	07/07/2017
Publication #:	US20180269027	Pub Dt:	09/20/2018
Title:	Charged Particle Beam Device

Patent #:	10739260	Issue Dt:	08/11/2020	Application #:	15542447	Filing Dt:	07/10/2017
Publication #:	US20180275053	Pub Dt:	09/27/2018
Title:	OPTICAL ANALYZING DEVICE

Patent #:	10229821	Issue Dt:	03/12/2019	Application #:	15542505	Filing Dt:	07/10/2017
Publication #:	US20180269049	Pub Dt:	09/20/2018
Title:	Mass Spectrometry Device

Patent #:	10739364	Issue Dt:	08/11/2020	Application #:	15543026	Filing Dt:	07/12/2017
Publication #:	US20180003728	Pub Dt:	01/04/2018
Title:	LIQUID SURFACE INSPECTION DEVICE, AUTOMATED ANALYSIS DEVICE, AND PROCESSING DEVICE

Patent #:	10229812	Issue Dt:	03/12/2019	Application #:	15544788	Filing Dt:	07/19/2017
Publication #:	US20180019097	Pub Dt:	01/18/2018
Title:	SAMPLE OBSERVATION METHOD AND SAMPLE OBSERVATION DEVICE

Patent #:	10170273	Issue Dt:	01/01/2019	Application #:	15544958	Filing Dt:	07/20/2017
Publication #:	US20180019096	Pub Dt:	01/18/2018
Title:	Charged Particle Beam Device, and Method of Manufacturing Component for Charged Particle Beam Device

Patent #:	10417756	Issue Dt:	09/17/2019	Application #:	15545067	Filing Dt:	07/20/2017
Publication #:	US20180012349	Pub Dt:	01/11/2018
Title:	Pattern Measurement Apparatus and Defect Inspection Apparatus

Patent #:	10446359	Issue Dt:	10/15/2019	Application #:	15545550	Filing Dt:	07/21/2017
Publication #:	US20180012725	Pub Dt:	01/11/2018
Title:	Charged Particle Beam Device

Patent #:	10107762	Issue Dt:	10/23/2018	Application #:	15546615	Filing Dt:	07/26/2017
Publication #:	US20180017502	Pub Dt:	01/18/2018
Title:	EXAMINATION DEVICE

Patent #:	10269534	Issue Dt:	04/23/2019	Application #:	15547315	Filing Dt:	07/28/2017
Publication #:	US20180277335	Pub Dt:	09/27/2018
Title:	Mask Position Adjustment Method of Ion Milling, Electron Microscope Capable of Adjusting Mask Position, Mask Adjustment Device Mounted on Sample Stage and Sample Mask Component of Ion Milling Device

Patent #:	10670618	Issue Dt:	06/02/2020	Application #:	15547533	Filing Dt:	07/31/2017
Publication #:	US20180024154	Pub Dt:	01/25/2018
Title:	AUTOMATED ANALYSIS DEVICE, AND LID OPENING/CLOSING MECHANISM

Patent #:	10014151	Issue Dt:	07/03/2018	Application #:	15548321	Filing Dt:	08/02/2017
Publication #:	US20180025885	Pub Dt:	01/25/2018
Title:	COMPOSITE CHARGED PARTICLE BEAM DEVICE

Patent #:	10175172	Issue Dt:	01/08/2019	Application #:	15548432	Filing Dt:	08/03/2017
Publication #:	US20180024061	Pub Dt:	01/25/2018
Title:	MULTICOLOR DETECTION DEVICE

Patent #:	10204773	Issue Dt:	02/12/2019	Application #:	15549228	Filing Dt:	08/07/2017
Publication #:	US20180025896	Pub Dt:	01/25/2018
Title:	ION GUIDE AND MASS SPECTROMETER USING SAME

Patent #:	10527637	Issue Dt:	01/07/2020	Application #:	15549741	Filing Dt:	08/09/2017
Publication #:	US20180017588	Pub Dt:	01/18/2018
Title:	Automatic Analysis Device

Patent #:	10753953	Issue Dt:	08/25/2020	Application #:	15550095	Filing Dt:	08/10/2017
Publication #:	US20180011121	Pub Dt:	01/11/2018
Title:	AUTOMATED ANALYZER AND LIQUID RESERVOIR

Patent #:	10113959	Issue Dt:	10/30/2018	Application #:	15550146	Filing Dt:	08/10/2017
Publication #:	US20180031469	Pub Dt:	02/01/2018
Title:	Terahertz Wave Generating Device and Spectroscopic Device Using Same

Patent #:	11169166	Issue Dt:	11/09/2021	Application #:	15552335	Filing Dt:	08/21/2017
Publication #:	US20180031589	Pub Dt:	02/01/2018
Title:	AUTOMATIC ANALYSER

Patent #:	10163223	Issue Dt:	12/25/2018	Application #:	15552501	Filing Dt:	08/22/2017
Publication #:	US20180012375	Pub Dt:	01/11/2018
Title:	AUTOMATIC ANALYSER

Patent #:	10746755	Issue Dt:	08/18/2020	Application #:	15552809	Filing Dt:	08/23/2017
Publication #:	US20180217173	Pub Dt:	08/02/2018
Title:	AUTOMATIC ANALYZER

Patent #:	10895579	Issue Dt:	01/19/2021	Application #:	15553179	Filing Dt:	08/24/2017
Publication #:	US20180113142	Pub Dt:	04/26/2018
Title:	AUTOMATIC ANALYZER

Patent #:	10591498	Issue Dt:	03/17/2020	Application #:	15554086	Filing Dt:	08/28/2017
Publication #:	US20180038879	Pub Dt:	02/08/2018
Title:	AUTOMATED ANALYSIS DEVICE

Patent #:	10746748	Issue Dt:	08/18/2020	Application #:	15554276	Filing Dt:	08/29/2017
Publication #:	US20180080948	Pub Dt:	03/22/2018
Title:	AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD

Patent #:	10269536	Issue Dt:	04/23/2019	Application #:	15554812	Filing Dt:	08/31/2017
Publication #:	US20180240643	Pub Dt:	08/23/2018
Title:	ELECTRON MICROSCOPE

Patent #:	10613108	Issue Dt:	04/07/2020	Application #:	15556081	Filing Dt:	09/06/2017
Publication #:	US20180267068	Pub Dt:	09/20/2018
Title:	AUTOMATIC ANALYZER

Patent #:	10312053	Issue Dt:	06/04/2019	Application #:	15556400	Filing Dt:	09/07/2017
Publication #:	US20180108512	Pub Dt:	04/19/2018
Title:	Charged Particle Beam Apparatus, Alignment Method of Charged Particle Beam Apparatus, Alignment Program, and Storage Medium

Patent #:	10090162	Issue Dt:	10/02/2018	Application #:	15556455	Filing Dt:	09/07/2017
Publication #:	US20180047573	Pub Dt:	02/15/2018
Title:	PLASMA PROCESSING METHOD AND PLASMA PROCESSING DEVICE

Patent #:	10453192	Issue Dt:	10/22/2019	Application #:	15556546	Filing Dt:	09/07/2017
Publication #:	US20180053296	Pub Dt:	02/22/2018
Title:	CYTOLOGIC DIAGNOSIS SUPPORT APPARATUS, CYTOLOGIC DIAGNOSIS SUPPORT METHOD, REMOTE DIAGNOSIS SUPPORT SYSTEM, SERVICE PROVIDING SYSTEM, AND IMAGE PROCESSING METHOD

Patent #:	10373797	Issue Dt:	08/06/2019	Application #:	15556926	Filing Dt:	09/08/2017
Publication #:	US20180247790	Pub Dt:	08/30/2018
Title:	CHARGED PARTICLE BEAM DEVICE AND IMAGE FORMING METHOD USING SAME

Patent #:	10157750	Issue Dt:	12/18/2018	Application #:	15558045	Filing Dt:	09/13/2017
Publication #:	US20180068862	Pub Dt:	03/08/2018
Title:	PLASMA PROCESSING METHOD AND PLASMA PROCESSING APPARATUS

Patent #:	10103003	Issue Dt:	10/16/2018	Application #:	15558482	Filing Dt:	09/14/2017
Publication #:	US20180068826	Pub Dt:	03/08/2018
Title:	CHARGED PARTICLE BEAM DEVICE AND SAMPLE OBSERVATION METHOD IN CHARGED PARTICLE BEAM DEVICE

Patent #:	10168208	Issue Dt:	01/01/2019	Application #:	15561190	Filing Dt:	09/25/2017
Publication #:	US20180066986	Pub Dt:	03/08/2018
Title:	LIGHT AMOUNT DETECTION DEVICE, IMMUNE ANALYZING APPARATUS AND CHARGED PARTICLE BEAM APPARATUS THAT EACH USE THE LIGHT AMOUNT DETECTION DEVICE

Patent #:	10460913	Issue Dt:	10/29/2019	Application #:	15562353	Filing Dt:	09/27/2017
Publication #:	US20190006153	Pub Dt:	01/03/2019
Title:	THE PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD

Patent #:	10613107	Issue Dt:	04/07/2020	Application #:	15564457	Filing Dt:	10/05/2017
Publication #:	US20180074085	Pub Dt:	03/15/2018
Title:	SPECIMEN CONVEYANCE DEVICE AND SPECIMEN PROCESSING SYSTEM

Patent #:	10304655	Issue Dt:	05/28/2019	Application #:	15565214	Filing Dt:	10/09/2017
Publication #:	US20180082819	Pub Dt:	03/22/2018
Title:	CHARGED PARTICLE BEAM DEVICE AND EVACUATION METHOD FOR SAME

Patent #:	10830763	Issue Dt:	11/10/2020	Application #:	15565959	Filing Dt:	10/12/2017
Publication #:	US20180120296	Pub Dt:	05/03/2018
Title:	COMPONENT ANALYSIS DEVICE, DRUG COMPONENT ANALYSIS DEVICE, COMPONENT ANALYSIS METHOD, AND DRUG COMPONENT ANALYSIS METHOD

Patent #:	10551398	Issue Dt:	02/04/2020	Application #:	15566799	Filing Dt:	10/16/2017
Publication #:	US20180120339	Pub Dt:	05/03/2018
Title:	SPECIMEN CONTAINER INCLINATION CORRECTION MECHANISM, AND METHOD FOR CONTROLLING SAME

Patent #:	10690690	Issue Dt:	06/23/2020	Application #:	15567758	Filing Dt:	10/19/2017
Publication #:	US20180120340	Pub Dt:	05/03/2018
Title:	AUTOMATIC ANALYSER AND METHOD

Patent #:	11101121	Issue Dt:	08/24/2021	Application #:	15568529	Filing Dt:	10/23/2017
Publication #:	US20180114682	Pub Dt:	04/26/2018
Title:	SAMPLE FRAGMENTATION DEVICE USING HEATING AND PRESSURE REGULATION BETWEEN SAMPLE INJECTOR AND SEPARATION COLUMN

Patent #:	10261027	Issue Dt:	04/16/2019	Application #:	15569503	Filing Dt:	10/26/2017
Publication #:	US20180088055	Pub Dt:	03/29/2018
Title:	INSPECTION DEVICE

Patent #:	10121631	Issue Dt:	11/06/2018	Application #:	15570803	Filing Dt:	10/31/2017
Publication #:	US20180158648	Pub Dt:	06/07/2018
Title:	CHARGED PARTICLE BEAM DEVICE PROVIDED WITH ION PUMP

Patent #:	10153128	Issue Dt:	12/11/2018	Application #:	15574773	Filing Dt:	11/16/2017
Publication #:	US20180138009	Pub Dt:	05/17/2018
Title:	CHARGED PARTICLE BEAM APPARATUS AND SAMPLE ELEVATING APPARATUS

Patent #:	10192710	Issue Dt:	01/29/2019	Application #:	15574873	Filing Dt:	11/17/2017
Publication #:	US20180130630	Pub Dt:	05/10/2018
Title:	Ion Milling Apparatus and Ion Milling Method

Patent #:	10890594	Issue Dt:	01/12/2021	Application #:	15577863	Filing Dt:	11/29/2017
Publication #:	US20180164336	Pub Dt:	06/14/2018
Title:	AUTOMATED ANALYZER

Patent #:	10702199	Issue Dt:	07/07/2020	Application #:	15579957	Filing Dt:	12/06/2017
Publication #:	US20180220944	Pub Dt:	08/09/2018
Title:	BLOOD COLLECTING DEVICE

Patent #:	10141157	Issue Dt:	11/27/2018	Application #:	15580403	Filing Dt:	12/07/2017
Publication #:	US20180174796	Pub Dt:	06/21/2018
Title:	Method for Adjusting Height of Sample and Observation System

Patent #:	10786835	Issue Dt:	09/29/2020	Application #:	15580910	Filing Dt:	12/08/2017
Publication #:	US20180161829	Pub Dt:	06/14/2018
Title:	ULTRASONIC CLEANER AND AUTOMATIC ANALYZER USING THE SAME

Patent #:	10424459	Issue Dt:	09/24/2019	Application #:	15613941	Filing Dt:	06/05/2017
Publication #:	US20170271121	Pub Dt:	09/21/2017
Title:	Charged Particle Beam Device

Patent #:	10416179	Issue Dt:	09/17/2019	Application #:	15616296	Filing Dt:	06/07/2017
Publication #:	US20170269113	Pub Dt:	09/21/2017
Title:	AUTOMATIC ANALYZER

Patent #:	10249474	Issue Dt:	04/02/2019	Application #:	15618203	Filing Dt:	06/09/2017
Publication #:	US20170278671	Pub Dt:	09/28/2017
Title:	Charged Particle Beam Device

Patent #:	10816564	Issue Dt:	10/27/2020	Application #:	15664343	Filing Dt:	07/31/2017
Publication #:	US20170328926	Pub Dt:	11/16/2017
Title:	SAMPLE TEST AUTOMATION SYSTEM

Patent #:	9887070	Issue Dt:	02/06/2018	Application #:	15671381	Filing Dt:	08/08/2017
Publication #:	US20170338086	Pub Dt:	11/23/2017
Title:	PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD

Patent #:	10128081	Issue Dt:	11/13/2018	Application #:	15671472	Filing Dt:	08/08/2017
Publication #:	US20170358421	Pub Dt:	12/14/2017
Title:	Composite Charged Particle Beam Detector, Charged Particle Beam Device, and Charged Particle Beam Detector

Patent #:	10267745	Issue Dt:	04/23/2019	Application #:	15673582	Filing Dt:	08/10/2017
Publication #:	US20170363547	Pub Dt:	12/21/2017
Title:	DEFECT DETECTION METHOD AND DEFECT DETECTION DEVICE AND DEFECT OBSERVATION DEVICE PROVIDED WITH SAME

Patent #:	10325781	Issue Dt:	06/18/2019	Application #:	15698823	Filing Dt:	09/08/2017
Publication #:	US20180076051	Pub Dt:	03/15/2018
Title:	ETCHING METHOD AND ETCHING APPARATUS

Patent #:	10229838	Issue Dt:	03/12/2019	Application #:	15701692	Filing Dt:	09/12/2017
Publication #:	US20180122651	Pub Dt:	05/03/2018
Title:	PLASMA ETCHING METHOD

Patent #:	10522333	Issue Dt:	12/31/2019	Application #:	15708449	Filing Dt:	09/19/2017
Publication #:	US20180151336	Pub Dt:	05/31/2018
Title:	VACUUM PROCESSING APPARATUS

Patent #:	10453695	Issue Dt:	10/22/2019	Application #:	15714181	Filing Dt:	09/25/2017
Publication #:	US20180277377	Pub Dt:	09/27/2018
Title:	PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD

Patent #:	10794874	Issue Dt:	10/06/2020	Application #:	15730936	Filing Dt:	10/12/2017
Publication #:	US20180038837	Pub Dt:	02/08/2018
Title:	SAMPLE INJECTION DEVICE

Patent #:	10309979	Issue Dt:	06/04/2019	Application #:	15730947	Filing Dt:	10/12/2017
Publication #:	US20180038882	Pub Dt:	02/08/2018
Title:	SAMPLE DISPENSING APPARATUS AND AUTOMATIC ANALYZER INCLUDING THE SAME

Patent #:	10921337	Issue Dt:	02/16/2021	Application #:	15736053	Filing Dt:	12/13/2017
Publication #:	US20180180637	Pub Dt:	06/28/2018
Title:	AUTOMATIC ANALYZING DEVICE

Patent #:	10935497	Issue Dt:	03/02/2021	Application #:	15736797	Filing Dt:	12/15/2017
Publication #:	US20180188181	Pub Dt:	07/05/2018
Title:	DETECTION DEVICE FOR LUMINESCENCE ANALYSIS AND AUTOMATED ANALYZER

Patent #:	10591442	Issue Dt:	03/17/2020	Application #:	15740020	Filing Dt:	12/27/2017
Publication #:	US20180172639	Pub Dt:	06/21/2018
Title:	RAIL CHECK DEVICE AND RAIL CHECK SYSTEM

Patent #:	10605818	Issue Dt:	03/31/2020	Application #:	15740028	Filing Dt:	12/27/2017
Publication #:	US20180188275	Pub Dt:	07/05/2018
Title:	AUTOMATED ANALYZER

Patent #:	10446361	Issue Dt:	10/15/2019	Application #:	15741038	Filing Dt:	12/29/2017
Publication #:	US20180190469	Pub Dt:	07/05/2018
Title:	ABERRATION CORRECTION METHOD, ABERRATION CORRECTION SYSTEM, AND CHARGED PARTICLE BEAM APPARATUS

Patent #:	10768187	Issue Dt:	09/08/2020	Application #:	15743332	Filing Dt:	01/10/2018
Publication #:	US20180203027	Pub Dt:	07/19/2018
Title:	AUTOMATIC ANALYSIS DEVICE AND SPECIMEN INSPECTION AUTOMATION SYSTEM

Patent #:	10725062	Issue Dt:	07/28/2020	Application #:	15746434	Filing Dt:	01/22/2018
Publication #:	US20180203029	Pub Dt:	07/19/2018
Title:	DISPENSING DEVICE

Patent #:	10768193	Issue Dt:	09/08/2020	Application #:	15747446	Filing Dt:	01/25/2018
Publication #:	US20180210003	Pub Dt:	07/26/2018
Title:	AUTOMATIC ANALYZER

Patent #:	10304654	Issue Dt:	05/28/2019	Application #:	15747847	Filing Dt:	01/26/2018
Publication #:	US20180233320	Pub Dt:	08/16/2018
Title:	Charged Particle Beam Device

Patent #:	11085940	Issue Dt:	08/10/2021	Application #:	15748733	Filing Dt:	01/30/2018
Publication #:	US20190011468	Pub Dt:	01/10/2019
Title:	AUTOMATIC ANALYZER

Patent #:	10725028	Issue Dt:	07/28/2020	Application #:	15749197	Filing Dt:	01/31/2018
Publication #:	US20180231537	Pub Dt:	08/16/2018
Title:	AUTOMATIC ANALYSIS DEVICE, AUTOMATIC ANALYSIS SYSTEM, AND AUTOMATIC ANALYSIS METHOD

Patent #:	10942194	Issue Dt:	03/09/2021	Application #:	15750957	Filing Dt:	02/07/2018
Publication #:	US20180224477	Pub Dt:	08/09/2018
Title:	AUTOMATIC ANALYZER

Patent #:	NONE	Issue Dt:		Application #:	15751544	Filing Dt:	02/09/2018
Publication #:	US20180238829	Pub Dt:	08/23/2018
Title:	ION CONCENTRATION MEASUREMENT DEVICE

Patent #:	11175301	Issue Dt:	11/16/2021	Application #:	15752616	Filing Dt:	02/14/2018
Publication #:	US20180246132	Pub Dt:	08/30/2018
Title:	AUTOMATIC ANALYZER AND REAGENT BOTTLE LOADING METHOD

Patent #:	10431416	Issue Dt:	10/01/2019	Application #:	15753685	Filing Dt:	02/20/2018
Publication #:	US20190013177	Pub Dt:	01/10/2019
Title:	OBSERVATION SUPPORT UNIT FOR CHARGED PARTICLE MICROSCOPE AND SAMPLE OBSERVATION METHOD USING SAME

Patent #:	10330604	Issue Dt:	06/25/2019	Application #:	15754892	Filing Dt:	02/23/2018
Publication #:	US20180259460	Pub Dt:	09/13/2018
Title:	Automated Analyzer

Patent #:	11215627	Issue Dt:	01/04/2022	Application #:	15756431	Filing Dt:	02/28/2018
Publication #:	US20180246133	Pub Dt:	08/30/2018
Title:	AUTOMATIC ANALYZER

Patent #:	10684302	Issue Dt:	06/16/2020	Application #:	15758355	Filing Dt:	03/08/2018
Publication #:	US20180246131	Pub Dt:	08/30/2018
Title:	SPECIMEN INSPECTION AUTOMATION SYSTEM

Patent #:	10290464	Issue Dt:	05/14/2019	Application #:	15759408	Filing Dt:	03/12/2018
Publication #:	US20180182595	Pub Dt:	06/28/2018
Title:	Charged Particle Beam Device and Pattern Measurement Device

Patent #:	10361065	Issue Dt:	07/23/2019	Application #:	15760994	Filing Dt:	03/16/2018
Publication #:	US20180286633	Pub Dt:	10/04/2018
Title:	ION MILLING SYSTEM

Patent #:	NONE	Issue Dt:		Application #:	15761114	Filing Dt:	03/19/2018
Publication #:	US20180258377	Pub Dt:	09/13/2018
Title:	FLOW PASSAGE MODULE AND CELL CULTURE APPARATUS USING SAME

Patent #:	10431445	Issue Dt:	10/01/2019	Application #:	15763813	Filing Dt:	03/27/2018
Publication #:	US20180286658	Pub Dt:	10/04/2018
Title:	ION ANALYSIS DEVICE

Patent #:	10373802	Issue Dt:	08/06/2019	Application #:	15764158	Filing Dt:	03/28/2018
Publication #:	US20180308659	Pub Dt:	10/25/2018
Title:	TRANSMISSION SCANNING MICROSCOPY INCLUDING ELECTRON ENERGY LOSS SPECTROSCOPY AND OBSERVATION METHOD THEREOF

Patent #:	10453650	Issue Dt:	10/22/2019	Application #:	15773445	Filing Dt:	05/03/2018
Publication #:	US20180323035	Pub Dt:	11/08/2018
Title:	CHARGED PARTICLE BEAM APPARATUS, OBSERVATION METHOD USING CHARGED PARTICLE BEAM APPARATUS, AND PROGRAM

Patent #:	10752941	Issue Dt:	08/25/2020	Application #:	15775408	Filing Dt:	05/11/2018
Publication #:	US20180265918	Pub Dt:	09/20/2018
Title:	CELL ANALYSIS DEVICE, APPARATUS, AND CELL ANALYSIS METHOD USING SAME

Patent #:	10522325	Issue Dt:	12/31/2019	Application #:	15776404	Filing Dt:	05/15/2018
Publication #:	US20180301316	Pub Dt:	10/18/2018
Title:	CHARGED PARTICLE BEAM DEVICE AND IMAGE PROCESSING METHOD IN CHARGED PARTICLE BEAM DEVICE

Patent #:	10504695	Issue Dt:	12/10/2019	Application #:	15776678	Filing Dt:	05/16/2018
Publication #:	US20180330916	Pub Dt:	11/15/2018
Title:	CHARGED PARTICLE BEAM DEVICE AND PHASE PLATE

Patent #:	10996211	Issue Dt:	05/04/2021	Application #:	15777326	Filing Dt:	05/18/2018
Publication #:	US20180335417	Pub Dt:	11/22/2018
Title:	MEASURING REAGENT AND ANALYSIS DEVICE FOR ANALYZING BIOPOLYMER

Patent #:	10753922	Issue Dt:	08/25/2020	Application #:	15779931	Filing Dt:	05/30/2018
Publication #:	US20180372712	Pub Dt:	12/27/2018
Title:	BIOMOLECULE MEASUREMENT APPARATUS

Patent #:	10573489	Issue Dt:	02/25/2020	Application #:	15780678	Filing Dt:	06/01/2018
Publication #:	US20180374673	Pub Dt:	12/27/2018
Title:	CHARGED PARTICLE BEAM DEVICE AND OPTICAL-AXIS ADJUSTING METHOD THEREOF

Patent #:	10254235	Issue Dt:	04/09/2019	Application #:	15806937	Filing Dt:	11/08/2017
Publication #:	US20180067060	Pub Dt:	03/08/2018
Title:	DEFECT INSPECTING METHOD AND DEFECT INSPECTING APPARATUS

Patent #:	10788479	Issue Dt:	09/29/2020	Application #:	15812150	Filing Dt:	11/14/2017
Publication #:	US20180074043	Pub Dt:	03/15/2018
Title:	AUTOMATIC ANALYZER

Patent #:	10386380	Issue Dt:	08/20/2019	Application #:	15831562	Filing Dt:	12/05/2017
Publication #:	US20180095101	Pub Dt:	04/05/2018
Title:	SAMPLE HANDLING SYSTEM

Patent #:	10520522	Issue Dt:	12/31/2019	Application #:	15837181	Filing Dt:	12/11/2017
Publication #:	US20180100871	Pub Dt:	04/12/2018
Title:	AUTOMATED ANALYZER

Patent #:	10157724	Issue Dt:	12/18/2018	Application #:	15855370	Filing Dt:	12/27/2017
Publication #:	US20180122617	Pub Dt:	05/03/2018
Title:	ELECTRON SCANNING MICROSCOPE AND IMAGE GENERATION METHOD

Patent #:	10962558	Issue Dt:	03/30/2021	Application #:	15860832	Filing Dt:	01/03/2018
Publication #:	US20180128847	Pub Dt:	05/10/2018
Title:	AUTOMATIC ANALYZER

100

Patent #:	10340115	Issue Dt:	07/02/2019	Application #:	15869460	Filing Dt:	01/12/2018
Publication #:	US20180138010	Pub Dt:	05/17/2018
Title:	Charged Particle Beam Apparatus

Assignor

HITACHI HIGH-TECHNOLOGIES CORPORATION

Exec Dt:

02/12/2020

Assignee

HITACHI HIGH-TECH CORPORATION

17-1, TORANOMON 1-CHOME, MINATO-KU

TOKYO, JAPAN

Correspondence name and address
	MATTINGLY & MALUR PC
	1800 DIAGONAL ROAD
	SUITE 210
	ALEXANDRIA, VA 22314

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