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Reel/Frame:052259/0227   Pages: 68
Recorded: 03/30/2020
Attorney Dkt #:T&A-GENERAL/Z-1830(USMA)
Conveyance: CHANGE OF NAME AND ADDRESS
Total properties: 2251
Page 4 of 23
Pages: 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23
1
Patent #:
8362426
Issue Dt:
01/29/2013
Application #:
11520802
Filing Dt:
09/14/2006
Publication #:
US20070064100
Pub Dt:
03/22/2007
Title:
SCANNING ELECTRON MICROSCOPE AND IMAGE SIGNAL PROCESSING METHOD
2
Patent #:
7462838
Issue Dt:
12/09/2008
Application #:
11521465
Filing Dt:
09/15/2006
Publication #:
US20070063146
Pub Dt:
03/22/2007
Title:
ELECTROSTATIC DEFLECTION CONTROL CIRCUIT AND METHOD OF ELECTRONIC BEAM MEASURING APPARATUS
3
Patent #:
7670558
Issue Dt:
03/02/2010
Application #:
11522379
Filing Dt:
09/18/2006
Publication #:
US20070009387
Pub Dt:
01/11/2007
Title:
CHEMICAL ANALYSIS APPARATUS AND CHEMICAL ANALYSIS METHOD
4
Patent #:
7777404
Issue Dt:
08/17/2010
Application #:
11523001
Filing Dt:
09/19/2006
Publication #:
US20100193687
Pub Dt:
08/05/2010
Title:
FIELD EMISSION TYPE ELECTRON GUN COMPRISING SINGLE FIBROUS CARBON ELECTRON EMITTER AND OPERATING METHOD FOR THE SAME
5
Patent #:
7442928
Issue Dt:
10/28/2008
Application #:
11527522
Filing Dt:
09/27/2006
Publication #:
US20070069158
Pub Dt:
03/29/2007
Title:
CHARGED PARTICLE BEAM APPARATUS
6
Patent #:
8048681
Issue Dt:
11/01/2011
Application #:
11529418
Filing Dt:
09/29/2006
Publication #:
US20070106071
Pub Dt:
05/10/2007
Title:
METHODS FOR NUCLEIC ACID ISOLATION AND INSTRUMENTS FOR NUCLEIC ACID ISOLATION
7
Patent #:
7476857
Issue Dt:
01/13/2009
Application #:
11583886
Filing Dt:
10/20/2006
Publication #:
US20070114405
Pub Dt:
05/24/2007
Title:
TOOL-TO-TOOL MATCHING CONTROL METHOD AND ITS SYSTEM FOR SCANNING ELECTRON MICROSCOPE
8
Patent #:
7700916
Issue Dt:
04/20/2010
Application #:
11583983
Filing Dt:
10/20/2006
Publication #:
US20070124713
Pub Dt:
05/31/2007
Title:
LOGICAL CAD NAVIGATION FOR DEVICE CHARACTERISTICS EVALUATION SYSTEM
9
Patent #:
7991218
Issue Dt:
08/02/2011
Application #:
11588418
Filing Dt:
10/27/2006
Publication #:
US20070098248
Pub Dt:
05/03/2007
Title:
PATTERN MATCHING APPARATUS AND SEMICONDUCTOR INSPECTION SYSTEM USING THE SAME
10
Patent #:
7615765
Issue Dt:
11/10/2009
Application #:
11589821
Filing Dt:
10/31/2006
Publication #:
US20070102650
Pub Dt:
05/10/2007
Title:
CHARGED PARTICLE BEAM APPARATUS
11
Patent #:
7599076
Issue Dt:
10/06/2009
Application #:
11591563
Filing Dt:
11/02/2006
Publication #:
US20070109557
Pub Dt:
05/17/2007
Title:
METHOD FOR OPTICALLY DETECTING HEIGHT OF A SPECIMEN AND CHARGED PARTICLE BEAM APPARATUS USING THE SAME
12
Patent #:
7816062
Issue Dt:
10/19/2010
Application #:
11592175
Filing Dt:
11/03/2006
Publication #:
US20070105243
Pub Dt:
05/10/2007
Title:
METHOD AND APPARATUS FOR SEMICONDUCTOR DEVICE PRODUCTION PROCESS MONITORING AND METHOD AND APPARATUS FOR ESTIMATING CROSS SECTIONAL SHAPE OF A PATTERN
13
Patent #:
7633063
Issue Dt:
12/15/2009
Application #:
11599611
Filing Dt:
11/15/2006
Publication #:
US20070120065
Pub Dt:
05/31/2007
Title:
CHARGED PARTICLE BEAM APPARATUS
14
Patent #:
7521676
Issue Dt:
04/21/2009
Application #:
11601723
Filing Dt:
11/20/2006
Publication #:
US20070194229
Pub Dt:
08/23/2007
Title:
METHOD AND APPARATUS FOR INSPECTING PATTERN DEFECTS AND MIRROR ELECTRON PROJECTION TYPE OR MULTI-BEAM SCANNING TYPE ELECTRON BEAM APPARATUS
15
Patent #:
7521998
Issue Dt:
04/21/2009
Application #:
11602288
Filing Dt:
11/21/2006
Publication #:
US20070115056
Pub Dt:
05/24/2007
Title:
OPERATIONAL AMPLIFIER AND SCANNING ELECTRON MICROSCOPE USING THE SAME
16
Patent #:
7658830
Issue Dt:
02/09/2010
Application #:
11604253
Filing Dt:
11/27/2006
Publication #:
US20070062814
Pub Dt:
03/22/2007
Title:
CAPILLARY ARRAY AND ELECTROPHORESIS APPARATUS, AND METHODS
17
Patent #:
7656154
Issue Dt:
02/02/2010
Application #:
11604767
Filing Dt:
11/28/2006
Publication #:
US20070120563
Pub Dt:
05/31/2007
Title:
MAGNETIC FIELD MEASUREMENT SYSTEM AND OPTICAL PUMPING MAGNETOMETER
18
Patent #:
7381946
Issue Dt:
06/03/2008
Application #:
11605437
Filing Dt:
11/29/2006
Publication #:
US20070069124
Pub Dt:
03/29/2007
Title:
MASS SPECTROMETER
19
Patent #:
7511272
Issue Dt:
03/31/2009
Application #:
11607928
Filing Dt:
12/04/2006
Publication #:
US20070085020
Pub Dt:
04/19/2007
Title:
METHOD FOR CONTROLLING CHARGED PARTICLE BEAM, AND CHARGED PARTICLE BEAM APPARATUS
20
Patent #:
7544930
Issue Dt:
06/09/2009
Application #:
11624248
Filing Dt:
01/18/2007
Publication #:
US20070187588
Pub Dt:
08/16/2007
Title:
TANDEM TYPE MASS ANALYSIS SYSTEM AND METHOD
21
Patent #:
7375318
Issue Dt:
05/20/2008
Application #:
11627460
Filing Dt:
01/26/2007
Publication #:
US20080073513
Pub Dt:
03/27/2008
Title:
MASS SPECTROMETER
22
Patent #:
7764826
Issue Dt:
07/27/2010
Application #:
11634963
Filing Dt:
12/07/2006
Publication #:
US20070145270
Pub Dt:
06/28/2007
Title:
METHOD AND APPARATUS OF REVIEWING DEFECTS ON A SEMICONDUCTOR DEVICE
23
Patent #:
7807980
Issue Dt:
10/05/2010
Application #:
11647348
Filing Dt:
12/29/2006
Publication #:
US20070164219
Pub Dt:
07/19/2007
Title:
CHARGED PARTICLE BEAM APPARATUS AND METHODS FOR CAPTURING IMAGES USING THE SAME
24
Patent #:
7365325
Issue Dt:
04/29/2008
Application #:
11651031
Filing Dt:
01/09/2007
Publication #:
US20070114398
Pub Dt:
05/24/2007
Title:
METHOD AND APPARATUS FOR OBSERVING A SPECIMEN
25
Patent #:
7288764
Issue Dt:
10/30/2007
Application #:
11651498
Filing Dt:
01/10/2007
Publication #:
US20070114399
Pub Dt:
05/24/2007
Title:
PATTERN MEASURING METHOD
26
Patent #:
8012327
Issue Dt:
09/06/2011
Application #:
11653332
Filing Dt:
01/16/2007
Publication #:
US20070163882
Pub Dt:
07/19/2007
Title:
CAPILLARY ELECTROPHORESIS APPARATUS AND ELECTROPHORESIS METHOD
27
Patent #:
7521703
Issue Dt:
04/21/2009
Application #:
11653949
Filing Dt:
01/17/2007
Publication #:
US20070181787
Pub Dt:
08/09/2007
Title:
AUTOMATIC ANALYZER
28
Patent #:
8246803
Issue Dt:
08/21/2012
Application #:
11654683
Filing Dt:
01/18/2007
Publication #:
US20070170063
Pub Dt:
07/26/2007
Title:
CAPILLARY ELECTROPHORESIS APPARATUS AND ELECTROPHORESIS METHOD
29
Patent #:
7612337
Issue Dt:
11/03/2009
Application #:
11654685
Filing Dt:
01/18/2007
Publication #:
US20070187597
Pub Dt:
08/16/2007
Title:
FOCUSED ION BEAM SYSTEM AND A METHOD OF SAMPLE PREPARATION AND OBSERVATION
30
Patent #:
7638767
Issue Dt:
12/29/2009
Application #:
11655167
Filing Dt:
01/19/2007
Publication #:
US20070170358
Pub Dt:
07/26/2007
Title:
SCANNING ELECTRON MICROSCOPE
31
Patent #:
8103087
Issue Dt:
01/24/2012
Application #:
11655226
Filing Dt:
01/19/2007
Publication #:
US20070177787
Pub Dt:
08/02/2007
Title:
FAULT INSPECTION METHOD
32
Patent #:
7504626
Issue Dt:
03/17/2009
Application #:
11655264
Filing Dt:
01/19/2007
Publication #:
US20070187598
Pub Dt:
08/16/2007
Title:
SCANNING ELECTRON MICROSCOPE AND APPARATUS FOR DETECTING DEFECT
33
Patent #:
7459712
Issue Dt:
12/02/2008
Application #:
11657689
Filing Dt:
01/25/2007
Publication #:
US20070120078
Pub Dt:
05/31/2007
Title:
METHOD AND APPARATUS OF MEASURING PATTERN DIMENSION AND CONTROLLING SEMICONDUCTOR DEVICE PROCESS HAVING AN ERROR REVISING UNIT
34
Patent #:
7601954
Issue Dt:
10/13/2009
Application #:
11668510
Filing Dt:
01/30/2007
Publication #:
US20080073524
Pub Dt:
03/27/2008
Title:
METHOD AND APPARATUS FOR REVIEWING DEFECTS
35
Patent #:
7589321
Issue Dt:
09/15/2009
Application #:
11671562
Filing Dt:
02/06/2007
Publication #:
US20080073508
Pub Dt:
03/27/2008
Title:
REACTION CELL AND MASS SPECTROMETER
36
Patent #:
7732761
Issue Dt:
06/08/2010
Application #:
11673057
Filing Dt:
02/09/2007
Publication #:
US20070187595
Pub Dt:
08/16/2007
Title:
METHOD FOR MEASURING A PATTERN DIMENSION USING A SCANNING ELECTRON MICROSCOPE
37
Patent #:
8356260
Issue Dt:
01/15/2013
Application #:
11673065
Filing Dt:
02/09/2007
Publication #:
US20070198955
Pub Dt:
08/23/2007
Title:
METHOD AND APPARATUS FOR MONITORING CROSS-SECTIONAL SHAPE OF A PATTERN FORMED ON A SEMICONDUCTOR DEVICE
38
Patent #:
8158938
Issue Dt:
04/17/2012
Application #:
11673219
Filing Dt:
02/09/2007
Publication #:
US20070210252
Pub Dt:
09/13/2007
Title:
SCANNING ELECTRON MICROSCOPE AND A METHOD FOR IMAGING A SPECIMEN USING THE SAME
39
Patent #:
7700931
Issue Dt:
04/20/2010
Application #:
11674262
Filing Dt:
02/13/2007
Publication #:
US20080073582
Pub Dt:
03/27/2008
Title:
ION BEAM PROCESSING APPARATUS
40
Patent #:
7890074
Issue Dt:
02/15/2011
Application #:
11675173
Filing Dt:
02/15/2007
Publication #:
US20080073504
Pub Dt:
03/27/2008
Title:
DATA ACQUISITION SYSTEM
41
Patent #:
7955514
Issue Dt:
06/07/2011
Application #:
11679926
Filing Dt:
02/28/2007
Publication #:
US20080169065
Pub Dt:
07/17/2008
Title:
PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD
42
Patent #:
7887669
Issue Dt:
02/15/2011
Application #:
11683040
Filing Dt:
03/07/2007
Publication #:
US20080110400
Pub Dt:
05/15/2008
Title:
VACUUM PROCESSING APPARATUS
43
Patent #:
7652248
Issue Dt:
01/26/2010
Application #:
11692263
Filing Dt:
03/28/2007
Publication #:
US20070228276
Pub Dt:
10/04/2007
Title:
INSPECTION APPARATUS AND INSPECTION METHOD
44
Patent #:
7892444
Issue Dt:
02/22/2011
Application #:
11696263
Filing Dt:
04/04/2007
Publication #:
US20070210032
Pub Dt:
09/13/2007
Title:
PLASMA PROCESSING APPARATUS AND METHOD FOR CONTROLLING THE SAME
45
Patent #:
7566871
Issue Dt:
07/28/2009
Application #:
11698025
Filing Dt:
01/26/2007
Publication #:
US20070272857
Pub Dt:
11/29/2007
Title:
METHOD AND APPARATUS FOR PATTERN INSPECTION
46
Patent #:
7619218
Issue Dt:
11/17/2009
Application #:
11698819
Filing Dt:
01/29/2007
Publication #:
US20070181806
Pub Dt:
08/09/2007
Title:
CHARGED PARTICLE OPTICAL APPARATUS WITH ABERRATION CORRECTOR
47
Patent #:
8577119
Issue Dt:
11/05/2013
Application #:
11698987
Filing Dt:
01/29/2007
Publication #:
US20070269100
Pub Dt:
11/22/2007
Title:
WAFER SURFACE OBSERVING METHOD AND APPARATUS
48
Patent #:
7925095
Issue Dt:
04/12/2011
Application #:
11698988
Filing Dt:
01/29/2007
Publication #:
US20080037830
Pub Dt:
02/14/2008
Title:
PATTERN MATCHING METHOD AND COMPUTER PROGRAM FOR EXECUTING PATTERN MATCHING
49
Patent #:
7652249
Issue Dt:
01/26/2010
Application #:
11699065
Filing Dt:
01/29/2007
Publication #:
US20080073526
Pub Dt:
03/27/2008
Title:
CHARGED PARTICLE BEAM APPARATUS
50
Patent #:
7755776
Issue Dt:
07/13/2010
Application #:
11703154
Filing Dt:
02/07/2007
Publication #:
US20080073533
Pub Dt:
03/27/2008
Title:
INSPECTION SYSTEM AND INSPECTION METHOD
51
Patent #:
7655907
Issue Dt:
02/02/2010
Application #:
11704227
Filing Dt:
02/09/2007
Publication #:
US20070272858
Pub Dt:
11/29/2007
Title:
CHARGED PARTICLE BEAM APPARATUS AND PATTERN MEASURING METHOD
52
Patent #:
7991217
Issue Dt:
08/02/2011
Application #:
11704350
Filing Dt:
02/09/2007
Publication #:
US20070201739
Pub Dt:
08/30/2007
Title:
DEFECT CLASSIFIER USING CLASSIFICATION RECIPE BASED ON CONNECTION BETWEEN RULE-BASED AND EXAMPLE-BASED CLASSIFIERS
53
Patent #:
8524153
Issue Dt:
09/03/2013
Application #:
11710424
Filing Dt:
02/26/2007
Publication #:
US20070217949
Pub Dt:
09/20/2007
Title:
QUALITY CONTROL SYSTEM
54
Patent #:
7817105
Issue Dt:
10/19/2010
Application #:
11713687
Filing Dt:
03/05/2007
Publication #:
US20070159662
Pub Dt:
07/12/2007
Title:
IMAGE FORMING METHOD AND CHARGED PARTICLE BEAM APPARATUS
55
Patent #:
8026491
Issue Dt:
09/27/2011
Application #:
11715506
Filing Dt:
03/08/2007
Publication #:
US20070284542
Pub Dt:
12/13/2007
Title:
CHARGED PARTICLE BEAM APPARATUS AND METHOD FOR CHARGED PARTICLE BEAM ADJUSTMENT
56
Patent #:
7557346
Issue Dt:
07/07/2009
Application #:
11717093
Filing Dt:
03/13/2007
Publication #:
US20080073534
Pub Dt:
03/27/2008
Title:
SCANNING ELECTRON MICROSCOPE
57
Patent #:
8019161
Issue Dt:
09/13/2011
Application #:
11717772
Filing Dt:
03/14/2007
Publication #:
US20070221842
Pub Dt:
09/27/2007
Title:
METHOD, DEVICE AND COMPUTER PROGRAM OF LENGTH MEASUREMENT
58
Patent #:
7973282
Issue Dt:
07/05/2011
Application #:
11723457
Filing Dt:
03/20/2007
Publication #:
US20080100832
Pub Dt:
05/01/2008
Title:
CHARGED PARTICLE BEAM APPARATUS AND DIMENSION MEASURING METHOD
59
Patent #:
7889909
Issue Dt:
02/15/2011
Application #:
11723577
Filing Dt:
03/21/2007
Publication #:
US20070223803
Pub Dt:
09/27/2007
Title:
PATTERN MATCHING METHOD AND PATTERN MATCHING PROGRAM
60
Patent #:
7851754
Issue Dt:
12/14/2010
Application #:
11723579
Filing Dt:
03/21/2007
Publication #:
US20070221845
Pub Dt:
09/27/2007
Title:
CHARGED PARTICLE BEAM SYSTEM
61
Patent #:
7642796
Issue Dt:
01/05/2010
Application #:
11723808
Filing Dt:
03/22/2007
Publication #:
US20070170951
Pub Dt:
07/26/2007
Title:
CONTROL SYSTEM AND METHOD OF SEMICONDUCTOR INSPECTION SYSTEM
62
Patent #:
7462817
Issue Dt:
12/09/2008
Application #:
11723995
Filing Dt:
03/23/2007
Publication #:
US20070164212
Pub Dt:
07/19/2007
Title:
MASS SPECTROMETER AND METHOD OF ANALYZING ISOMERS
63
Patent #:
7662232
Issue Dt:
02/16/2010
Application #:
11730962
Filing Dt:
04/05/2007
Publication #:
US20070186972
Pub Dt:
08/16/2007
Title:
PLASMA PROCESSING APPARATUS
64
Patent #:
7834997
Issue Dt:
11/16/2010
Application #:
11744906
Filing Dt:
05/07/2007
Publication #:
US20080067447
Pub Dt:
03/20/2008
Title:
STANDARD COMPONENT FOR CALIBRATION AND CALIBRATION METHOD USING IT AND ELECTRO BEAM SYSTEM
65
Patent #:
8757864
Issue Dt:
06/24/2014
Application #:
11745669
Filing Dt:
05/08/2007
Publication #:
US20070264156
Pub Dt:
11/15/2007
Title:
CHEMICAL ANALYZER
66
Patent #:
7752001
Issue Dt:
07/06/2010
Application #:
11753966
Filing Dt:
05/25/2007
Publication #:
US20070276620
Pub Dt:
11/29/2007
Title:
METHOD OF CORRECTING COORDINATES, AND DEFECT REVIEW APPARATUS
67
Patent #:
7692166
Issue Dt:
04/06/2010
Application #:
11762182
Filing Dt:
06/13/2007
Publication #:
US20080067403
Pub Dt:
03/20/2008
Title:
CHARGED PARTICLE BEAM EXPOSURE APPARATUS
68
Patent #:
7680563
Issue Dt:
03/16/2010
Application #:
11767547
Filing Dt:
06/25/2007
Publication #:
US20080183340
Pub Dt:
07/31/2008
Title:
PRESSURE CONTROL DEVICE FOR LOW PRESSURE PROCESSING CHAMBER
69
Patent #:
7586594
Issue Dt:
09/08/2009
Application #:
11770217
Filing Dt:
06/28/2007
Publication #:
US20070247616
Pub Dt:
10/25/2007
Title:
METHOD FOR INSPECTING DEFECT AND APPARATUS FOR INSPECTING DEFECT
70
Patent #:
7476872
Issue Dt:
01/13/2009
Application #:
11775894
Filing Dt:
07/11/2007
Publication #:
US20070252091
Pub Dt:
11/01/2007
Title:
METHOD AND APPARATUS FOR OBSERVING INSIDE STRUCTURES, AND SPECIMEN HOLDER
71
Patent #:
7664608
Issue Dt:
02/16/2010
Application #:
11776572
Filing Dt:
07/12/2007
Publication #:
US20080015802
Pub Dt:
01/17/2008
Title:
DEFECT INSPECTION METHOD AND APPARATUS
72
Patent #:
7833429
Issue Dt:
11/16/2010
Application #:
11778780
Filing Dt:
07/17/2007
Publication #:
US20080011716
Pub Dt:
01/17/2008
Title:
PLASMA PROCESSING METHOD
73
Patent #:
7795597
Issue Dt:
09/14/2010
Application #:
11779498
Filing Dt:
07/18/2007
Publication #:
US20080017807
Pub Dt:
01/24/2008
Title:
DEFLECTOR ARRAY, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD
74
Patent #:
7592606
Issue Dt:
09/22/2009
Application #:
11779686
Filing Dt:
07/18/2007
Publication #:
US20080018460
Pub Dt:
01/24/2008
Title:
MANUFACTURING EQUIPMENT USING ION BEAM OR ELECTRON BEAM
75
Patent #:
7601974
Issue Dt:
10/13/2009
Application #:
11785433
Filing Dt:
04/17/2007
Publication #:
US20070187601
Pub Dt:
08/16/2007
Title:
CHARGED PARTICLE BEAM APPARATUS
76
Patent #:
7460714
Issue Dt:
12/02/2008
Application #:
11785790
Filing Dt:
04/20/2007
Publication #:
US20070286494
Pub Dt:
12/13/2007
Title:
METHOD AND APPARATUS FOR MEASURING DIMENSION USING ELECTRON MICROSCOPE
77
Patent #:
9183450
Issue Dt:
11/10/2015
Application #:
11790883
Filing Dt:
04/27/2007
Publication #:
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Assignor
1
HITACHI HIGH-TECHNOLOGIES CORPORATION
Exec Dt:
02/12/2020
Assignee
1
HITACHI HIGH-TECH CORPORATION
17-1, TORANOMON 1-CHOME, MINATO-KU
TOKYO, JAPAN
Correspondence name and address
MATTINGLY & MALUR PC
1800 DIAGONAL ROAD
SUITE 210
ALEXANDRIA, VA 22314

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