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Reel/Frame:052259/0227   Pages: 68
Recorded: 03/30/2020
Attorney Dkt #:T&A-GENERAL/Z-1830(USMA)
Conveyance: CHANGE OF NAME AND ADDRESS
Total properties: 2251
Page 6 of 23
Pages: 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23
1
Patent #:
7978325
Issue Dt:
07/12/2011
Application #:
12121120
Filing Dt:
05/15/2008
Publication #:
US20080285025
Pub Dt:
11/20/2008
Title:
BIOCHEMICAL ANALYZER
2
Patent #:
7872230
Issue Dt:
01/18/2011
Application #:
12121466
Filing Dt:
05/15/2008
Publication #:
US20080283746
Pub Dt:
11/20/2008
Title:
MICRO-SAMPLE PROCESSING METHOD, OBSERVATION METHOD AND APPARATUS
3
Patent #:
7714286
Issue Dt:
05/11/2010
Application #:
12121924
Filing Dt:
05/16/2008
Publication #:
US20090008550
Pub Dt:
01/08/2009
Title:
CHARGED PARTICLE BEAM APPARATUS, ABERRATION CORRECTION VALUE CALCULATION UNIT THEREFOR, AND ABERRATION CORRECTION PROGRAM THEREFOR
4
Patent #:
7792352
Issue Dt:
09/07/2010
Application #:
12123160
Filing Dt:
05/19/2008
Publication #:
US20080232674
Pub Dt:
09/25/2008
Title:
METHOD AND APPARATUS FOR INSPECTING PATTERN DEFECTS
5
Patent #:
7700927
Issue Dt:
04/20/2010
Application #:
12123168
Filing Dt:
05/19/2008
Publication #:
US20080290290
Pub Dt:
11/27/2008
Title:
HEATING STAGE FOR A MICRO-SAMPLE
6
Patent #:
8335397
Issue Dt:
12/18/2012
Application #:
12124666
Filing Dt:
05/21/2008
Publication #:
US20080292199
Pub Dt:
11/27/2008
Title:
CHARGED PARTICLE BEAM APPARATUS
7
Patent #:
7619751
Issue Dt:
11/17/2009
Application #:
12125444
Filing Dt:
05/22/2008
Publication #:
US20080226177
Pub Dt:
09/18/2008
Title:
HIGH-ACCURACY PATTERN SHAPE EVALUATING METHOD AND APPARATUS
8
Patent #:
8216511
Issue Dt:
07/10/2012
Application #:
12128728
Filing Dt:
05/29/2008
Publication #:
US20080299007
Pub Dt:
12/04/2008
Title:
SPECIMEN RACK AND SPECIMEN CARRIER SYSTEM
9
Patent #:
8366896
Issue Dt:
02/05/2013
Application #:
12130330
Filing Dt:
05/30/2008
Publication #:
US20080296160
Pub Dt:
12/04/2008
Title:
CAPILLARY ELECTROPHORESIS DEVICE
10
Patent #:
7847928
Issue Dt:
12/07/2010
Application #:
12130488
Filing Dt:
05/30/2008
Publication #:
US20080297779
Pub Dt:
12/04/2008
Title:
INSPECTION DEVICE AND INSPECTION METHOD
11
Patent #:
7838631
Issue Dt:
11/23/2010
Application #:
12131438
Filing Dt:
06/02/2008
Publication #:
US20080312414
Pub Dt:
12/18/2008
Title:
APPARATUS FOR MEASURING HIGH DENSITY LIPOPROTEINS AND METHOD OF SEPARATING HIGH DENSITY LIPOPROTEINS
12
Patent #:
8214166
Issue Dt:
07/03/2012
Application #:
12137779
Filing Dt:
06/12/2008
Publication #:
US20080319696
Pub Dt:
12/25/2008
Title:
METHOD AND ITS SYSTEM FOR CALIBRATING MEASURED DATA BETWEEN DIFFERENT MEASURING TOOLS
13
Patent #:
7888640
Issue Dt:
02/15/2011
Application #:
12139970
Filing Dt:
06/16/2008
Publication #:
US20080310704
Pub Dt:
12/18/2008
Title:
SCANNING ELECTRON MICROSCOPE AND METHOD OF IMAGING AN OBJECT BY USING THE SCANNING ELECTRON MICROSCOPE
14
Patent #:
8045146
Issue Dt:
10/25/2011
Application #:
12141955
Filing Dt:
06/19/2008
Publication #:
US20090002695
Pub Dt:
01/01/2009
Title:
METHOD AND APPARATUS FOR REVIEWING DEFECT
15
Patent #:
8026482
Issue Dt:
09/27/2011
Application #:
12142284
Filing Dt:
06/19/2008
Publication #:
US20090140143
Pub Dt:
06/04/2009
Title:
CHARGED PARTICLE BEAM APPARATUS AND CONTROL METHOD THEREFOR
16
Patent #:
8221702
Issue Dt:
07/17/2012
Application #:
12143339
Filing Dt:
06/20/2008
Publication #:
US20080317639
Pub Dt:
12/25/2008
Title:
SAMPLE DISPENSING APPARATUS AND METHOD
17
Patent #:
7645986
Issue Dt:
01/12/2010
Application #:
12149053
Filing Dt:
04/25/2008
Publication #:
US20080203292
Pub Dt:
08/28/2008
Title:
MASS SPECTROMETER
18
Patent #:
7714288
Issue Dt:
05/11/2010
Application #:
12149218
Filing Dt:
04/29/2008
Publication #:
US20080277583
Pub Dt:
11/13/2008
Title:
CHARGED PARTICLE BEAM APPARATUS
19
Patent #:
7932493
Issue Dt:
04/26/2011
Application #:
12153333
Filing Dt:
05/16/2008
Publication #:
US20090084953
Pub Dt:
04/02/2009
Title:
METHOD AND SYSTEM FOR OBSERVING A SPECIMEN USING A SCANNING ELECTRON MICROSCOPE
20
Patent #:
8177951
Issue Dt:
05/15/2012
Application #:
12153395
Filing Dt:
05/19/2008
Publication #:
US20080296161
Pub Dt:
12/04/2008
Title:
ELECTROPHORESIS APPARATUS AND PUMP MECHANISM USED IN THE SAME
21
Patent #:
7956324
Issue Dt:
06/07/2011
Application #:
12155038
Filing Dt:
05/29/2008
Publication #:
US20080302962
Pub Dt:
12/11/2008
Title:
CHARGED PARTICLE BEAM APPARATUS FOR FORMING A SPECIMEN IMAGE
22
Patent #:
7714289
Issue Dt:
05/11/2010
Application #:
12155347
Filing Dt:
06/03/2008
Publication #:
US20080272300
Pub Dt:
11/06/2008
Title:
CHARGED PARTICLE BEAM APPARATUS
23
Patent #:
7838840
Issue Dt:
11/23/2010
Application #:
12163121
Filing Dt:
06/27/2008
Publication #:
US20090001279
Pub Dt:
01/01/2009
Title:
CHARGED PARTICLE BEAM APPARATUS
24
Patent #:
8022365
Issue Dt:
09/20/2011
Application #:
12168940
Filing Dt:
07/08/2008
Publication #:
US20090014651
Pub Dt:
01/15/2009
Title:
CHARGED PARTICLE BEAM EQUIPMENTS, AND CHARGED PARTICLE BEAM MICROSCOPE
25
Patent #:
7952072
Issue Dt:
05/31/2011
Application #:
12173038
Filing Dt:
07/15/2008
Publication #:
US20090072138
Pub Dt:
03/19/2009
Title:
TEST APPARATUS
26
Patent #:
8044349
Issue Dt:
10/25/2011
Application #:
12173328
Filing Dt:
07/15/2008
Publication #:
US20090020695
Pub Dt:
01/22/2009
Title:
MASS SPECTROMETER
27
Patent #:
8865459
Issue Dt:
10/21/2014
Application #:
12173472
Filing Dt:
07/15/2008
Publication #:
US20090023202
Pub Dt:
01/22/2009
Title:
NUCLEIC ACID ANALYSIS DEVICE AND NUCLEIC ACID ANALYZER USING THE SAME
28
Patent #:
8062592
Issue Dt:
11/22/2011
Application #:
12175998
Filing Dt:
07/18/2008
Publication #:
US20090020429
Pub Dt:
01/22/2009
Title:
ELECTROPHORESIS APPARATUS USING CAPILLARY ARRAY AND A SAMPLE TRAY
29
Patent #:
8309026
Issue Dt:
11/13/2012
Application #:
12180798
Filing Dt:
07/28/2008
Publication #:
US20090035185
Pub Dt:
02/05/2009
Title:
SPECIMEN PREPROCESSING SYSTEM
30
Patent #:
8189040
Issue Dt:
05/29/2012
Application #:
12181764
Filing Dt:
07/29/2008
Publication #:
US20090062934
Pub Dt:
03/05/2009
Title:
RECIPE GENERATION SYSTEM AND METHOD
31
Patent #:
9063106
Issue Dt:
06/23/2015
Application #:
12181868
Filing Dt:
07/29/2008
Publication #:
US20090035867
Pub Dt:
02/05/2009
Title:
AUTOMATIC ANALYZER AND METHOD FOR USING THE SAME
32
Patent #:
7851756
Issue Dt:
12/14/2010
Application #:
12182709
Filing Dt:
07/30/2008
Publication #:
US20090032723
Pub Dt:
02/05/2009
Title:
CHARGED PARTICLE BEAM IRRADIATION SYSTEM
33
Patent #:
7800060
Issue Dt:
09/21/2010
Application #:
12182810
Filing Dt:
07/30/2008
Publication #:
US20090032707
Pub Dt:
02/05/2009
Title:
PATTERN MEASUREMENT METHOD AND PATTERN MEASUREMENT SYSTEM
34
Patent #:
7872240
Issue Dt:
01/18/2011
Application #:
12183622
Filing Dt:
07/31/2008
Publication #:
US20090032722
Pub Dt:
02/05/2009
Title:
CORRECTOR FOR CHARGED-PARTICLE BEAM ABERRATION AND CHARGED-PARTICLE BEAM APPARATUS
35
Patent #:
8310667
Issue Dt:
11/13/2012
Application #:
12187041
Filing Dt:
08/06/2008
Publication #:
US20080297781
Pub Dt:
12/04/2008
Title:
WAFER SURFACE INSPECTION APPARATUS AND WAFER SURFACE INSPECTION METHOD
36
Patent #:
7834326
Issue Dt:
11/16/2010
Application #:
12187635
Filing Dt:
08/07/2008
Publication #:
US20090039281
Pub Dt:
02/12/2009
Title:
ABERRATION CORRECTOR AND CHARGED PARTICLE BEAM APPARATUS USING THE SAME
37
Patent #:
7786437
Issue Dt:
08/31/2010
Application #:
12188096
Filing Dt:
08/07/2008
Publication #:
US20090039261
Pub Dt:
02/12/2009
Title:
PATTERN INSPECTION METHOD AND PATTERN INSPECTION SYSTEM
38
Patent #:
7732792
Issue Dt:
06/08/2010
Application #:
12188791
Filing Dt:
08/08/2008
Publication #:
US20090039263
Pub Dt:
02/12/2009
Title:
PATTERN MEASUREMENT APPARATUS
39
Patent #:
7989768
Issue Dt:
08/02/2011
Application #:
12188870
Filing Dt:
08/08/2008
Publication #:
US20090039264
Pub Dt:
02/12/2009
Title:
SCANNING ELECTRON MICROSCOPE
40
Patent #:
8369602
Issue Dt:
02/05/2013
Application #:
12190818
Filing Dt:
08/13/2008
Publication #:
US20090046896
Pub Dt:
02/19/2009
Title:
LENGTH MEASUREMENT SYSTEM
41
Patent #:
7906759
Issue Dt:
03/15/2011
Application #:
12190988
Filing Dt:
08/13/2008
Publication #:
US20090072132
Pub Dt:
03/19/2009
Title:
MASS SPECTROSCOPY SYSTEM AND MASS SPECTROSCOPY METHOD
42
Patent #:
9150964
Issue Dt:
10/06/2015
Application #:
12191373
Filing Dt:
08/14/2008
Publication #:
US20090301392
Pub Dt:
12/10/2009
Title:
VACUUM PROCESSING APPARATUS
43
Patent #:
7850844
Issue Dt:
12/14/2010
Application #:
12191836
Filing Dt:
08/14/2008
Publication #:
US20090057227
Pub Dt:
03/05/2009
Title:
LIQUID DELIVERY DEVICE, LIQUID CHROMATOGRAPH, AND METHOD FOR OPERATION OF LIQUID DELIVERY DEVICE
44
Patent #:
8355562
Issue Dt:
01/15/2013
Application #:
12192317
Filing Dt:
08/15/2008
Publication #:
US20090052765
Pub Dt:
02/26/2009
Title:
PATTERN SHAPE EVALUATION METHOD
45
Patent #:
7768634
Issue Dt:
08/03/2010
Application #:
12192578
Filing Dt:
08/15/2008
Publication #:
US20090033924
Pub Dt:
02/05/2009
Title:
DEFECTS INSPECTING APPARATUS AND DEFECTS INSPECTING METHOD
46
Patent #:
8329054
Issue Dt:
12/11/2012
Application #:
12193274
Filing Dt:
08/18/2008
Publication #:
US20090321391
Pub Dt:
12/31/2009
Title:
PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD
47
Patent #:
8139868
Issue Dt:
03/20/2012
Application #:
12194763
Filing Dt:
08/20/2008
Publication #:
US20090087103
Pub Dt:
04/02/2009
Title:
IMAGE PROCESSING METHOD FOR DETERMINING MATCHING POSITION BETWEEN TEMPLATE AND SEARCH IMAGE
48
Patent #:
7913646
Issue Dt:
03/29/2011
Application #:
12199820
Filing Dt:
08/28/2008
Publication #:
US20090288684
Pub Dt:
11/26/2009
Title:
VACUUM PROCESSING APPARATUS AND VACUUM PROCESSING METHOD
49
Patent #:
7828928
Issue Dt:
11/09/2010
Application #:
12199876
Filing Dt:
08/28/2008
Publication #:
US20080317581
Pub Dt:
12/25/2008
Title:
VACUUM PROCESSING APPARATUS
50
Patent #:
8153060
Issue Dt:
04/10/2012
Application #:
12200261
Filing Dt:
08/28/2008
Publication #:
US20090060792
Pub Dt:
03/05/2009
Title:
AUTOMATIC ANALYZER
51
Patent #:
8128891
Issue Dt:
03/06/2012
Application #:
12200387
Filing Dt:
08/28/2008
Publication #:
US20090060784
Pub Dt:
03/05/2009
Title:
AUTOMATED ANALYZER
52
Patent #:
8182745
Issue Dt:
05/22/2012
Application #:
12200443
Filing Dt:
08/28/2008
Publication #:
US20090068063
Pub Dt:
03/12/2009
Title:
AUTOMATIC ANALYZER
53
Patent #:
8075840
Issue Dt:
12/13/2011
Application #:
12200459
Filing Dt:
08/28/2008
Publication #:
US20090060785
Pub Dt:
03/05/2009
Title:
AUTOMATIC MULTI-PURPOSE ANALYZER
54
Patent #:
8100620
Issue Dt:
01/24/2012
Application #:
12203168
Filing Dt:
09/03/2008
Publication #:
US20090324367
Pub Dt:
12/31/2009
Title:
VACUUM PROCESSING APPARATUS
55
Patent #:
7734082
Issue Dt:
06/08/2010
Application #:
12205771
Filing Dt:
09/05/2008
Publication #:
US20090010527
Pub Dt:
01/08/2009
Title:
DEFECT INSPECTION METHOD
56
Patent #:
8758685
Issue Dt:
06/24/2014
Application #:
12207022
Filing Dt:
09/09/2008
Publication #:
US20090068748
Pub Dt:
03/12/2009
Title:
AUTOMATIC ANALYZER AND OPERATING METHOD FOR SAME
57
Patent #:
8330103
Issue Dt:
12/11/2012
Application #:
12213905
Filing Dt:
06/26/2008
Publication #:
US20090001267
Pub Dt:
01/01/2009
Title:
CHARGED PARTICLE BEAM APPARATUS AND SPECIMEN INSPECTION METHOD
58
Patent #:
8399832
Issue Dt:
03/19/2013
Application #:
12216136
Filing Dt:
06/30/2008
Publication #:
US20080272297
Pub Dt:
11/06/2008
Title:
SCANNING ELECTRON MICROSCOPE AND CD MEASUREMENT CALIBRATION STANDARD SPECIMEN
59
Patent #:
7928384
Issue Dt:
04/19/2011
Application #:
12222577
Filing Dt:
08/12/2008
Publication #:
US20090057557
Pub Dt:
03/05/2009
Title:
LOCALIZED STATIC CHARGE DISTRIBUTION PRECISION MEASUREMENT METHOD AND DEVICE
60
Patent #:
8394247
Issue Dt:
03/12/2013
Application #:
12222900
Filing Dt:
08/19/2008
Publication #:
US20090071826
Pub Dt:
03/19/2009
Title:
ANION CONCENTRATION MEASURING DEVICE AND ANION CONCENTRATION MEASURING ELEMENT
61
Patent #:
7880144
Issue Dt:
02/01/2011
Application #:
12223012
Filing Dt:
11/14/2008
Publication #:
US20090173882
Pub Dt:
07/09/2009
Title:
LIQUID MEDIUM FOR PREVENTING CHARGE-UP IN ELECTRON MICROSCOPE AND METHOD OF OBSERVING SAMPLE USING THE SAME
62
Patent #:
7833382
Issue Dt:
11/16/2010
Application #:
12230459
Filing Dt:
08/29/2008
Publication #:
US20090000739
Pub Dt:
01/01/2009
Title:
VACUUM PROCESSING APPARATUS
63
Patent #:
8033770
Issue Dt:
10/11/2011
Application #:
12230466
Filing Dt:
08/29/2008
Publication #:
US20090010738
Pub Dt:
01/08/2009
Title:
VACUUM PROCESSING APPARATUS
64
Patent #:
7862289
Issue Dt:
01/04/2011
Application #:
12230467
Filing Dt:
08/29/2008
Publication #:
US20090003978
Pub Dt:
01/01/2009
Title:
VACUUM PROCESSING APPARATUS AND VACUUM PROCESSING METHOD
65
Patent #:
8228505
Issue Dt:
07/24/2012
Application #:
12233184
Filing Dt:
09/18/2008
Publication #:
US20090079988
Pub Dt:
03/26/2009
Title:
APPARATUS AND METHOD FOR DETECTING TARGET SUBSTANCE, OR DEVICE USED FOR THESE APPARATUS AND METHOD
66
Patent #:
8304722
Issue Dt:
11/06/2012
Application #:
12234096
Filing Dt:
09/19/2008
Publication #:
US20090084955
Pub Dt:
04/02/2009
Title:
CHARGED PARTICLE BEAM EQUIPMENT AND CHARGED PARTICLE MICROSCOPY
67
Patent #:
8180589
Issue Dt:
05/15/2012
Application #:
12235745
Filing Dt:
09/23/2008
Publication #:
US20090099805
Pub Dt:
04/16/2009
Title:
SYSTEM FOR MANAGING RECIPES FOR OPERATING A MEASUREMENT DEVICE
68
Patent #:
7960696
Issue Dt:
06/14/2011
Application #:
12238171
Filing Dt:
09/25/2008
Publication #:
US20090084954
Pub Dt:
04/02/2009
Title:
METHOD FOR INSPECTING AND MEASURING SAMPLE AND SCANNING ELECTRON MICROSCOPE
69
Patent #:
8075733
Issue Dt:
12/13/2011
Application #:
12240293
Filing Dt:
09/29/2008
Publication #:
US20100043976
Pub Dt:
02/25/2010
Title:
PLASMA PROCESSING APPARATUS
70
Patent #:
7902505
Issue Dt:
03/08/2011
Application #:
12245044
Filing Dt:
10/03/2008
Publication #:
US20090039260
Pub Dt:
02/12/2009
Title:
CHARGED PARTICLE BEAM APPARATUS
71
Patent #:
7807966
Issue Dt:
10/05/2010
Application #:
12250763
Filing Dt:
10/14/2008
Publication #:
US20090050805
Pub Dt:
02/26/2009
Title:
SCANNING ELECTRON MICROSCOPE
72
Patent #:
8124934
Issue Dt:
02/28/2012
Application #:
12264605
Filing Dt:
11/04/2008
Publication #:
US20090242765
Pub Dt:
10/01/2009
Title:
SCANNING ELECTRON MICROSCOPE
73
Patent #:
7990529
Issue Dt:
08/02/2011
Application #:
12266663
Filing Dt:
11/07/2008
Publication #:
US20090122305
Pub Dt:
05/14/2009
Title:
DETECTION CIRCUIT AND FOREIGN MATTER INSPECTION APPARATUS FOR SEMICONDUCTOR WAFER
74
Patent #:
8101935
Issue Dt:
01/24/2012
Application #:
12272211
Filing Dt:
11/17/2008
Publication #:
US20090140180
Pub Dt:
06/04/2009
Title:
INSPECTION APPARATUS AND INSPECTION METHOD
75
Patent #:
7724360
Issue Dt:
05/25/2010
Application #:
12273174
Filing Dt:
11/18/2008
Publication #:
US20090079973
Pub Dt:
03/26/2009
Title:
METHOD AND APPARATUS FOR INSPECTING FOREIGN PARTICLE DEFECTS
76
Patent #:
7746461
Issue Dt:
06/29/2010
Application #:
12275746
Filing Dt:
11/21/2008
Publication #:
US20090147246
Pub Dt:
06/11/2009
Title:
OPTICAL DEFECT INSPECTION APPARATUS
77
Patent #:
7923703
Issue Dt:
04/12/2011
Application #:
12279564
Filing Dt:
11/18/2008
Publication #:
US20090218491
Pub Dt:
09/03/2009
Title:
SAMPLE DIMENSION INSPECTING/MEASURING METHOD AND SAMPLE DIMENSION INSPECTING/MEASURING APPARATUS
78
Patent #:
8006340
Issue Dt:
08/30/2011
Application #:
12285177
Filing Dt:
09/30/2008
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Assignor
1
HITACHI HIGH-TECHNOLOGIES CORPORATION
Exec Dt:
02/12/2020
Assignee
1
HITACHI HIGH-TECH CORPORATION
17-1, TORANOMON 1-CHOME, MINATO-KU
TOKYO, JAPAN
Correspondence name and address
MATTINGLY & MALUR PC
1800 DIAGONAL ROAD
SUITE 210
ALEXANDRIA, VA 22314

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