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Reel/Frame:	052259/0227			Pages:	68
		Recorded:	03/30/2020
Attorney Dkt #:	T&A-GENERAL/Z-1830(USMA)
Conveyance:	CHANGE OF NAME AND ADDRESS

Total properties: 2251
Page 8 of 23
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Patent #:	7986405	Issue Dt:	07/26/2011	Application #:	12758363	Filing Dt:	04/12/2010
Publication #:	US20100195095	Pub Dt:	08/05/2010
Title:	FOREIGN MATTER INSPECTION METHOD AND FOREIGN MATTER INSPECTION APPARATUS

Patent #:	8445871	Issue Dt:	05/21/2013	Application #:	12763710	Filing Dt:	04/20/2010
Publication #:	US20100202654	Pub Dt:	08/12/2010
Title:	PATTERN MEASUREMENT APPARATUS

Patent #:	8067752	Issue Dt:	11/29/2011	Application #:	12764992	Filing Dt:	04/22/2010
Publication #:	US20100200749	Pub Dt:	08/12/2010
Title:	SEMICONDUCTOR TESTING METHOD AND SEMICONDUCTOR TESTER

Patent #:	8188428	Issue Dt:	05/29/2012	Application #:	12770244	Filing Dt:	04/29/2010
Publication #:	US20100213371	Pub Dt:	08/26/2010
Title:	SCANNING ELECTRON MICROSCOPE

Patent #:	7999932	Issue Dt:	08/16/2011	Application #:	12771842	Filing Dt:	04/30/2010
Publication #:	US20100208251	Pub Dt:	08/19/2010
Title:	INSPECTION APPARATUS AND INSPECTION METHOD

Patent #:	8134701	Issue Dt:	03/13/2012	Application #:	12774379	Filing Dt:	05/05/2010
Publication #:	US20100214561	Pub Dt:	08/26/2010
Title:	DEFECT INSPECTING METHOD AND APPARATUS

Patent #:	8233145	Issue Dt:	07/31/2012	Application #:	12781682	Filing Dt:	05/17/2010
Publication #:	US20100225903	Pub Dt:	09/09/2010
Title:	PATTERN DEFECT INSPECTION APPARATUS AND METHOD

Patent #:	8468221	Issue Dt:	06/18/2013	Application #:	12784166	Filing Dt:	05/20/2010
Publication #:	US20100299415	Pub Dt:	11/25/2010
Title:	NETWORK CONFIGURATION METHOD

Patent #:	8364416	Issue Dt:	01/29/2013	Application #:	12785188	Filing Dt:	05/21/2010
Publication #:	US20100292975	Pub Dt:	11/18/2010
Title:	INFORMATION PROCESSING SYSTEM USING BASE SEQUENCE RELEVANT INFORMATION

Patent #:	8658102	Issue Dt:	02/25/2014	Application #:	12785835	Filing Dt:	05/24/2010
Publication #:	US20100233027	Pub Dt:	09/16/2010
Title:	CHEMICAL ANALYSIS APPARATUS AND CHEMICAL ANALYSIS METHOD

Patent #:	8031421	Issue Dt:	10/04/2011	Application #:	12788481	Filing Dt:	05/27/2010
Publication #:	US20100302665	Pub Dt:	12/02/2010
Title:	METHOD FOR MEASURING OPTIMUM SEEKING TIME AND INSPECTION APPARATUS USING THE SAME

Patent #:	8036845	Issue Dt:	10/11/2011	Application #:	12792795	Filing Dt:	06/03/2010
Publication #:	US20100241386	Pub Dt:	09/23/2010
Title:	METHOD OF CORRECTING COORDINATES, AND DEFECT REVIEW APPARATUS

Patent #:	8178836	Issue Dt:	05/15/2012	Application #:	12792808	Filing Dt:	06/03/2010
Publication #:	US20100237241	Pub Dt:	09/23/2010
Title:	ELECTROSTATIC CHARGE MEASUREMENT METHOD, FOCUS ADJUSTMENT METHOD, AND SCANNING ELECTRON MICROSCOPE

Patent #:	8248594	Issue Dt:	08/21/2012	Application #:	12814518	Filing Dt:	06/14/2010
Publication #:	US20100271625	Pub Dt:	10/28/2010
Title:	SURFACE INSPECTION METHOD AND SURFACE INSPECTION APPARATUS

Patent #:	8143588	Issue Dt:	03/27/2012	Application #:	12815507	Filing Dt:	06/15/2010
Publication #:	US20100248166	Pub Dt:	09/30/2010
Title:	DEFLECTOR ARRAY, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD

Patent #:	8169606	Issue Dt:	05/01/2012	Application #:	12823290	Filing Dt:	06/25/2010
Publication #:	US20100259750	Pub Dt:	10/14/2010
Title:	APPEARANCE INSPECTION APPARATUS

Patent #:	8274048	Issue Dt:	09/25/2012	Application #:	12823296	Filing Dt:	06/25/2010
Publication #:	US20100258723	Pub Dt:	10/14/2010
Title:	SCANNING ELECTRON MICROSCOPE HAVING TIME CONSTANT MEASUREMENT CAPABILITY

Patent #:	8457926	Issue Dt:	06/04/2013	Application #:	12841599	Filing Dt:	07/22/2010
Publication #:	US20110051580	Pub Dt:	03/03/2011
Title:	DISK PROTRUSION DETECTION/FLATNESS MEASUREMENT CIRCUIT AND DISK GLIDE TESTER

Patent #:	7964140	Issue Dt:	06/21/2011	Application #:	12843446	Filing Dt:	07/26/2010
Publication #:	US20100288830	Pub Dt:	11/18/2010
Title:	AUTOMATIC ANALYZER

Patent #:	8024831	Issue Dt:	09/27/2011	Application #:	12849255	Filing Dt:	08/03/2010
Publication #:	US20100294315	Pub Dt:	11/25/2010
Title:	CLEANING METHOD

Patent #:	8154717	Issue Dt:	04/10/2012	Application #:	12850300	Filing Dt:	08/04/2010
Publication #:	US20100315626	Pub Dt:	12/16/2010
Title:	OPTICAL APPARATUS FOR DEFECT INSPECTION

Patent #:	8940128	Issue Dt:	01/27/2015	Application #:	12853427	Filing Dt:	08/10/2010
Publication #:	US20110297320	Pub Dt:	12/08/2011
Title:	PLASMA PROCESSING APPARATUS

Patent #:	9150967	Issue Dt:	10/06/2015	Application #:	12854242	Filing Dt:	08/11/2010
Publication #:	US20110297082	Pub Dt:	12/08/2011
Title:	PLASMA PROCESSING APPARATUS AND SAMPLE STAGE

Patent #:	8262801	Issue Dt:	09/11/2012	Application #:	12854435	Filing Dt:	08/11/2010
Publication #:	US20100300483	Pub Dt:	12/02/2010
Title:	VACUUM PROCESSING METHOD

Patent #:	8557709	Issue Dt:	10/15/2013	Application #:	12855302	Filing Dt:	08/12/2010
Publication #:	US20110226734	Pub Dt:	09/22/2011
Title:	PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD

Patent #:	8294890	Issue Dt:	10/23/2012	Application #:	12855915	Filing Dt:	08/13/2010
Publication #:	US20110075133	Pub Dt:	03/31/2011
Title:	METHOD AND DEVICE FOR INSPECTING DEFECTS ON BOTH SURFACES OF MAGNETIC DISK

Patent #:	8784677	Issue Dt:	07/22/2014	Application #:	12856725	Filing Dt:	08/16/2010
Publication #:	US20120018094	Pub Dt:	01/26/2012
Title:	PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD

Patent #:	8217351	Issue Dt:	07/10/2012	Application #:	12858209	Filing Dt:	08/17/2010
Publication #:	US20100310180	Pub Dt:	12/09/2010
Title:	PATTERN INSPECTION METHOD AND PATTERN INSPECTION SYSTEM

Patent #:	9347966	Issue Dt:	05/24/2016	Application #:	12867795	Filing Dt:	09/20/2010
Publication #:	US20110020949	Pub Dt:	01/27/2011
Title:	AUTOMATIC ANALYZER

Patent #:	8153970	Issue Dt:	04/10/2012	Application #:	12871309	Filing Dt:	08/30/2010
Publication #:	US20100320385	Pub Dt:	12/23/2010
Title:	SCANNING ELECTRON MICROSCOPE

Patent #:	9011065	Issue Dt:	04/21/2015	Application #:	12871333	Filing Dt:	08/30/2010
Publication #:	US20110110751	Pub Dt:	05/12/2011
Title:	VACUUM PROCESSING APPARATUS AND OPERATING METHOD OF VACUUM PROCESSING APPARATUS

Patent #:	8116556	Issue Dt:	02/14/2012	Application #:	12888286	Filing Dt:	09/22/2010
Publication #:	US20110013825	Pub Dt:	01/20/2011
Title:	METHOD AND APPARATUS FOR ANALYZING DEFECT DATA AND A REVIEW SYSTEM

Patent #:	8433522	Issue Dt:	04/30/2013	Application #:	12891906	Filing Dt:	09/28/2010
Publication #:	US20110015870	Pub Dt:	01/20/2011
Title:	INFORMATION PROCESSING SYSTEM USING NUCLEOTIDE SEQUENCE-RELATED INFORMATION

Patent #:	8197754	Issue Dt:	06/12/2012	Application #:	12895040	Filing Dt:	09/30/2010
Publication #:	US20110014085	Pub Dt:	01/20/2011
Title:	SAMPLE DISPENSING APPARATUS AND AUTOMATIC ANALYZER INCLUDING THE SAME

Patent #:	8207512	Issue Dt:	06/26/2012	Application #:	12898455	Filing Dt:	10/05/2010
Publication #:	US20110133080	Pub Dt:	06/09/2011
Title:	CHARGED PARTICLE BEAM APPARATUS AND METHODS FOR CAPTURING IMAGES USING THE SAME

Patent #:	7952700	Issue Dt:	05/31/2011	Application #:	12907895	Filing Dt:	10/19/2010
Publication #:	US20110032515	Pub Dt:	02/10/2011
Title:	METHOD OF APPARATUS FOR DETECTING PARTICLES ON A SPECIMEN

Patent #:	8203504	Issue Dt:	06/19/2012	Application #:	12907912	Filing Dt:	10/19/2010
Publication #:	US20110032176	Pub Dt:	02/10/2011
Title:	IMAGE FORMING METHOD AND CHARGED PARTICLE BEAM APPARATUS

Patent #:	8785883	Issue Dt:	07/22/2014	Application #:	12918619	Filing Dt:	11/19/2010
Publication #:	US20110057100	Pub Dt:	03/10/2011
Title:	TRANSMISSION ELECTRON MICROSCOPE, AND METHOD OF OBSERVING SPECIMEN

Patent #:	9239281	Issue Dt:	01/19/2016	Application #:	12920424	Filing Dt:	08/31/2010
Publication #:	US20110002516	Pub Dt:	01/06/2011
Title:	METHOD AND DEVICE FOR DIVIDING AREA OF IMAGE OF PARTICLE IN URINE

Patent #:	8498489	Issue Dt:	07/30/2013	Application #:	12920724	Filing Dt:	11/19/2010
Publication #:	US20110110597	Pub Dt:	05/12/2011
Title:	IMAGE INSPECTION APPARATUS

Patent #:	8871088	Issue Dt:	10/28/2014	Application #:	12938780	Filing Dt:	11/03/2010
Publication #:	US20110042283	Pub Dt:	02/24/2011
Title:	LIQUID DELIVERY DEVICE, LIQUID CHROMATOGRAPH, AND METHOD FOR OPERATION OF LIQUID DELIVERY DEVICE

Patent #:	8304725	Issue Dt:	11/06/2012	Application #:	12944434	Filing Dt:	11/11/2010
Publication #:	US20110057101	Pub Dt:	03/10/2011
Title:	CHARGED PARTICLE BEAM SYSTEM

Patent #:	8108172	Issue Dt:	01/31/2012	Application #:	12953170	Filing Dt:	11/23/2010
Publication #:	US20110062328	Pub Dt:	03/17/2011
Title:	DEFECT REVIEW APPARATUS AND METHOD OF REVIEWING DEFECTS

Patent #:	9271341	Issue Dt:	02/23/2016	Application #:	12955020	Filing Dt:	11/29/2010
Publication #:	US20120055915	Pub Dt:	03/08/2012
Title:	HEAT TREATMENT APPARATUS THAT PERFORMS DEFECT REPAIR ANNEALING

Patent #:	8686360	Issue Dt:	04/01/2014	Application #:	12963201	Filing Dt:	12/08/2010
Publication #:	US20110073758	Pub Dt:	03/31/2011
Title:	MICRO-SAMPLE PROCESSING METHOD, OBSERVATION METHOD AND APPARATUS

Patent #:	8160352	Issue Dt:	04/17/2012	Application #:	12964833	Filing Dt:	12/10/2010
Publication #:	US20110075135	Pub Dt:	03/31/2011
Title:	SURFACE INSPECTION METHOD AND SURFACE INSPECTION APPARATUS

Patent #:	9385016	Issue Dt:	07/05/2016	Application #:	12966429	Filing Dt:	12/13/2010
Publication #:	US20110144792	Pub Dt:	06/16/2011
Title:	SEMICONDUCTOR PROCESSING SYSTEM AND PROGRAM

Patent #:	8208356	Issue Dt:	06/26/2012	Application #:	12975405	Filing Dt:	12/22/2010
Publication #:	US20110158073	Pub Dt:	06/30/2011
Title:	OPTICAL CHECKING METHOD AND APPARATUS FOR DEFECTS IN MAGNETIC DISKS

Patent #:	8189205	Issue Dt:	05/29/2012	Application #:	12979885	Filing Dt:	12/28/2010
Publication #:	US20110090512	Pub Dt:	04/21/2011
Title:	SURFACE INSPECTION TOOL AND SURFACE INSPECTION METHOD

Patent #:	8575547	Issue Dt:	11/05/2013	Application #:	12982202	Filing Dt:	12/30/2010
Publication #:	US20110095183	Pub Dt:	04/28/2011
Title:	ELECTRON BEAM MEASUREMENT APPARATUS

Patent #:	8222601	Issue Dt:	07/17/2012	Application #:	12984907	Filing Dt:	01/05/2011
Publication #:	US20110095184	Pub Dt:	04/28/2011
Title:	SCANNING ELECTRON MICROSCOPE AND METHOD OF IMAGING AN OBJECT BY USING THE SCANNING ELECTRON MICROSCOPE

Patent #:	8581976	Issue Dt:	11/12/2013	Application #:	12986475	Filing Dt:	01/07/2011
Publication #:	US20110102573	Pub Dt:	05/05/2011
Title:	METHOD AND APPARATUS FOR REVIEWING DEFECTS OF SEMICONDUCTOR DEVICE

Patent #:	NONE	Issue Dt:		Application #:	12990789	Filing Dt:	11/16/2010
Publication #:	US20110058984	Pub Dt:	03/10/2011
Title:	AUTOMATIC ANALYZER

Patent #:	8857295	Issue Dt:	10/14/2014	Application #:	12992932	Filing Dt:	11/16/2010
Publication #:	US20110088517	Pub Dt:	04/21/2011
Title:	SYSTEM FOR PRETREATING SAMPLE

Patent #:	9075030	Issue Dt:	07/07/2015	Application #:	12993147	Filing Dt:	12/14/2010
Publication #:	US20110090066	Pub Dt:	04/21/2011
Title:	AUTOMATIC ANALYZER

Patent #:	8562910	Issue Dt:	10/22/2013	Application #:	12994300	Filing Dt:	02/16/2011
Publication #:	US20110126609	Pub Dt:	06/02/2011
Title:	METHOD AND APPARATUS FOR ANALYSIS OF POLY (BIPHENYL CHLORIDE) IN ELECTRICAL INSULATING OIL

Patent #:	9217712	Issue Dt:	12/22/2015	Application #:	12995219	Filing Dt:	02/04/2011
Publication #:	US20110125415	Pub Dt:	05/26/2011
Title:	METHOD FOR ASSISTING JUDGMENT OF ABNORMALITY OF REACTION PROCESS DATA AND AUTOMATIC ANALYZER

Patent #:	8779380	Issue Dt:	07/15/2014	Application #:	12995700	Filing Dt:	03/10/2011
Publication #:	US20110147609	Pub Dt:	06/23/2011
Title:	ION BEAM DEVICE

Patent #:	8538119	Issue Dt:	09/17/2013	Application #:	12996114	Filing Dt:	12/14/2010
Publication #:	US20110090247	Pub Dt:	04/21/2011
Title:	PARTICLE IMAGE ANALYSIS METHOD AND APPARATUS

Patent #:	8705841	Issue Dt:	04/22/2014	Application #:	12997176	Filing Dt:	03/04/2011
Publication #:	US20110142326	Pub Dt:	06/16/2011
Title:	PATTERN INSPECTION METHOD, PATTERN INSPECTION APPARATUS AND PATTERN PROCESSING APPARATUS

Patent #:	8865403	Issue Dt:	10/21/2014	Application #:	12997469	Filing Dt:	12/10/2010
Publication #:	US20110081655	Pub Dt:	04/07/2011
Title:	NUCLEIC ACID ANALYZING DEVICE AND NUCLEIC ACID ANALYZER

Patent #:	8319193	Issue Dt:	11/27/2012	Application #:	12999075	Filing Dt:	12/15/2010
Publication #:	US20110089336	Pub Dt:	04/21/2011
Title:	CHARGED PARTICLE BEAM APPARATUS, AND METHOD OF CONTROLLING THE SAME

Patent #:	8232522	Issue Dt:	07/31/2012	Application #:	13000461	Filing Dt:	12/21/2010
Publication #:	US20110095185	Pub Dt:	04/28/2011
Title:	SEMICONDUCTOR INSPECTING APPARATUS

Patent #:	8574891	Issue Dt:	11/05/2013	Application #:	13000579	Filing Dt:	12/21/2010
Publication #:	US20110104703	Pub Dt:	05/05/2011
Title:	NUCLEIC ACID ANALYZER, AUTOMATIC ANALYZER, AND ANALYSIS METHOD

Patent #:	8530858	Issue Dt:	09/10/2013	Application #:	13000593	Filing Dt:	03/18/2011
Publication #:	US20110155906	Pub Dt:	06/30/2011
Title:	TRANSMISSION ELECTRON MICROSCOPE APPARATUS COMPRISING ELECTRON SPECTROSCOPE, SAMPLE HOLDER, SAMPLE STAGE, AND METHOD FOR ACQUIRING SPECTRAL IMAGE

Patent #:	9194793	Issue Dt:	11/24/2015	Application #:	13002664	Filing Dt:	01/05/2011
Publication #:	US20110110822	Pub Dt:	05/12/2011
Title:	SAMPLE ANALYSIS DEVICE

Patent #:	8557181	Issue Dt:	10/15/2013	Application #:	13003337	Filing Dt:	01/10/2011
Publication #:	US20110104007	Pub Dt:	05/05/2011
Title:	AUTOMATIC ANALYZING DEVICE

Patent #:	8500912	Issue Dt:	08/06/2013	Application #:	13008993	Filing Dt:	01/19/2011
Publication #:	US20120085366	Pub Dt:	04/12/2012
Title:	PLASMA PROCESSING METHOD AND PLASMA PROCESSING APPARATUS

Patent #:	9070388	Issue Dt:	06/30/2015	Application #:	13011019	Filing Dt:	01/21/2011
Publication #:	US20120103933	Pub Dt:	05/03/2012
Title:	PLASMA PROCESSING METHOD

Patent #:	8277563	Issue Dt:	10/02/2012	Application #:	13019131	Filing Dt:	02/01/2011
Publication #:	US20110120495	Pub Dt:	05/26/2011
Title:	PLASMA PROCESSING METHOD

Patent #:	9805915	Issue Dt:	10/31/2017	Application #:	13020991	Filing Dt:	02/04/2011
Publication #:	US20120145322	Pub Dt:	06/14/2012
Title:	PLASMA PROCESSING APPARATUS

Patent #:	8115915	Issue Dt:	02/14/2012	Application #:	13021076	Filing Dt:	02/04/2011
Publication #:	US20110128534	Pub Dt:	06/02/2011
Title:	DEFECT INSPECTION METHOD AND APPARATUS

Patent #:	9343340	Issue Dt:	05/17/2016	Application #:	13021827	Filing Dt:	02/07/2011
Publication #:	US20110229289	Pub Dt:	09/22/2011
Title:	VACUUM PROCESSING APPARATUS

Patent #:	8538573	Issue Dt:	09/17/2013	Application #:	13021888	Filing Dt:	02/07/2011
Publication #:	US20110218662	Pub Dt:	09/08/2011
Title:	VACUUM PROCESSING APPARATUS AND PROGRAM

Patent #:	8849446	Issue Dt:	09/30/2014	Application #:	13021898	Filing Dt:	02/07/2011
Publication #:	US20110217148	Pub Dt:	09/08/2011
Title:	VACUUM PROCESSING APPARATUS AND PROGRAM

Patent #:	8565238	Issue Dt:	10/22/2013	Application #:	13022052	Filing Dt:	02/07/2011
Publication #:	US20110200049	Pub Dt:	08/18/2011
Title:	INDUSTRIAL NETWORK SYSTEM

Patent #:	8747046	Issue Dt:	06/10/2014	Application #:	13022313	Filing Dt:	02/07/2011
Publication #:	US20120163943	Pub Dt:	06/28/2012
Title:	VACUUM PROCESSING APPARATUS

Patent #:	8185968	Issue Dt:	05/22/2012	Application #:	13024589	Filing Dt:	02/10/2011
Publication #:	US20110225684	Pub Dt:	09/15/2011
Title:	MAGNETIC HEAD INSPECTION METHOD AND MAGNETIC HEAD MANUFACTURING METHOD

Patent #:	8283630	Issue Dt:	10/09/2012	Application #:	13024594	Filing Dt:	02/10/2011
Publication #:	US20110127429	Pub Dt:	06/02/2011
Title:	METHOD AND APPARATUS FOR MEASURING DIMENSION OF CIRCUIT PATTERN FORMED ON SUBSTRATE BY USING SCANNING ELECTRON MICROSCOPE

Patent #:	8193493	Issue Dt:	06/05/2012	Application #:	13032050	Filing Dt:	02/22/2011
Publication #:	US20110139985	Pub Dt:	06/16/2011
Title:	CHARGED PARTICLE BEAM APPARATUS

Patent #:	8244042	Issue Dt:	08/14/2012	Application #:	13034237	Filing Dt:	02/24/2011
Publication #:	US20110150345	Pub Dt:	06/23/2011
Title:	PATTERN MATCHING METHOD AND COMPUTER PROGRAM FOR EXECUTING PATTERN MATCHING

Patent #:	8209135	Issue Dt:	06/26/2012	Application #:	13040794	Filing Dt:	03/04/2011
Publication #:	US20110211060	Pub Dt:	09/01/2011
Title:	WAFER INSPECTION DATA HANDLING AND DEFECT REVIEW TOOL

Patent #:	8338804	Issue Dt:	12/25/2012	Application #:	13041894	Filing Dt:	03/07/2011
Publication #:	US20110158543	Pub Dt:	06/30/2011
Title:	SAMPLE DIMENSION INSPECTING/MEASURING METHOD AND SAMPLE DIMENSION INSPECTING/MEASURING APPARATUS

Patent #:	8274044	Issue Dt:	09/25/2012	Application #:	13055382	Filing Dt:	01/21/2011
Publication #:	US20110121174	Pub Dt:	05/26/2011
Title:	MASS SPECTROSCOPE AND MASS SPECTROMETRY

Patent #:	8324596	Issue Dt:	12/04/2012	Application #:	13055854	Filing Dt:	01/25/2011
Publication #:	US20110121204	Pub Dt:	05/26/2011
Title:	TOTAL INTERNAL REFLECTION FLUORESCENCE (TIRF) OBSERVATION DEVICE

Patent #:	8509516	Issue Dt:	08/13/2013	Application #:	13056046	Filing Dt:	01/26/2011
Publication #:	US20110129141	Pub Dt:	06/02/2011
Title:	CIRCUIT PATTERN EXAMINING APPARATUS AND CIRCUIT PATTERN EXAMINING METHOD

Patent #:	8467595	Issue Dt:	06/18/2013	Application #:	13056353	Filing Dt:	02/09/2011
Publication #:	US20110129142	Pub Dt:	06/02/2011
Title:	DEFECT REVIEW SYSTEM AND METHOD, AND PROGRAM

Patent #:	8263929	Issue Dt:	09/11/2012	Application #:	13057235	Filing Dt:	02/02/2011
Publication #:	US20110133065	Pub Dt:	06/09/2011
Title:	STANDARD MEMBER FOR CORRECTION, SCANNING ELECTRON MICROSCOPE USING SAME, AND SCANNING ELECTRON MICROSCOPE CORRECTION METHOD

Patent #:	8585112	Issue Dt:	11/19/2013	Application #:	13057602	Filing Dt:	02/25/2011
Publication #:	US20110142578	Pub Dt:	06/16/2011
Title:	SAMPLE CONVEYING MECHANISM

Patent #:	8697014	Issue Dt:	04/15/2014	Application #:	13058049	Filing Dt:	02/17/2011
Publication #:	US20110182784	Pub Dt:	07/28/2011
Title:	SPECIMEN RACK

Patent #:	8525108	Issue Dt:	09/03/2013	Application #:	13058054	Filing Dt:	02/08/2011
Publication #:	US20110133075	Pub Dt:	06/09/2011
Title:	MASS SPECTROMETER

Patent #:	8743357	Issue Dt:	06/03/2014	Application #:	13058081	Filing Dt:	02/08/2011
Publication #:	US20110134418	Pub Dt:	06/09/2011
Title:	LIGHT SOURCE DEVICE, SURFACE INSPECTING APPARATUS USING THE DEVICE, AND METHOD FOR CALIBRATING SURFACE INSPECTING APPARATUS USING THE DEVICE

Patent #:	8816712	Issue Dt:	08/26/2014	Application #:	13058158	Filing Dt:	02/08/2011
Publication #:	US20110140729	Pub Dt:	06/16/2011
Title:	INSPECTION DEVICE

Patent #:	8767038	Issue Dt:	07/01/2014	Application #:	13058226	Filing Dt:	04/15/2011
Publication #:	US20110181688	Pub Dt:	07/28/2011
Title:	METHOD AND DEVICE FOR SYNTHESIZING PANORAMA IMAGE USING SCANNING CHARGED-PARTICLE MICROSCOPE

Patent #:	8581190	Issue Dt:	11/12/2013	Application #:	13058540	Filing Dt:	02/11/2011
Publication #:	US20110139980	Pub Dt:	06/16/2011
Title:	CHARGED PARTICLE BEAM APPARATUS AND GEOMETRICAL ABERRATION MEASUREMENT METHOD THEREFOR

Patent #:	8766183	Issue Dt:	07/01/2014	Application #:	13058712	Filing Dt:	02/11/2011
Publication #:	US20110147586	Pub Dt:	06/23/2011
Title:	CHARGED PARTICLE BEAM DEVICE

Patent #:	9176156	Issue Dt:	11/03/2015	Application #:	13059309	Filing Dt:	03/22/2011
Publication #:	US20110174343	Pub Dt:	07/21/2011
Title:	AUTOMATIC ANALYZER INCLUDING PRESSURE SENSOR FOR WASHING SOLUTION

Patent #:	9164112	Issue Dt:	10/20/2015	Application #:	13059510	Filing Dt:	03/21/2011
Publication #:	US20110169836	Pub Dt:	07/14/2011
Title:	AUTOMATIC ANALYZER

Patent #:	8701504	Issue Dt:	04/22/2014	Application #:	13059511	Filing Dt:	03/15/2011
Publication #:	US20110162438	Pub Dt:	07/07/2011
Title:	AUTOMATIC ANALYZER AND SAMPLE-PROCESSING SYSTEM

100

Patent #:	8487251	Issue Dt:	07/16/2013	Application #:	13059537	Filing Dt:	02/17/2011
Publication #:	US20110139981	Pub Dt:	06/16/2011
Title:	METHOD FOR CONTROLLING CHARGING OF SAMPLE AND SCANNING ELECTRON MICROSCOPE

Assignor

HITACHI HIGH-TECHNOLOGIES CORPORATION

Exec Dt:

02/12/2020

Assignee

HITACHI HIGH-TECH CORPORATION

17-1, TORANOMON 1-CHOME, MINATO-KU

TOKYO, JAPAN

Correspondence name and address
	MATTINGLY & MALUR PC
	1800 DIAGONAL ROAD
	SUITE 210
	ALEXANDRIA, VA 22314

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