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Reel/Frame:	052259/0227			Pages:	68
		Recorded:	03/30/2020
Attorney Dkt #:	T&A-GENERAL/Z-1830(USMA)
Conveyance:	CHANGE OF NAME AND ADDRESS

Total properties: 2251
Page 9 of 23
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Patent #:	8759761	Issue Dt:	06/24/2014	Application #:	13059654	Filing Dt:	02/18/2011
Publication #:	US20110139983	Pub Dt:	06/16/2011
Title:	CHARGED CORPUSCULAR PARTICLE BEAM IRRADIATING METHOD, AND CHARGED CORPUSCULAR PARTICLE BEAM APPARATUS

Patent #:	8926903	Issue Dt:	01/06/2015	Application #:	13060164	Filing Dt:	03/21/2011
Publication #:	US20110157580	Pub Dt:	06/30/2011
Title:	PRETREATMENT APPARATUS AND MASS SPECTROMETER EQUIPPED WITH THE SAME APPARATUS

Patent #:	8421010	Issue Dt:	04/16/2013	Application #:	13061031	Filing Dt:	02/25/2011
Publication #:	US20110163230	Pub Dt:	07/07/2011
Title:	CHARGED PARTICLE BEAM DEVICE FOR SCANNING A SAMPLE USING A CHARGED PARTICLE BEAM TO INSPECT THE SAMPLE

Patent #:	8338781	Issue Dt:	12/25/2012	Application #:	13079361	Filing Dt:	04/04/2011
Publication #:	US20110174975	Pub Dt:	07/21/2011
Title:	CHARGED PARTICLE BEAM SCANNING METHOD AND CHARGED PARTICLE BEAM APPARATUS

Patent #:	8304726	Issue Dt:	11/06/2012	Application #:	13081875	Filing Dt:	04/07/2011
Publication #:	US20110180708	Pub Dt:	07/28/2011
Title:	TEST APPARATUS

Patent #:	8368013	Issue Dt:	02/05/2013	Application #:	13084930	Filing Dt:	04/12/2011
Publication #:	US20110253889	Pub Dt:	10/20/2011
Title:	ANALYZER, IONIZATION APPARATUS AND ANALYZING METHOD

Patent #:	8680464	Issue Dt:	03/25/2014	Application #:	13085761	Filing Dt:	04/13/2011
Publication #:	US20110253891	Pub Dt:	10/20/2011
Title:	MASS SPECTROMETER

Patent #:	8313695	Issue Dt:	11/20/2012	Application #:	13094129	Filing Dt:	04/26/2011
Publication #:	US20110200485	Pub Dt:	08/18/2011
Title:	AUTOMATIC ANALYZER

Patent #:	8149396	Issue Dt:	04/03/2012	Application #:	13099530	Filing Dt:	05/03/2011
Publication #:	US20110205534	Pub Dt:	08/25/2011
Title:	DEFECT INSPECTION APPARATUS AND ITS METHOD

Patent #:	8809727	Issue Dt:	08/19/2014	Application #:	13105981	Filing Dt:	05/12/2011
Publication #:	US20110284506	Pub Dt:	11/24/2011
Title:	HEAT TREATMENT APPARATUS

Patent #:	8314929	Issue Dt:	11/20/2012	Application #:	13107637	Filing Dt:	05/13/2011
Publication #:	US20110211191	Pub Dt:	09/01/2011
Title:	METHOD AND ITS APPARATUS FOR INSPECTING DEFECTS

Patent #:	8481934	Issue Dt:	07/09/2013	Application #:	13107892	Filing Dt:	05/14/2011
Publication #:	US20110215243	Pub Dt:	09/08/2011
Title:	METHOD FOR INSPECTING AND MEASURING SAMPLE AND SCANNING ELECTRON MICROSCOPE

Patent #:	8289507	Issue Dt:	10/16/2012	Application #:	13118004	Filing Dt:	05/27/2011
Publication #:	US20110228258	Pub Dt:	09/22/2011
Title:	METHOD OF APPARATUS FOR DETECTING PARTICLES ON A SPECIMEN

Patent #:	8953894	Issue Dt:	02/10/2015	Application #:	13122151	Filing Dt:	06/27/2011
Publication #:	US20110262043	Pub Dt:	10/27/2011
Title:	PATTERN MATCHING METHOD AND IMAGE PROCESSING DEVICE

Patent #:	8478078	Issue Dt:	07/02/2013	Application #:	13122731	Filing Dt:	04/22/2011
Publication #:	US20110194778	Pub Dt:	08/11/2011
Title:	PATTERN-SEARCHING CONDITION DETERMINING METHOD, AND PATTERN-SEARCHING CONDITION SETTING DEVICE

Patent #:	8334520	Issue Dt:	12/18/2012	Application #:	13124599	Filing Dt:	07/11/2011
Publication #:	US20110260057	Pub Dt:	10/27/2011
Title:	CHARGED PARTICLE BEAM APPARATUS

Patent #:	8565509	Issue Dt:	10/22/2013	Application #:	13125718	Filing Dt:	06/22/2011
Publication #:	US20110255773	Pub Dt:	10/20/2011
Title:	CIRCUIT PATTERN INSPECTING APPARATUS, MANAGEMENT SYSTEM INCLUDING CIRCUIT PATTERN INSPECTING APPARATUS, AND METHOD FOR INSPECTING CIRCUIT PATTERN

Patent #:	8586920	Issue Dt:	11/19/2013	Application #:	13126198	Filing Dt:	04/27/2011
Publication #:	US20110204228	Pub Dt:	08/25/2011
Title:	CHARGED PARTICLE BEAM APPARATUS

Patent #:	9013572	Issue Dt:	04/21/2015	Application #:	13126638	Filing Dt:	04/28/2011
Publication #:	US20110205353	Pub Dt:	08/25/2011
Title:	METHOD FOR OBSERVING SAMPLE AND ELECTRONIC MICROSCOPE

Patent #:	8831899	Issue Dt:	09/09/2014	Application #:	13127051	Filing Dt:	07/25/2011
Publication #:	US20110276299	Pub Dt:	11/10/2011
Title:	AN INSPECTING APPARATUS AND AN INSPECTING METHOD

Patent #:	8373113	Issue Dt:	02/12/2013	Application #:	13127912	Filing Dt:	05/05/2011
Publication #:	US20110210250	Pub Dt:	09/01/2011
Title:	CALIBRATION STANDARD MEMBER, METHOD FOR MANUFACTURING THE MEMBER AND SCANNING ELECTRONIC MICROSCOPE USING THE MEMBER

Patent #:	8421008	Issue Dt:	04/16/2013	Application #:	13129201	Filing Dt:	08/02/2011
Publication #:	US20110278452	Pub Dt:	11/17/2011
Title:	PATTERN CHECK DEVICE AND PATTERN CHECK METHOD

Patent #:	8936754	Issue Dt:	01/20/2015	Application #:	13129812	Filing Dt:	06/01/2011
Publication #:	US20110223066	Pub Dt:	09/15/2011
Title:	AUTOMATIC ANALYSIS DEVICE

Patent #:	9383376	Issue Dt:	07/05/2016	Application #:	13133655	Filing Dt:	08/23/2011
Publication #:	US20110301917	Pub Dt:	12/08/2011
Title:	AUTOMATIC ANALYZER

Patent #:	8450699	Issue Dt:	05/28/2013	Application #:	13133947	Filing Dt:	06/10/2011
Publication #:	US20110240855	Pub Dt:	10/06/2011
Title:	ELECTRON BEAM DEVICE AND ELECTRON BEAM APPLICATION DEVICE USING THE SAME

Patent #:	8125518	Issue Dt:	02/28/2012	Application #:	13139315	Filing Dt:	06/13/2011
Publication #:	US20110249110	Pub Dt:	10/13/2011
Title:	SCANNING ELECTRON MICROSCOPE

Patent #:	8670115	Issue Dt:	03/11/2014	Application #:	13141737	Filing Dt:	06/23/2011
Publication #:	US20110255080	Pub Dt:	10/20/2011
Title:	INSPECTION METHOD AND INSPECTION APPARATUS

Patent #:	9063104	Issue Dt:	06/23/2015	Application #:	13141760	Filing Dt:	06/23/2011
Publication #:	US20110256022	Pub Dt:	10/20/2011
Title:	AUTOMATIC ANALYZER

Patent #:	9229015	Issue Dt:	01/05/2016	Application #:	13141984	Filing Dt:	09/13/2011
Publication #:	US20120000268	Pub Dt:	01/05/2012
Title:	ACCURACY MANAGEMENT METHOD

Patent #:	8258472	Issue Dt:	09/04/2012	Application #:	13142153	Filing Dt:	06/24/2011
Publication #:	US20110260058	Pub Dt:	10/27/2011
Title:	CHARGED PARTICLE RADIATION DEVICE AND IMAGE CAPTURING CONDITION DETERMINING METHOD USING CHARGED PARTICLE RADIATION DEVICE

Patent #:	8895296	Issue Dt:	11/25/2014	Application #:	13142154	Filing Dt:	06/24/2011
Publication #:	US20110256532	Pub Dt:	10/20/2011
Title:	ANALYZER

Patent #:	8478021	Issue Dt:	07/02/2013	Application #:	13142316	Filing Dt:	06/27/2011
Publication #:	US20110274341	Pub Dt:	11/10/2011
Title:	CHARGED BEAM DEVICE

Patent #:	8681328	Issue Dt:	03/25/2014	Application #:	13142328	Filing Dt:	08/12/2011
Publication #:	US20110286001	Pub Dt:	11/24/2011
Title:	DARK-FIELD DEFECT INSPECTING METHOD, DARK-FIELD DEFECT INSPECTING APPARATUS, ABERRATION ANALYZING METHOD, AND ABERRATION ANALYZING APPARATUS

Patent #:	8625906	Issue Dt:	01/07/2014	Application #:	13142812	Filing Dt:	06/29/2011
Publication #:	US20110274362	Pub Dt:	11/10/2011
Title:	IMAGE CLASSIFICATION STANDARD UPDATE METHOD, PROGRAM, AND IMAGE CLASSIFICATION DEVICE

Patent #:	9082585	Issue Dt:	07/14/2015	Application #:	13143345	Filing Dt:	08/04/2011
Publication #:	US20110285839	Pub Dt:	11/24/2011
Title:	DEFECT OBSERVATION METHOD AND DEVICE USING SEM

Patent #:	8350214	Issue Dt:	01/08/2013	Application #:	13143404	Filing Dt:	07/06/2011
Publication #:	US20110272576	Pub Dt:	11/10/2011
Title:	CHARGED PARTICLE BEAM APPLIED APPARATUS

Patent #:	8258475	Issue Dt:	09/04/2012	Application #:	13143965	Filing Dt:	07/11/2011
Publication #:	US20110272578	Pub Dt:	11/10/2011
Title:	CHARGED PARTICLE RADIATION DEVICE PROVIDED WITH ABERRATION CORRECTOR

Patent #:	8486290	Issue Dt:	07/16/2013	Application #:	13144097	Filing Dt:	08/10/2011
Publication #:	US20110315661	Pub Dt:	12/29/2011
Title:	ETCHING APPARATUS, ANALYSIS APPARATUS, ETCHING TREATMENT METHOD, AND ETCHING TREATMENT PROGRAM

Patent #:	8263943	Issue Dt:	09/11/2012	Application #:	13144620	Filing Dt:	07/14/2011
Publication #:	US20110266465	Pub Dt:	11/03/2011
Title:	ION BEAM DEVICE

Patent #:	8753572	Issue Dt:	06/17/2014	Application #:	13145355	Filing Dt:	08/01/2011
Publication #:	US20110300021	Pub Dt:	12/08/2011
Title:	AUTOMATED ANALYZER

Patent #:	8628720	Issue Dt:	01/14/2014	Application #:	13145424	Filing Dt:	09/09/2011
Publication #:	US20120114525	Pub Dt:	05/10/2012
Title:	AUTOMATIC ANALYZER

Patent #:	8278108	Issue Dt:	10/02/2012	Application #:	13145801	Filing Dt:	08/10/2011
Publication #:	US20110283779	Pub Dt:	11/24/2011
Title:	AUTOMATIC ANALYZER

Patent #:	8997589	Issue Dt:	04/07/2015	Application #:	13145804	Filing Dt:	07/22/2011
Publication #:	US20110271773	Pub Dt:	11/10/2011
Title:	AUTOMATIC ANALYSIS APPARATUS AND AUTOMATIC ANALYSIS METHOD

Patent #:	8947520	Issue Dt:	02/03/2015	Application #:	13145955	Filing Dt:	10/11/2011
Publication #:	US20120019648	Pub Dt:	01/26/2012
Title:	ELECTRON MICROSCOPE

Patent #:	8634634	Issue Dt:	01/21/2014	Application #:	13146032	Filing Dt:	08/08/2011
Publication #:	US20110299760	Pub Dt:	12/08/2011
Title:	DEFECT OBSERVATION METHOD AND DEFECT OBSERVATION APPARATUS

Patent #:	8357897	Issue Dt:	01/22/2013	Application #:	13146436	Filing Dt:	09/14/2011
Publication #:	US20120104254	Pub Dt:	05/03/2012
Title:	CHARGED PARTICLE BEAM DEVICE

Patent #:	8545757	Issue Dt:	10/01/2013	Application #:	13146582	Filing Dt:	09/09/2011
Publication #:	US20120039771	Pub Dt:	02/16/2012
Title:	AUTOMATIC ANALYZER AND SAMPLE TREATMENT APPARATUS

Patent #:	NONE	Issue Dt:		Application #:	13146656	Filing Dt:	09/09/2011
Publication #:	US20120121464	Pub Dt:	05/17/2012
Title:	APPARATUS FOR PRETREATING BIOLOGICAL SAMPLES, AND MASS SPECTROMETER EQUIPPED WITH SAME

Patent #:	8319179	Issue Dt:	11/27/2012	Application #:	13146802	Filing Dt:	08/10/2011
Publication #:	US20110291004	Pub Dt:	12/01/2011
Title:	SAMPLE PRETREATMENT APPARATUS AND MASS SPECTROMETER PROVIDED WITH THE SAME

Patent #:	8865418	Issue Dt:	10/21/2014	Application #:	13146952	Filing Dt:	08/04/2011
Publication #:	US20110287446	Pub Dt:	11/24/2011
Title:	IMMUNOANALYTICAL METHOD AND SYSTEM USING MASS SPECTROMETRY TECHNOLOGY

Patent #:	9045726	Issue Dt:	06/02/2015	Application #:	13147141	Filing Dt:	07/29/2011
Publication #:	US20120021449	Pub Dt:	01/26/2012
Title:	DEVICE FOR AUTOMATICALLY ANALYZING MICROORGANISMS AND METHOD FOR AUTOMATICALLY ANALYZING MICROORGANISMS

Patent #:	8389959	Issue Dt:	03/05/2013	Application #:	13147147	Filing Dt:	07/29/2011
Publication #:	US20110284768	Pub Dt:	11/24/2011
Title:	FLUORESCENCE ANALYZING DEVICE AND FLUORESCENCE ANALYZING METHOD

Patent #:	8444936	Issue Dt:	05/21/2013	Application #:	13147152	Filing Dt:	07/29/2011
Publication #:	US20110300035	Pub Dt:	12/08/2011
Title:	AUTOANALYZER AND PIPETTING NOZZLE FOR AUTOANALYZER

Patent #:	8936765	Issue Dt:	01/20/2015	Application #:	13147206	Filing Dt:	09/09/2011
Publication #:	US20120121465	Pub Dt:	05/17/2012
Title:	AUTOMATIC ANALYZER

Patent #:	8362449	Issue Dt:	01/29/2013	Application #:	13147386	Filing Dt:	08/02/2011
Publication #:	US20110284769	Pub Dt:	11/24/2011
Title:	TOTAL INTERNAL REFLECTION MICROSCOPE APPARATUS AND METHOD FOR ANALYZING FLUORESCENT SAMPLE

Patent #:	8911685	Issue Dt:	12/16/2014	Application #:	13147633	Filing Dt:	09/09/2011
Publication #:	US20120114526	Pub Dt:	05/10/2012
Title:	AUTOMATED ANALYZER

Patent #:	8294118	Issue Dt:	10/23/2012	Application #:	13147768	Filing Dt:	08/03/2011
Publication #:	US20110284759	Pub Dt:	11/24/2011
Title:	METHOD FOR ADJUSTING OPTICAL AXIS OF CHARGED PARTICLE RADIATION AND CHARGED PARTICLE RADIATION DEVICE

Patent #:	8709345	Issue Dt:	04/29/2014	Application #:	13147809	Filing Dt:	08/04/2011
Publication #:	US20110293476	Pub Dt:	12/01/2011
Title:	SAMPLE ANALYZING DEVICE

Patent #:	8294097	Issue Dt:	10/23/2012	Application #:	13147980	Filing Dt:	08/04/2011
Publication #:	US20110291010	Pub Dt:	12/01/2011
Title:	CHARGED PARTICLE RADIATION DEVICE

Patent #:	8309922	Issue Dt:	11/13/2012	Application #:	13148205	Filing Dt:	08/05/2011
Publication #:	US20110291009	Pub Dt:	12/01/2011
Title:	SEMICONDUCTOR INSPECTION METHOD AND DEVICE THAT CONSIDER THE EFFECTS OF ELECTRON BEAMS

Patent #:	10365287	Issue Dt:	07/30/2019	Application #:	13148479	Filing Dt:	08/09/2011
Publication #:	US20110308950	Pub Dt:	12/22/2011
Title:	METHOD FOR DETERMINING BIOPOLYMER USING NANOPORE, AND SYSTEM AND KIT THEREFOR

Patent #:	8704663	Issue Dt:	04/22/2014	Application #:	13148675	Filing Dt:	10/03/2011
Publication #:	US20120025986	Pub Dt:	02/02/2012
Title:	WORK DIRECTION DETERMINING METHOD AND DEVICE, AND WORK PROVIDED WITH DIRECTION DETERMINING FUNCTION

Patent #:	8674299	Issue Dt:	03/18/2014	Application #:	13148732	Filing Dt:	08/10/2011
Publication #:	US20110315868	Pub Dt:	12/29/2011
Title:	MASS SPECTROMETRIC SYSTEM

Patent #:	8309923	Issue Dt:	11/13/2012	Application #:	13148864	Filing Dt:	08/10/2011
Publication #:	US20110303843	Pub Dt:	12/15/2011
Title:	SAMPLE OBSERVING METHOD AND SCANNING ELECTRON MICROSCOPE

Patent #:	8243263	Issue Dt:	08/14/2012	Application #:	13167298	Filing Dt:	06/23/2011
Publication #:	US20110255082	Pub Dt:	10/20/2011
Title:	OPTICAL INSPECTION METHOD AND OPTICAL INSPECTION APPARATUS

Patent #:	8218138	Issue Dt:	07/10/2012	Application #:	13172233	Filing Dt:	06/29/2011
Publication #:	US20110255074	Pub Dt:	10/20/2011
Title:	APPARATUS AND METHOD FOR INSPECTING DEFECTS

Patent #:	8183549	Issue Dt:	05/22/2012	Application #:	13175429	Filing Dt:	07/01/2011
Publication #:	US20110260080	Pub Dt:	10/27/2011
Title:	SUBSTRATE HOLDING APPARATUS, AND INSPECTION OR PROCESSING APPARATUS

Patent #:	8460467	Issue Dt:	06/11/2013	Application #:	13177076	Filing Dt:	07/06/2011
Publication #:	US20110259522	Pub Dt:	10/27/2011
Title:	VACUUM PROCESSING APPARATUS

Patent #:	8231843	Issue Dt:	07/31/2012	Application #:	13180084	Filing Dt:	07/11/2011
Publication #:	US20110267198	Pub Dt:	11/03/2011
Title:	AUTOMATIC ANALYZER

Patent #:	8150141	Issue Dt:	04/03/2012	Application #:	13183488	Filing Dt:	07/15/2011
Publication #:	US20110268345	Pub Dt:	11/03/2011
Title:	DEFECT CLASSIFIER USING CLASSIFICATION RECIPE BASED ON CONNECTION BETWEEN RULE-BASED AND EXAMPLE-BASED CLASSIFIERS

Patent #:	9305803	Issue Dt:	04/05/2016	Application #:	13185598	Filing Dt:	07/19/2011
Publication #:	US20120252219	Pub Dt:	10/04/2012
Title:	PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD

Patent #:	8481935	Issue Dt:	07/09/2013	Application #:	13190153	Filing Dt:	07/25/2011
Publication #:	US20110278454	Pub Dt:	11/17/2011
Title:	SCANNING ELECTRON MICROSCOPE

Patent #:	8502144	Issue Dt:	08/06/2013	Application #:	13190847	Filing Dt:	07/26/2011
Publication #:	US20110278453	Pub Dt:	11/17/2011
Title:	TOOL-TO-TOOL MATCHING CONTROL METHOD AND ITS SYSTEM FOR SCANNING ELECTRON MICROSCOPE

Patent #:	8228494	Issue Dt:	07/24/2012	Application #:	13198170	Filing Dt:	08/04/2011
Publication #:	US20110292390	Pub Dt:	12/01/2011
Title:	APPARATUS FOR INSPECTING DEFECTS

Patent #:	8604429	Issue Dt:	12/10/2013	Application #:	13201820	Filing Dt:	08/16/2011
Publication #:	US20110303845	Pub Dt:	12/15/2011
Title:	ELECTRON BEAM DEVICE AND SAMPLE HOLDING DEVICE FOR ELECTRON BEAM DEVICE

Patent #:	8788242	Issue Dt:	07/22/2014	Application #:	13202504	Filing Dt:	11/01/2011
Publication #:	US20120053892	Pub Dt:	03/01/2012
Title:	PATTERN MEASUREMENT APPARATUS

Patent #:	8610060	Issue Dt:	12/17/2013	Application #:	13202554	Filing Dt:	08/19/2011
Publication #:	US20110297827	Pub Dt:	12/08/2011
Title:	CHARGED PARTICLE BEAM DEVICE

Patent #:	8680466	Issue Dt:	03/25/2014	Application #:	13202556	Filing Dt:	08/19/2011
Publication #:	US20110303844	Pub Dt:	12/15/2011
Title:	ELECTRON MICROSCOPE, AND SPECIMEN HOLDING METHOD

Patent #:	8587777	Issue Dt:	11/19/2013	Application #:	13202708	Filing Dt:	08/22/2011
Publication #:	US20110299088	Pub Dt:	12/08/2011
Title:	EXAMINATION METHOD AND EXAMINATION DEVICE

Patent #:	9110073	Issue Dt:	08/18/2015	Application #:	13202722	Filing Dt:	08/22/2011
Publication #:	US20110303599	Pub Dt:	12/15/2011
Title:	LIQUID CHROMATOGRAPH, LIQUID CHROMATOGRAPH COLUMN AND FILTER FOR LIQUID CHROMATOGRAPH COLUMN

Patent #:	8804108	Issue Dt:	08/12/2014	Application #:	13202727	Filing Dt:	11/02/2011
Publication #:	US20120050729	Pub Dt:	03/01/2012
Title:	INSPECTION METHOD AND INSPECTION APPARATUS

Patent #:	8949043	Issue Dt:	02/03/2015	Application #:	13202734	Filing Dt:	11/02/2011
Publication #:	US20120046884	Pub Dt:	02/23/2012
Title:	SURFACE INSPECTING APPARATUS AND METHOD FOR CALIBRATING SAME

Patent #:	8580689	Issue Dt:	11/12/2013	Application #:	13210446	Filing Dt:	08/16/2011
Publication #:	US20130015158	Pub Dt:	01/17/2013
Title:	PLASMA PROCESSING METHOD

Patent #:	8801951	Issue Dt:	08/12/2014	Application #:	13210490	Filing Dt:	08/16/2011
Publication #:	US20130001197	Pub Dt:	01/03/2013
Title:	PLASMA PROCESSING METHOD

Patent #:	8546266	Issue Dt:	10/01/2013	Application #:	13212909	Filing Dt:	08/18/2011
Publication #:	US20110297533	Pub Dt:	12/08/2011
Title:	PLASMA PROCESSING METHOD AND PLASMA PROCESSING APPARATUS

Patent #:	8275190	Issue Dt:	09/25/2012	Application #:	13214420	Filing Dt:	08/22/2011
Publication #:	US20110304725	Pub Dt:	12/15/2011
Title:	METHOD AND APPARATUS FOR INSPECTING PATTERN DEFECTS

Patent #:	8319194	Issue Dt:	11/27/2012	Application #:	13214654	Filing Dt:	08/22/2011
Publication #:	US20120049055	Pub Dt:	03/01/2012
Title:	DRUG DETECTION EQUIPMENT

Patent #:	8331651	Issue Dt:	12/11/2012	Application #:	13231394	Filing Dt:	09/13/2011
Publication #:	US20120002861	Pub Dt:	01/05/2012
Title:	METHOD AND APPARATUS FOR INSPECTING DEFECT OF PATTERN FORMED ON SEMICONDUCTOR DEVICE

Patent #:	8632688	Issue Dt:	01/21/2014	Application #:	13236800	Filing Dt:	09/20/2011
Publication #:	US20130045547	Pub Dt:	02/21/2013
Title:	PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD

Patent #:	NONE	Issue Dt:		Application #:	13262671	Filing Dt:	10/03/2011
Publication #:	US20120048036	Pub Dt:	03/01/2012
Title:	AUTOMATIC ANALYSIS APPARATUS

Patent #:	8702949	Issue Dt:	04/22/2014	Application #:	13263040	Filing Dt:	10/05/2011
Publication #:	US20120024707	Pub Dt:	02/02/2012
Title:	CAPILLARY ELECTROPHORESIS APPARATUS

Patent #:	8349161	Issue Dt:	01/08/2013	Application #:	13263304	Filing Dt:	10/06/2011
Publication #:	US20120031762	Pub Dt:	02/09/2012
Title:	ELECTROPHORESIS DEVICE AND PUMP

Patent #:	NONE	Issue Dt:		Application #:	13263454	Filing Dt:	10/07/2011
Publication #:	US20120020838	Pub Dt:	01/26/2012
Title:	AUTOMATIC ANALYSIS DEVICE AND DISPENSING DEVICE

Patent #:	9000365	Issue Dt:	04/07/2015	Application #:	13263826	Filing Dt:	10/10/2011
Publication #:	US20120037801	Pub Dt:	02/16/2012
Title:	PATTERN MEASURING APPARATUS AND COMPUTER PROGRAM

Patent #:	8853648	Issue Dt:	10/07/2014	Application #:	13264933	Filing Dt:	01/03/2012
Publication #:	US20120112064	Pub Dt:	05/10/2012
Title:	SAMPLE HOLDER, METHOD FOR USE OF THE SAMPLE HOLDER, AND CHARGED PARTICLE DEVICE

Patent #:	8943909	Issue Dt:	02/03/2015	Application #:	13264996	Filing Dt:	11/03/2011
Publication #:	US20120036944	Pub Dt:	02/16/2012
Title:	AUTOMATIC ANALYZER

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Publication #:	US20120043463	Pub Dt:	02/23/2012
Title:	COMPOSITE CHARGED PARTICLE BEAMS APPARATUS

Patent #:	8675949	Issue Dt:	03/18/2014	Application #:	13266800	Filing Dt:	12/28/2011
Publication #:	US20120093392	Pub Dt:	04/19/2012
Title:	REVIEWED DEFECT SELECTION PROCESSING METHOD, DEFECT REVIEW METHOD, REVIEWED DEFECT SELECTION PROCESSING TOOL, AND DEFECT REVIEW TOOL

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Publication #:	US20120087040	Pub Dt:	04/12/2012
Title:	MAGNETIC DISK INSPECTING METHOD AND ITS SYSTEM

100

Patent #:	8639451	Issue Dt:	01/28/2014	Application #:	13275770	Filing Dt:	10/18/2011
Publication #:	US20120124376	Pub Dt:	05/17/2012
Title:	INFORMATION PROCESSING SYSTEM USING NUCLEOTIDE SEQUENCE-RELATED INFORMATION

Assignor

HITACHI HIGH-TECHNOLOGIES CORPORATION

Exec Dt:

02/12/2020

Assignee

HITACHI HIGH-TECH CORPORATION

17-1, TORANOMON 1-CHOME, MINATO-KU

TOKYO, JAPAN

Correspondence name and address
	MATTINGLY & MALUR PC
	1800 DIAGONAL ROAD
	SUITE 210
	ALEXANDRIA, VA 22314

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