Patent Assignment Details
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| Reel/Frame: | 052496/0764 | |
| Pages: | 4 |
| | Recorded: | 04/26/2020 | | |
| Attorney Dkt #: | 3630-SHHL-2020001US |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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16759350
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Filing Dt:
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04/26/2020
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Publication #:
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Pub Dt:
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10/01/2020
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Title:
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OPTIMIZATION METHOD FOR INTEGRATED CIRCUIT WAFER TEST
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Assignee
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| FIRST FLOOR, BUILDING 2, NO. 351 GUOSHOUJING ROAD |
| PUDONG NEW AREA |
| SHANGHAI, CHINA |
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Correspondence name and address
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IPRO, PLLC
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12332 TOWNCENTER PLAZA
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PMB# 816
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STERLING, VA 20164
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04/28/2024 12:13 AM
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