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Reel/Frame:052662/0726   Pages: 10
Recorded: 05/14/2020
Attorney Dkt #:HITACHI5-1A
Conveyance: CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
Total properties: 31
1
Patent #:
10585089
Issue Dt:
03/10/2020
Application #:
15320406
Filing Dt:
12/20/2016
Publication #:
US20170160273
Pub Dt:
06/08/2017
Title:
ANALYSIS DEVICE AND ANALYSIS METHOD
2
Patent #:
NONE
Issue Dt:
Application #:
15326201
Filing Dt:
01/13/2017
Publication #:
US20170211032
Pub Dt:
07/27/2017
Title:
TEMPERATURE REGULATING CONTAINER
3
Patent #:
10793821
Issue Dt:
10/06/2020
Application #:
15544302
Filing Dt:
07/18/2017
Publication #:
US20180010084
Pub Dt:
01/11/2018
Title:
TEST DEVICE
4
Patent #:
10636620
Issue Dt:
04/28/2020
Application #:
15580231
Filing Dt:
12/06/2017
Publication #:
US20180151328
Pub Dt:
05/31/2018
Title:
CHARGED PARTICLE BEAM DEVICE AND CONTROL METHOD OF CHARGED PARTICLE BEAM DEVICE
5
Patent #:
10804084
Issue Dt:
10/13/2020
Application #:
15760498
Filing Dt:
03/15/2018
Publication #:
US20180254173
Pub Dt:
09/06/2018
Title:
VACUUM APPARATUS
6
Patent #:
10784074
Issue Dt:
09/22/2020
Application #:
15777121
Filing Dt:
05/17/2018
Publication #:
US20180350554
Pub Dt:
12/06/2018
Title:
CHARGED PARTICLE BEAM APPARATUS AND CONTROL METHOD THEREOF
7
Patent #:
11133153
Issue Dt:
09/28/2021
Application #:
16012423
Filing Dt:
06/19/2018
Publication #:
US20180301318
Pub Dt:
10/18/2018
Title:
ION MILLING DEVICE
8
Patent #:
11062892
Issue Dt:
07/13/2021
Application #:
16070790
Filing Dt:
07/18/2018
Publication #:
US20190027351
Pub Dt:
01/24/2019
Title:
CHARGED PARTICLE DETECTOR INCLUDING A LIGHT-EMITTING SECTION HAVING LAMINATION STRUCTURE, CHARGED PARTICLE BEAM DEVICE, AND MASS SPECTROMETER.
9
Patent #:
11377685
Issue Dt:
07/05/2022
Application #:
16071956
Filing Dt:
07/23/2018
Publication #:
US20190032126
Pub Dt:
01/31/2019
Title:
BASE SEQUENCE DETERMINATION APPARATUS, CAPILLARY ARRAY ELECTROPHORESIS APPARATUS, AND METHOD
10
Patent #:
10810733
Issue Dt:
10/20/2020
Application #:
16090991
Filing Dt:
10/03/2018
Publication #:
US20190139210
Pub Dt:
05/09/2019
Title:
DEFECT CLASSIFICATION APPARATUS AND DEFECT CLASSIFICATION METHOD
11
Patent #:
10692687
Issue Dt:
06/23/2020
Application #:
16251563
Filing Dt:
01/18/2019
Publication #:
US20190318906
Pub Dt:
10/17/2019
Title:
MEASUREMENT AND INSPECTION DEVICE
12
Patent #:
10770260
Issue Dt:
09/08/2020
Application #:
16260988
Filing Dt:
01/29/2019
Publication #:
US20190237296
Pub Dt:
08/01/2019
Title:
DEFECT OBSERVATION DEVICE
13
Patent #:
10977786
Issue Dt:
04/13/2021
Application #:
16261909
Filing Dt:
01/30/2019
Publication #:
US20190266713
Pub Dt:
08/29/2019
Title:
WAFER OBSERVATION DEVICE
14
Patent #:
11257654
Issue Dt:
02/22/2022
Application #:
16316289
Filing Dt:
01/08/2019
Publication #:
US20210287871
Pub Dt:
09/16/2021
Title:
ION MILLING APPARATUS
15
Patent #:
10768136
Issue Dt:
09/08/2020
Application #:
16319839
Filing Dt:
01/23/2019
Publication #:
US20190265187
Pub Dt:
08/29/2019
Title:
ELECTROLYTE CONCENTRATION MEASUREMENT DEVICE
16
Patent #:
10697767
Issue Dt:
06/30/2020
Application #:
16325590
Filing Dt:
02/14/2019
Publication #:
US20190178640
Pub Dt:
06/13/2019
Title:
SAMPLE FOR MEASURING PARTICLES, METHOD FOR MEASURING PARTICLES AND APPARATUS FOR MEASURING PARTICLES
17
Patent #:
10727024
Issue Dt:
07/28/2020
Application #:
16325613
Filing Dt:
02/14/2019
Publication #:
US20190214222
Pub Dt:
07/11/2019
Title:
CHARGED PARTICLE BEAM DEVICE AND ABERRATION CORRECTION METHOD FOR CHARGED PARTICLE BEAM DEVICE
18
Patent #:
10707047
Issue Dt:
07/07/2020
Application #:
16325662
Filing Dt:
02/14/2019
Publication #:
US20190206654
Pub Dt:
07/04/2019
Title:
MEASURING DEVICE AND MEASURING METHOD
19
Patent #:
NONE
Issue Dt:
Application #:
16328150
Filing Dt:
02/25/2019
Publication #:
US20190198284
Pub Dt:
06/27/2019
Title:
ELECTRON SOURCE AND ELECTRON BEAM IRRADIATION DEVICE
20
Patent #:
10861145
Issue Dt:
12/08/2020
Application #:
16329576
Filing Dt:
02/28/2019
Publication #:
US20190206047
Pub Dt:
07/04/2019
Title:
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
21
Patent #:
10724856
Issue Dt:
07/28/2020
Application #:
16330003
Filing Dt:
03/01/2019
Publication #:
US20190204247
Pub Dt:
07/04/2019
Title:
IMAGE ANALYSIS APPARATUS AND CHARGED PARTICLE BEAM APPARATUS
22
Patent #:
10720307
Issue Dt:
07/21/2020
Application #:
16332212
Filing Dt:
03/11/2019
Publication #:
US20190362933
Pub Dt:
11/28/2019
Title:
ELECTRON MICROSCOPE DEVICE AND INCLINED HOLE MEASUREMENT METHOD USING SAME
23
Patent #:
10872742
Issue Dt:
12/22/2020
Application #:
16337791
Filing Dt:
03/28/2019
Publication #:
US20200006032
Pub Dt:
01/02/2020
Title:
CHARGED PARTICLE BEAM DEVICE
24
Patent #:
10872411
Issue Dt:
12/22/2020
Application #:
16340401
Filing Dt:
04/09/2019
Publication #:
US20190236779
Pub Dt:
08/01/2019
Title:
DIAGNOSTIC IMAGING ASSISTANCE APPARATUS AND SYSTEM, AND DIAGNOSTIC IMAGING ASSISTANCE METHOD
25
Patent #:
NONE
Issue Dt:
11/22/2022
Application #:
16472129
Filing Dt:
06/20/2019
Publication #:
US20190316963
Pub Dt:
10/17/2019
Title:
AUTOMATED ANALYSIS DEVICE
26
Patent #:
11448638
Issue Dt:
09/20/2022
Application #:
16476860
Filing Dt:
07/09/2019
Publication #:
US20190353636
Pub Dt:
11/21/2019
Title:
CURRENT MEASUREMENT DEVICE AND CURRENT MEASUREMENT METHOD USING NANOPORE
27
Patent #:
11132788
Issue Dt:
09/28/2021
Application #:
16557175
Filing Dt:
08/30/2019
Publication #:
US20200074611
Pub Dt:
03/05/2020
Title:
PATTERN INSPECTION SYSTEM
28
Patent #:
10763074
Issue Dt:
09/01/2020
Application #:
16576252
Filing Dt:
09/19/2019
Publication #:
US20200013583
Pub Dt:
01/09/2020
Title:
CHARGED PARTICLE BEAM APPARATUS, OBSERVATION METHOD USING CHARGED PARTICLE BEAM APPARATUS, AND PROGRAM
29
Patent #:
11676268
Issue Dt:
06/13/2023
Application #:
16603445
Filing Dt:
10/07/2019
Title:
IMAGE DIAGNOSIS ASSISTING APPARATUS, IMAGE DIAGNOSIS ASSISTING SYSTEM AND IMAGE DIAGNOSIS ASSISTING METHOD
30
Patent #:
10830706
Issue Dt:
11/10/2020
Application #:
16616069
Filing Dt:
11/22/2019
Title:
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
31
Patent #:
10763078
Issue Dt:
09/01/2020
Application #:
16673456
Filing Dt:
11/04/2019
Publication #:
US20200066484
Pub Dt:
02/27/2020
Title:
CHARGED PARTICLE BEAM DEVICE AND IMAGE PROCESSING METHOD IN CHARGED PARTICLE BEAM DEVICE
Assignor
1
HITACHI HIGH-TECHNOLOGIES CORPORATION
Exec Dt:
02/12/2020
Assignee
1
HITACHI HIGH-TECH CORPORATION
17-1, TORANOMON 1-CHOME
MINATO-KU
TOKYO, JAPAN
Correspondence name and address
VOLPE AND KOENIG P.C.
30 SOUTH 17TH STREET
SUITE 1800
PHILADELPHIA, PA 19103

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