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Total properties:
11
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Patent #:
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Issue Dt:
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05/02/2017
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Application #:
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13921057
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Filing Dt:
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06/18/2013
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Publication #:
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Pub Dt:
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01/23/2014
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Title:
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PROBE CARD ANALYSIS SYSTEM AND METHOD
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Patent #:
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Issue Dt:
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01/03/2017
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Application #:
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14282565
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Filing Dt:
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05/20/2014
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Publication #:
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Pub Dt:
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09/11/2014
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Title:
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INSPECTION DEVICE WITH VERTICALLY MOVEABLE ASSEMBLY
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Patent #:
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Issue Dt:
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10/04/2016
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Application #:
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14758718
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Filing Dt:
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06/30/2015
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Publication #:
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Pub Dt:
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12/24/2015
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Title:
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EDGE GRIP SUBSTRATE HANDLER
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Patent #:
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Issue Dt:
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04/24/2018
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Application #:
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14762613
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Filing Dt:
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07/22/2015
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Publication #:
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Pub Dt:
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12/17/2015
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Title:
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ASSESSING ALIGNMENT OF TOP AND BOTTOM ENDS OF TSVs AND CHARACTERIZING MICROFABRICATION PROCESS
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Patent #:
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Issue Dt:
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01/08/2019
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Application #:
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14881847
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Filing Dt:
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10/13/2015
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Publication #:
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Pub Dt:
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04/14/2016
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Title:
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CALIBRATION OF SEMICONDUCTOR METROLOGY SYSTEMS
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Patent #:
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Issue Dt:
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03/07/2017
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Application #:
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15142864
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Filing Dt:
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04/29/2016
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Publication #:
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Pub Dt:
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08/18/2016
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Title:
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SYSTEM FOR DIRECTLY MEASURING THE DEPTH OF A HIGH ASPECT RATIO ETCHED FEATURE ON A WAFER
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Patent #:
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Issue Dt:
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09/10/2019
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Application #:
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15209218
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Filing Dt:
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07/13/2016
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Publication #:
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Pub Dt:
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12/01/2016
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Title:
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FOCUS ADJUSTMENT FOR SURFACE PART INSPECTION
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Patent #:
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Issue Dt:
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07/17/2018
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Application #:
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15601239
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Filing Dt:
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05/22/2017
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Publication #:
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Pub Dt:
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09/07/2017
| | | | |
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Title:
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SYSTEM AND METHOD OF CHARACTERIZING MICRO-FABRICATION PROCESSES
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Patent #:
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Issue Dt:
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05/26/2020
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Application #:
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15850869
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Filing Dt:
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12/21/2017
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Publication #:
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Pub Dt:
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06/21/2018
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Title:
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SUBSTRATE HANDLING AND IDENTIFICATION MECHANISM
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Patent #:
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Issue Dt:
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02/04/2020
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Application #:
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15933366
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Filing Dt:
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03/22/2018
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Publication #:
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Pub Dt:
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09/27/2018
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Title:
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INSPECTION OF SUBSTRATES
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Patent #:
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Issue Dt:
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04/26/2022
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Application #:
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16067748
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Filing Dt:
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07/02/2018
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Publication #:
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Pub Dt:
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01/17/2019
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Title:
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WAFER SINGULATION PROCESS CONTROL
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