Patent Assignment Details
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Reel/Frame: | 053140/0460 | |
| Pages: | 3 |
| | Recorded: | 07/07/2020 | | |
Attorney Dkt #: | 2269-15434(2020-0280.00) |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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01/17/2023
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Application #:
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16922458
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Filing Dt:
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07/07/2020
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Publication #:
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Pub Dt:
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01/13/2022
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Title:
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TESTING PROBE SYSTEM FOR TESTING SEMICONDUCTOR DIE, MULTI-CHANNEL DIE HAVING SHARED PADS, AND RELATED SYSTEMS AND METHODS
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Assignee
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8000 SOUTH FEDERAL WAY |
MAILSTOP 1-507 |
BOISE, IDAHO 83707-0006 |
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Correspondence name and address
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TRASK BRITT, P.C./ MICRON TECHNOLOGY
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P.O. BOX 2550
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SALT LAKE CITY, UT 84110
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05/09/2024 12:43 AM
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