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Total properties:
11
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Patent #:
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Issue Dt:
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08/17/2010
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Application #:
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11753886
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Filing Dt:
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05/25/2007
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Publication #:
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Pub Dt:
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07/24/2008
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Title:
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SEMICONDUCTOR DEVICE WITH ENHANCED SWITCHING SPEED AND METHOD FOR MANUFACTURING THE SAME
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Patent #:
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Issue Dt:
|
02/10/2015
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Application #:
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12504250
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Filing Dt:
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07/16/2009
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Publication #:
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Pub Dt:
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01/21/2010
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Title:
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POWER SEMICONDUCTOR DEVICE
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Patent #:
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Issue Dt:
|
10/13/2015
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Application #:
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13783081
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Filing Dt:
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03/01/2013
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Publication #:
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Pub Dt:
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12/05/2013
| | | | |
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Title:
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PROBE CARD
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Patent #:
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Issue Dt:
|
07/26/2016
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Application #:
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14346306
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Filing Dt:
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03/20/2014
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Publication #:
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Pub Dt:
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08/28/2014
| | | | |
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Title:
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FILM THICKNESS MEASUREMENT METHOD
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Patent #:
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Issue Dt:
|
08/01/2017
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Application #:
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14742222
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Filing Dt:
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06/17/2015
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Publication #:
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Pub Dt:
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04/28/2016
| | | | |
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Title:
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SEMICONDUCTOR EVALUATION APPARATUS AND SEMICONDUCTOR EVALUATION METHOD
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Patent #:
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Issue Dt:
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09/04/2018
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Application #:
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15136448
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Filing Dt:
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04/22/2016
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Publication #:
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Pub Dt:
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03/30/2017
| | | | |
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Title:
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APPARATUS AND METHOD FOR EVALUATING SEMICONDUCTOR DEVICE COMPRISING THERMAL IMAGE PROCESSING
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Patent #:
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Issue Dt:
|
06/12/2018
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Application #:
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15203846
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Filing Dt:
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07/07/2016
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Publication #:
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Pub Dt:
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05/18/2017
| | | | |
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Title:
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APPARATUS AND METHOD FOR EVALUATING SEMICONDUCTOR DEVICE
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|
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Patent #:
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|
Issue Dt:
|
01/09/2018
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Application #:
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15301488
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Filing Dt:
|
10/03/2016
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Publication #:
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Pub Dt:
|
02/09/2017
| | | | |
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Title:
|
SEMICONDUCTOR DEVICE MANUFACTURING METHOD
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|
|
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Patent #:
|
|
Issue Dt:
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11/20/2018
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Application #:
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15321245
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Filing Dt:
|
12/22/2016
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|
Publication #:
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Pub Dt:
|
07/13/2017
| | | | |
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Title:
|
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
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|
|
|
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Patent #:
|
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Issue Dt:
|
07/02/2019
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Application #:
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15324031
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Filing Dt:
|
01/05/2017
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|
Publication #:
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Pub Dt:
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07/13/2017
| | | | |
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Title:
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SEMICONDUCTOR DEVICE AND MULTIPHASE SEMICONDUCTOR DEVICE
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|
|
|
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Patent #:
|
|
Issue Dt:
|
07/23/2019
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Application #:
|
15375224
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Filing Dt:
|
12/12/2016
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|
Publication #:
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|
Pub Dt:
|
10/19/2017
| | | | |
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Title:
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DEVICE AND METHOD FOR INSPECTING POSITION OF PROBE, AND SEMICONDUCTOR EVALUATION APPARATUS
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|
