Patent Assignment Details
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| Reel/Frame: | 055535/0001 | |
| Pages: | 3 |
| | Recorded: | 03/09/2021 | | |
| Attorney Dkt #: | 79464.PA411 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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17196116
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Filing Dt:
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03/09/2021
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Publication #:
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Pub Dt:
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06/30/2022
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Title:
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DETECTION METHOD OF METAL IMPURITY IN WAFER
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Assignee
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| NO. 1000, YUNSHUI RD., NICHENG TOWN, PUDONG NEW AREA |
| SHANGHAI, CHINA 201306 |
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Correspondence name and address
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YING CHEN CHEN YOSHIMURA LLP
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750 W HAMILTON AVE
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UNIT C
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SAN PEDRO, CA 90731
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05/20/2024 06:27 PM
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