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Reel/Frame:055597/0969   Pages: 6
Recorded: 03/15/2021
Attorney Dkt #:JCGL109375-PCT
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
08/08/2023
Application #:
17275674
Filing Dt:
03/12/2021
Publication #:
Pub Dt:
02/10/2022
Title:
METHOD FOR TESTING LIFETIME OF SURFACE STATE CARRIER OF SEMICONDUCTOR
Assignors
1
Exec Dt:
03/08/2021
2
Exec Dt:
03/08/2021
3
Exec Dt:
03/08/2021
4
Exec Dt:
03/08/2021
5
Exec Dt:
03/08/2021
6
Exec Dt:
03/08/2021
7
Exec Dt:
03/08/2021
8
Exec Dt:
03/08/2021
Assignee
1
NO.1239 SIPING ROAD, YANGPU DISTRICT
SHANGHAI, CHINA 200092
Correspondence name and address
JCIP GLOBAL INC.
20 PACIFICA, SUITE 220
IRVINE, CA 92618

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