Patent Assignment Details
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For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 056556/0263 | |
| Pages: | 17 |
| | Recorded: | 06/11/2021 | | |
| Attorney Dkt #: | 53EH-301209-US |
| Conveyance: | EMPLOYMENT AGREEMENT-CONTRACT |
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Total properties:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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17206884
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Filing Dt:
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03/19/2021
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Publication #:
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Pub Dt:
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07/08/2021
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Title:
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METHOD AND APPARATUS FOR CLASSIFICATION OF WAFER DEFECT PATTERNS AS WELL AS STORAGE MEDIUM AND ELECTRONIC DEVICE
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Assignee
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| NO. 388, XINGYE AVENUE, AIRPORT INDUSTRIAL PARK |
| ECONOMIC AND TECHNOLOGICAL DEVELOPMENT AREA |
| HEFEI, ANHUI, CHINA 230601 |
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Correspondence name and address
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SHEPPARD MULLIN RICHTER & HAMPTON LLP
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379 LYTTON AVENUE
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ATTN: JING ZHENG
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PALO ALTO, CA 94301
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