Patent Assignment Details
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Reel/Frame: | 058019/0683 | |
| Pages: | 5 |
| | Recorded: | 11/04/2021 | | |
Attorney Dkt #: | 096275-1282313 |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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17518327
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Filing Dt:
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11/03/2021
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Publication #:
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Pub Dt:
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05/05/2022
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Title:
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IN-SITU X-RAY DIFFRACTION ANALYSIS APPARATUS INCLUDING PELTIER-TYPE TEMPERATURE CONTROL UNIT AND ANALYZING METHOD USING THE SAME
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Assignees
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1, GWANAK-RO, GWANAK-GU |
SEOUL, KOREA, REPUBLIC OF 08826 |
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55, EXPO-RO, YUSEONGGU |
DAEJEON, KOREA, REPUBLIC OF 34126 |
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99, DAEHAK-RO, YUSEONG-GU |
DAEJEON, KOREA, REPUBLIC OF 34134 |
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Correspondence name and address
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KILPATRICK TOWNSEND & STOCKTON LLP
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1100 PEACHTREE STREET
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SUITE 2800
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ATLANTA, GA 30309
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