Patent Assignment Details
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| Reel/Frame: | 059216/0182 | |
| Pages: | 5 |
| | Recorded: | 03/09/2022 | | |
| Attorney Dkt #: | BC22001CN_LYP02110038P-US |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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17626819
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Filing Dt:
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01/13/2022
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Publication #:
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Pub Dt:
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11/03/2022
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Title:
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Detection Method for the Radiation-induced Defects of Oxide Layer in Electronic Devices
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Assignee
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| NO.92 XIDAZHI STREET, NANGANG DISTRICT, HEILONGJIANG |
| HARBIN, CHINA 150000 |
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Correspondence name and address
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ANGELA HUANG
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19925 STEVENS CREEK BLVD., STE. 100
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CUPERTINO, CA 95014
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05/09/2024 02:49 AM
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