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Reel/Frame:059892/0376   Pages: 2
Recorded: 05/11/2022
Attorney Dkt #:118247.PF289US
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
NONE
Issue Dt:
Application #:
17634805
Filing Dt:
02/11/2022
Publication #:
Pub Dt:
09/01/2022
Title:
Measurement System, Method for Generating Learning Model to Be Used When Performing Image Measurement of Semiconductor Including Predetermined Structure, and Recording Medium for Storing Program for Causing Computer to Execute Processing for Generating Learning Model to Be Used When Performing Image Measurement of Semiconductor Including Predetermined Structure
Assignors
1
Exec Dt:
12/10/2021
2
Exec Dt:
12/10/2021
3
Exec Dt:
12/10/2021
Assignee
1
17-1, TORANOMON 1-CHOME
MINATO-KU, TOKYO, JAPAN
Correspondence name and address
CROWELL & MORING LLP INTELLECTUAL PROPER
P.O. BOX 14300
WASHINGTON, DC 20044-4300

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