Patent Assignment Details
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| Reel/Frame: | 060987/0287 | |
| Pages: | 3 |
| | Recorded: | 09/05/2022 | | |
| Attorney Dkt #: | 120201-US-871 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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17902899
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Filing Dt:
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09/05/2022
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Publication #:
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Pub Dt:
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03/30/2023
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Title:
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METHOD FOR INSPECTING CHEMICAL SOLUTION, METHOD FOR PRODUCING CHEMICAL SOLUTION, METHOD FOR CONTROLLING CHEMICAL SOLUTION, METHOD FOR PRODUCING SEMICONDUCTOR DEVICE, METHOD FOR INSPECTING RESIST COMPOSITION, METHOD FOR PRODUCING RESIST COMPOSITION, METHOD FOR CONTROLLING RESIST COMPOSITION, AND METHOD FOR CHECKING CONTAMINATION STATUS OF SEMICONDUCTOR MANUFACTURING APPARATUS
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Assignee
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| 26-30, NISHIAZABU 2-CHOME, MINATO-KU, |
| TOKYO, JAPAN 106-8620 |
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Correspondence name and address
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JCIPRNET
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8F-1, NO. 100, ROOSEVELT RD. SEC. 2,
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TAIPEI, 100404 TAIWAN
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