Patent Assignment Details
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| Reel/Frame: | 062417/0787 | |
| Pages: | 7 |
| | Recorded: | 01/19/2023 | | |
| Attorney Dkt #: | POL-13964 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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18016882
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Filing Dt:
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01/19/2023
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Publication #:
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Pub Dt:
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08/31/2023
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Title:
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SEMICONDUCTOR INSPECTION DEVICE AND METHOD FOR INSPECTING SEMICONDUCTOR SAMPLE
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Assignee
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| 17-1, TORANOMON 1-CHOME, MINATO-KU, |
| TOKYO, JAPAN 105-6409 |
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Correspondence name and address
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MATTINGLY & MALUR, PC
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1800 DIAGONAL ROAD, SUITE 210
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ALEXANDRIA, VA 22314
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05/06/2024 08:57 AM
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