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Patent Assignment Details
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Reel/Frame:013639/0010   Pages: 2
Recorded: 01/02/2003
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
09/13/2005
Application #:
10334784
Filing Dt:
01/02/2003
Publication #:
Pub Dt:
03/25/2004
Title:
DEFORMATION MEASURING METHOD AND APPARATUS USING ELECTRONIC SPECKLE PATTERN INTERFEROMETRY
Assignors
1
Exec Dt:
12/24/2002
2
Exec Dt:
12/24/2002
Assignee
1
255, SHIMOOKUBO
SAITAMA-SHI, SAITAMA, JAPAN 338-8570
Correspondence name and address
RONALD R. SNIDER
POST OFFICE BOX 27613
WASHINGTON, D.C. 20038-7613

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