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Patent Assignment Details
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Reel/Frame:016690/0011   Pages: 3
Recorded: 06/13/2005
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
NONE
Issue Dt:
Application #:
11151613
Filing Dt:
06/13/2005
Publication #:
Pub Dt:
06/01/2006
Title:
Process and device of high voltage test with detecting function for short/open circuit
Assignors
1
Exec Dt:
03/10/2005
2
Exec Dt:
03/10/2005
3
Exec Dt:
03/10/2005
Assignee
1
66 HWA-YA I RD.
HWA-YA TECHNICAL PARK, KUEI-SHAN HSIANG
TAOYUAN HSIEN, TAIWAN R.O.C.
Correspondence name and address
BUCKNAM AND ARCHER
1077 NORTHERN BOULEVARD
ROSLYN, NY 11576

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