Patent Assignment Details
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Reel/Frame: | 019856/0034 | |
| Pages: | 4 |
| | Recorded: | 09/20/2007 | | |
Attorney Dkt #: | CU-6055 WWP/NK |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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03/08/2011
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Application #:
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11858313
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Filing Dt:
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09/20/2007
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Publication #:
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Pub Dt:
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03/27/2008
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Title:
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METHOD OF IDENTIFYING CRYSTAL DEFECT REGION IN MONOCRYSTALLINE SILICON USING METAL CONTAMINATION AND HEAT TREATMENT
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Assignee
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274 IMSU-DONG, GUMI-SI |
GYEONGSANGBUK-DO, KOREA, REPUBLIC OF 730-724 |
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Correspondence name and address
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RICHARD J. STREIT
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LADAS & PARRY, 224 SOUTH MICHIGAN AVE.
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CHICAGO, IL 60604
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