Patent Assignment Details
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Reel/Frame: | 015349/0040 | |
| Pages: | 3 |
| | Recorded: | 05/18/2004 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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06/17/2008
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Application #:
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10848250
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Filing Dt:
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05/18/2004
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Publication #:
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Pub Dt:
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01/13/2005
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Title:
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REFERENCE PATTERN FOR CREATING A DEFECT RECOGNITION LEVEL, METHOD OF FABRICATING THE SAME AND METHOD OF INSPECTING DEFECTS USING THE SAME
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Assignee
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416, MAETAN-DONG, YEONGTONG-GU |
SUWON-SI |
GYEONGGI-DO, KOREA, REPUBLIC OF |
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Correspondence name and address
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F. CHAU & ASSOCIATES, LLC
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FRANK CHAU, ESQ.
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1900 HEMPSTEAD TURNPIKE, SUITE 501
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EAST MEADOW, NY 11554
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