Patent Assignment Details
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Reel/Frame: | 010207/0045 | |
| Pages: | 4 |
| | Recorded: | 08/16/1999 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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12/04/2001
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Application #:
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09347498
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Filing Dt:
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07/02/1999
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Title:
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METHOD OF ANALYZING SEMICONDUCTOR SURFACE WITH PATTERNED FEATURE USING LINE WIDTH METROLOGY
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Assignee
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P.O. BOX 636 |
600 MOUNTAIN AVENUE |
MURRAY HILL, NEW JERSEY 07974 |
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Correspondence name and address
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ALLEN, DYER, DOPPELT, MILBRATH ET AL.
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RICHARD K. WARTHER, ESQ.
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255 S. ORANGE AVE.
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P.O. BOX 3791
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ORLANDO, FLORIDA 32802
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