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Reel/Frame:019853/0061   Pages: 4
Recorded: 09/20/2007
Attorney Dkt #:60291.000056
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
NONE
Issue Dt:
Application #:
11576639
Filing Dt:
11/26/2007
Publication #:
Pub Dt:
05/01/2008
Title:
Electrical Measurement Of The Thickness Of A Semiconductor Layer
Assignors
1
Exec Dt:
08/30/2007
2
Exec Dt:
08/30/2007
3
Exec Dt:
08/30/2007
4
Exec Dt:
08/31/2007
5
Exec Dt:
08/16/2007
Assignee
1
HAARBERGSTR. 67
ERFURT, GERMANY 99097
Correspondence name and address
HUNTON & WILLIAMS LLP
1900 K STREET, NW
SUITE 1200
WASHINGTON, DC 20006

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