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Patent Assignment Details
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Reel/Frame:017854/0062   Pages: 18
Recorded: 06/29/2006
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
01/18/2011
Application #:
11335099
Filing Dt:
01/18/2006
Publication #:
Pub Dt:
07/20/2006
Title:
END POINT DETECTION METHOD FOR PLASMA ETCHING OF SEMICONDUCTOR WAFERS WITH LOW EXPOSED AREA
Assignors
1
Exec Dt:
04/12/2006
2
Exec Dt:
06/16/2006
3
Exec Dt:
05/13/2006
4
Exec Dt:
05/01/2006
Assignee
1
4637 CHABOT DRIVE
PLEASANTON, CALIFORNIA 94588
Correspondence name and address
MICHAEL W. CALDWELL
4226 RIVERMARK PARKWAY
SANTA CLARA, CA 95054

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