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Reel/Frame:037947/0069   Pages: 4
Recorded: 03/10/2016
Attorney Dkt #:ANCHP002
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
12/19/2017
Application #:
15066280
Filing Dt:
03/10/2016
Publication #:
Pub Dt:
10/13/2016
Title:
PATTERN WEAKNESS AND STRENGTH DETECTION AND TRACKING DURING A SEMICONDUCTOR DEVICE FABRICATION PROCESS
Assignors
1
Exec Dt:
03/07/2016
2
Exec Dt:
03/07/2016
3
Exec Dt:
03/07/2016
4
Exec Dt:
03/07/2016
5
Exec Dt:
03/07/2016
6
Exec Dt:
03/07/2016
7
Exec Dt:
03/07/2016
8
Exec Dt:
03/07/2016
9
Exec Dt:
03/07/2016
Assignee
1
3235 KIFER ROAD
SUITE 200
SANTA CLARA, CALIFORNIA 95051
Correspondence name and address
VAN PELT, YI AND JAMES LLP
10050 N. FOOTHILL BLVD
STE 200
CUPERTINO, CA 95014

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