Patent Assignment Details
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Reel/Frame: | 010772/0081 | |
| Pages: | 5 |
| | Recorded: | 04/30/2000 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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04/02/2002
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Application #:
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09560935
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Filing Dt:
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04/30/2000
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Title:
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Method of determining the impact of plasma-charging damage on yield and reliablity in submicron integrated circuits
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Assignee
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600 MOUNTAIN AVENUE |
MURRAY HILL, NEW JERSEY 07974 |
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Correspondence name and address
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HITT CHWANG & GAINES, P.C.
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CHARLES W. GAINES
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P.O. BOX 832570
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RICHARDSON, TEXAS 75083
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