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Patent Assignment Details
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Reel/Frame:035760/0085   Pages: 7
Recorded: 05/24/2015
Conveyance: CONFIRMATORY ASSIGNMENT
Total properties: 2
1
Patent #:
Issue Dt:
05/29/2001
Application #:
08859592
Filing Dt:
05/20/1997
Title:
METHOD FOR INSPECTING AN INTEGRATED CIRCUIT
2
Patent #:
Issue Dt:
09/07/2004
Application #:
09819287
Filing Dt:
03/28/2001
Publication #:
Pub Dt:
08/16/2001
Title:
METHOD AND APPARATUS FOR INSPECTING AN INTEGRATED CIRCUIT BY MEASURING VOLTAGE ON A SIGNAL LINE
Assignors
1
Exec Dt:
05/22/2015
2
Exec Dt:
05/22/2015
Assignee
1
100 EAST 42ND STREET
NEW YORK, NEW YORK 10017
Correspondence name and address
DAVID L. SCHAEFFER
411 EAST PLUMERIA DRIVE, MS41
NXP SEMICONDUCTORS, IP&L
SAN JOSE, CA 95134

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