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Patent Assignment Details
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Reel/Frame:018454/0090   Pages: 8
Recorded: 10/30/2006
Attorney Dkt #:122242.168919
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 5
1
Patent #:
Issue Dt:
01/24/1995
Application #:
08063109
Filing Dt:
05/17/1993
Title:
DEPTH MEASUREMENT OF HIGH ASPECT RATIO STRUCTURES
2
Patent #:
Issue Dt:
02/21/1995
Application #:
08125955
Filing Dt:
09/22/1993
Title:
METHOD FOR MEASURING A TRENCH DEPTH PARAMETER OF A MATERIAL
3
Patent #:
Issue Dt:
05/28/2002
Application #:
09363350
Filing Dt:
07/29/1999
Title:
A METHOD AND DEVICE FOR SIMULTANEOUSLY MEASURING MULTIPLE PROPERTIES OF MULTILAYER FILMS
4
Patent #:
Issue Dt:
07/01/2003
Application #:
09568286
Filing Dt:
05/10/2000
Title:
OPTICAL METHOD FOR MEASURING THIN METAL FILMS
5
Patent #:
Issue Dt:
11/02/2004
Application #:
09874420
Filing Dt:
06/05/2001
Publication #:
Pub Dt:
12/05/2002
Title:
SAMPLE POSITIONING METHOD FOR SURFACE OPTICAL DIAGNOSTICS USING VIDEO IMAGING
Assignor
1
Exec Dt:
10/05/2006
Assignee
1
12 MICHIGAN DRIVE
NATICK, MASSACHUSETTS 01760
Correspondence name and address
DANA BREITMAN
599 LEXINGTON AVENUE
GOODWIN PROCTER LLP
NEW YORK, NY 10022

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