Patent Assignment Details
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Reel/Frame: | 020068/0097 | |
| Pages: | 3 |
| | Recorded: | 11/05/2007 | | |
Attorney Dkt #: | 02887.0472 |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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03/31/2009
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Application #:
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11889765
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Filing Dt:
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08/16/2007
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Publication #:
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Pub Dt:
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02/28/2008
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Title:
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DEFECT INSPECTING APPARATUS FOR SEMICONDUCTOR WAFER
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Assignee
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1-1, SHIBAURA 1-CHOME |
MINATO-KU, TOKYO, JAPAN |
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Correspondence name and address
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FINNEGAN HENDERSON
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901 NEW YORK AVENUE, NW
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WASHINGTON, DC 20001
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