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Reel/Frame:025436/0135   Pages: 8
Recorded: 12/02/2010
Attorney Dkt #:1003-1063.1
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
05/07/2013
Application #:
12958420
Filing Dt:
12/02/2010
Publication #:
Pub Dt:
06/07/2012
Title:
FAST MEASUREMENT OF X-RAY DIFFRACTION FROM TILTED LAYERS
Assignors
1
Exec Dt:
11/25/2010
2
Exec Dt:
11/25/2010
3
Exec Dt:
11/25/2010
4
Exec Dt:
11/30/2010
5
Exec Dt:
11/25/2010
6
Exec Dt:
11/25/2010
7
Exec Dt:
11/30/2010
8
Exec Dt:
11/29/2010
Assignee
1
P.O. BOX 103
MIGDAL HAEMEK, ISRAEL 23100
Correspondence name and address
D. KLIGLER I.P. SERVICES LTD.
P.O. BOX 33111
TEL AVIV, 61330 ISRAEL

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