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Total properties:
31
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|
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Patent #:
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|
Issue Dt:
|
10/03/1989
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Application #:
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07206091
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Filing Dt:
|
06/13/1988
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Title:
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POSITIONING DEVICE FOR A SCANNING TUNNELING MICROSCOPE
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|
|
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Patent #:
|
|
Issue Dt:
|
03/12/1991
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Application #:
|
07405660
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Filing Dt:
|
09/11/1989
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Title:
|
SYSTEM FOR SCANNING LARGE SAMPLE AREAS WITH A SCANNING PROBE MICROSCOPE
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|
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Patent #:
|
|
Issue Dt:
|
06/25/1991
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Application #:
|
07442256
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Filing Dt:
|
11/28/1989
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Title:
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COMPACT ATOMIC FORCE MICROSCOPE
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|
|
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Patent #:
|
|
Issue Dt:
|
09/04/1990
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Application #:
|
07445280
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Filing Dt:
|
12/04/1989
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Title:
|
METHOD TO INCREASE THE SPEED OF A SCANNING PROBE MICROSCOPE
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|
|
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Patent #:
|
|
Issue Dt:
|
04/13/1993
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Application #:
|
07452841
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Filing Dt:
|
12/20/1989
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|
Title:
|
SCANNING ELECTROCHEMICAL MICROSCOPY
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|
|
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Patent #:
|
|
Issue Dt:
|
11/19/1991
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Application #:
|
07510612
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Filing Dt:
|
04/18/1990
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Title:
|
SCANNING TUNNELING MICROSCOPES WITH CORRECTION FOR COUPLING EFFECTS
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|
|
|
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Patent #:
|
|
Issue Dt:
|
04/07/1992
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Application #:
|
07527559
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Filing Dt:
|
05/23/1990
|
|
Title:
|
A SCANNING PROBE MICROSCOPE EMPLOYING ADJUSTABLE TILT AND A UNITARY HEAD
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|
|
|
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Patent #:
|
|
Issue Dt:
|
12/31/1991
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Application #:
|
07558225
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Filing Dt:
|
07/26/1990
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|
Title:
|
DRIFT COMPENSATION FOR SCANNING PROBE MICROSCOPES USING AN ENHANCED PROBE POSITIONING SYSTEM
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|
|
|
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Patent #:
|
|
Issue Dt:
|
01/14/1992
|
Application #:
|
07565713
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Filing Dt:
|
08/13/1990
|
|
Title:
|
METHOD OF OPERATING A SCANNING PROBE MICROSCOPE TO IMPROVE DRIFT CHARACTERISTICS
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|
|
|
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Patent #:
|
|
Issue Dt:
|
09/24/1991
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Application #:
|
07622353
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Filing Dt:
|
11/29/1990
|
|
Title:
|
METHOD OF DRIVING A PIEZOELECTRIC SCANNER LINEARLY WITH TIME
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|
|
|
|
Patent #:
|
|
Issue Dt:
|
03/02/1993
|
Application #:
|
07687684
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Filing Dt:
|
04/19/1991
|
|
Title:
|
COMPACT ATOMIC FORCE MICROSCOPE
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|
|
|
|
Patent #:
|
|
Issue Dt:
|
03/30/1993
|
Application #:
|
07793245
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Filing Dt:
|
11/12/1991
|
|
Title:
|
SCANNER FOR SCANNING PROBE MICROSCOPES HAVING REDUCED Z-AXIS NON-LINEARITY
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|
|
|
|
Patent #:
|
|
Issue Dt:
|
04/20/1993
|
Application #:
|
07835577
|
Filing Dt:
|
02/14/1992
|
|
Title:
|
METHOD OF ADJUSTING THE SIZE OF THE AREA SCANNED BY A SCANNING PROBE
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|
|
|
|
Patent #:
|
|
Issue Dt:
|
10/19/1993
|
Application #:
|
07883043
|
Filing Dt:
|
05/07/1992
|
|
Title:
|
ATOMIC FORCE MICROSCOPE FOR SMALL SAMPLES HAVING DUAL-MODE OPERATING CAPABILITY
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|
|
|
|
Patent #:
|
|
Issue Dt:
|
05/09/1995
|
Application #:
|
07926175
|
Filing Dt:
|
08/07/1992
|
|
Title:
|
A TAPPING ATOMIC FORCE MICROSCOPE
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|
|
|
|
Patent #:
|
|
Issue Dt:
|
04/26/1994
|
Application #:
|
07947831
|
Filing Dt:
|
09/21/1992
|
|
Title:
|
POSITIONING DEVICE FOR SCANNING PROBE MICROSCOPES
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
05/24/1994
|
Application #:
|
07970875
|
Filing Dt:
|
11/03/1992
|
|
Title:
|
STIFFNESS ENHANCER FOR MOVABLE STAGE ASSEMBLY
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
03/28/1995
|
Application #:
|
07974603
|
Filing Dt:
|
11/12/1992
|
|
Title:
|
METHODS OF OPERATING ATOMIC FORCE MICROSCOPES TO MEASURE FRICTION
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
05/03/1994
|
Application #:
|
07982871
|
Filing Dt:
|
11/30/1992
|
|
Title:
|
AN IMPROVED SCANNING PROBE MICROSCOPE USING STORED DATA FOR VERTICAL PROBE POSITIONING
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
11/07/1995
|
Application #:
|
08107017
|
Filing Dt:
|
08/17/1993
|
|
Title:
|
SCANNING STYLUS ATOMIC FORCE MICROSCOPE WITH CANTILEVER TRACKING AND OPTICAL ACCESS
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
05/23/1995
|
Application #:
|
08202287
|
Filing Dt:
|
02/25/1994
|
|
Title:
|
SCANNING PROBE MICROSCOPE USING STORED DATA FOR VERTICAL PROBE POSITIONING
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
10/01/1996
|
Application #:
|
08416100
|
Filing Dt:
|
04/04/1995
|
|
Title:
|
SCANNING STYLUS ATOMIC FORCE MICROSCOPE WITH CANTILEVER TRACKING AND OPTICAL ACCESS
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
09/10/1996
|
Application #:
|
08502368
|
Filing Dt:
|
07/14/1995
|
|
Title:
|
METHODS OF OPERATING ATOMIC FORCE MICROSCOPES TO MEASURE FRICTION
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
01/06/1998
|
Application #:
|
08521584
|
Filing Dt:
|
08/30/1995
|
|
Title:
|
SCANNING PROBE MICROSCOPE HAVING AUTOMATIC PROBE EXCHANGE AND ALIGNMENT
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
02/03/1998
|
Application #:
|
08679332
|
Filing Dt:
|
07/11/1996
|
|
Title:
|
SCANNING STYLUS ATOMIC FORCE MICROSCOPE WITH CANTILEVER TRACKING AND OPTICAL ACCESS
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
02/02/1999
|
Application #:
|
08794379
|
Filing Dt:
|
02/04/1997
|
|
Title:
|
METHOD AND APPARATUS FOR MEASURING MECHANICAL PROPERTIES ON A SMALL SCALE
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
01/09/2001
|
Application #:
|
08892746
|
Filing Dt:
|
07/15/1997
|
|
Title:
|
CAPACITANCE ATOMIC FORCE MICROSCOPES AND METHODS OF OPERATING SUCH MICROSCOPES
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
03/21/2000
|
Application #:
|
08898469
|
Filing Dt:
|
07/22/1997
|
|
Title:
|
METHOD AND APPARATUS FOR MEASURING ENERGY DISSIPATION BY A PROBE DURING OPERATION OF AN ATOMIC FORCE MICROSCOPE
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
04/27/1999
|
Application #:
|
08937494
|
Filing Dt:
|
09/25/1997
|
|
Title:
|
METHOD AND APPARATUS FOR OBTAINING IMPROVED VERTICAL METROLOGY MEASUREMENTS
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
12/28/1999
|
Application #:
|
08984058
|
Filing Dt:
|
12/03/1997
|
|
Title:
|
METHOD FOR IMPROVING THE OPERATION OF OSCILLATING MODE ATOMIC FORCE MICROSCOPES
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
03/07/2000
|
Application #:
|
09119549
|
Filing Dt:
|
07/20/1998
|
|
Title:
|
SCANNING STYLUS ATOMIC FORCE MICROSCOPE WITH CANTILEVER TRACKING AND OPTICAL ACCESS
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|
