Patent Assignment Details
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Reel/Frame: | 005262/0174 | |
| Pages: | 1 |
| | Recorded: | 02/28/1990 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST. |
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Total properties:
1
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Patent #:
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Issue Dt:
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06/16/1992
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Application #:
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07448202
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Filing Dt:
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12/08/1989
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Title:
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MEANS FOR MEASURING THE DEPTH INTERACTION OF GAMMA-RAYS IN SCINTILLATION CRYSTALS IN ORDER TO IMPROVE THE SPATIAL RESOLUTION OF POSITRON IMAGING SYSTEMS
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Correspondence name and address
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OLIFF & BERRIDGE
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P.O. BOX 19928
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ALEXANDRIA, VA 22320
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