Patent Assignment Details
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Reel/Frame: | 004671/0183 | |
| Pages: | 1 |
| | Recorded: | 02/17/1987 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST. |
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Total properties:
1
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Patent #:
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Issue Dt:
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08/29/1989
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Application #:
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07015039
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Filing Dt:
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02/17/1987
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Title:
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METHOD FOR PREDICTING DENSITY OF MICRO CRYSTAL DEFECTS IN SEMICONDUCTOR ELEMENT FROM SILICON WAFER USED IN THE MANUFACTURE OF THE ELEMENT, AND INFRARED ABSORPTION MEASUREMENT APPARATUS FOR THIS METHOD
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Assignee
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72 HORIKAWA-CHO, SAIWAI-KU |
KAWASAKI-SHI, JAPAN |
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Correspondence name and address
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FINNEGAN, HENDERSON, FARABOW,
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GARRETT & DUNNER
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1775 K STREET, N. W.
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WASHINGTON, DC 20006
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