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Total properties:
22
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Patent #:
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Issue Dt:
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09/29/1987
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Application #:
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06605462
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Filing Dt:
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04/30/1984
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Title:
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WAFER PROBE
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Patent #:
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Issue Dt:
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08/16/1988
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Application #:
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06928987
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Filing Dt:
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11/10/1986
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Title:
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WAFER PROBE
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Patent #:
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Issue Dt:
|
05/02/1989
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Application #:
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07008847
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Filing Dt:
|
01/30/1987
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Title:
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WAFER PROBE
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Patent #:
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Issue Dt:
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08/15/1989
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Application #:
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07169844
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Filing Dt:
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03/18/1988
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Title:
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SYSTEM FOR SETTING REFERENCE REACTANCE FOR VECTOR CORRECTED MEASUREMENTS
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Patent #:
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Issue Dt:
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08/08/1989
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Application #:
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07212309
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Filing Dt:
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06/27/1988
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Title:
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COAXIAL TRANSMISSION LINE TO MICROSTRIP TRANSMISSION LINE LAUNCHER
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Patent #:
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Issue Dt:
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03/05/1991
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Application #:
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07262463
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Filing Dt:
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10/25/1988
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Title:
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NOISE PARAMETER TEST METHOD AND APPARATUS
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Patent #:
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Issue Dt:
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07/18/1989
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Application #:
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07267397
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Filing Dt:
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11/04/1988
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Title:
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MICROWAVE WAFER PROBE HAVING REPLACEABLE PROBE TIP
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Patent #:
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Issue Dt:
|
01/02/1990
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Application #:
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07267398
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Filing Dt:
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11/04/1988
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Title:
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OVERLAP INTERFACES BETWEEN COPLANAR TRANSMISSION LINES WHICH ARE TOLERANT TO TRANSVERSE AND LONGITUDINAL MISALIGNMENT
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Patent #:
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Issue Dt:
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09/05/1989
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Application #:
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07269970
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Filing Dt:
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11/09/1988
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Title:
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METHOD OF COMPENSATING FOR FREQUENCY ERRORS IN NOISE POWER METERS
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Patent #:
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Issue Dt:
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02/27/1990
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Application #:
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07333633
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Filing Dt:
|
04/05/1989
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Title:
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NOISE PARAMETER DETERMINATION METHOD
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|
|
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Patent #:
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|
Issue Dt:
|
04/09/1991
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Application #:
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07364091
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Filing Dt:
|
06/08/1989
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Title:
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HIGH-FREQUENCY ACTIVE PROBE HAVING REPLACEABLE CONTACT NEEDLES
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Patent #:
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|
Issue Dt:
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09/10/1991
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Application #:
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07443213
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Filing Dt:
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11/28/1989
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Title:
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VERIFICATION AND CORRECTION METHOD FOR AN ERROR MODEL FOR A MEASUREMENT NETWORK
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Patent #:
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Issue Dt:
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02/19/1991
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Application #:
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07491569
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Filing Dt:
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03/09/1990
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Title:
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SYSTEM FOR FACILITATING PLANAR PROBE MEASUREMENTS OF HIGH-SPEED INTERCONNECT STRUCTURES
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Patent #:
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Issue Dt:
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04/30/1991
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Application #:
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07535737
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Filing Dt:
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06/08/1990
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Title:
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ELECTRICAL PROBE WITH CONTACT FORCE PROTECTION
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|
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Patent #:
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Issue Dt:
|
11/26/1991
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Application #:
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07539732
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Filing Dt:
|
06/18/1990
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|
Title:
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NOISE PARAMETER TEST APPARATUS
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|
|
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Patent #:
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|
Issue Dt:
|
09/03/1991
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Application #:
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07663708
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Filing Dt:
|
03/04/1991
|
|
Title:
|
HIGH-FREQUENCY ACTIVE PROBE HAVING REPLACEABLE CONTACT NEEDLES
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|
|
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Patent #:
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|
Issue Dt:
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03/31/1992
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Application #:
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07725978
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Filing Dt:
|
07/05/1991
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|
Title:
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FIBER OPTIC WAFER PROBE
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|
|
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Patent #:
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|
Issue Dt:
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10/27/1992
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Application #:
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07727566
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Filing Dt:
|
07/09/1991
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|
Title:
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METHOD FOR MEASURING THE ELECTRICAL AND OPTIC PERFORMANCE OF ON-WAFER MICROWAVE DEVICES
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|
|
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Patent #:
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Issue Dt:
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08/17/1993
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Application #:
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07890970
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Filing Dt:
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05/29/1992
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Title:
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WAFER PROBE STATION HAVING AUXILIARY CHUCKS
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|
|
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Patent #:
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Issue Dt:
|
11/30/1993
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Application #:
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07891232
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Filing Dt:
|
05/29/1992
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Title:
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WAFER PROBE STATION WITH INTEGRATED ENVIRONMENT CONTROL ENCLOSURE
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|
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Patent #:
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Issue Dt:
|
09/06/1994
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Application #:
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07896853
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Filing Dt:
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06/11/1992
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Title:
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WAFER PROBE STATION HAVING INTEGRATED GUARDING, KELVIN CONNECTION AND SHIELDING SYSTEMS
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|
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Patent #:
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|
Issue Dt:
|
11/23/1993
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Application #:
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07898015
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Filing Dt:
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06/12/1992
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|
Title:
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ADJUSTABLE STRAP IMPLEMENTED RETURN LINE FOR A PROBE STATION
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