Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 037820/0200 | |
| Pages: | 4 |
| | Recorded: | 02/15/2016 | | |
| Attorney Dkt #: | 1003-1001 |
| Conveyance: | CHANGE OF NAME (SEE DOCUMENT FOR DETAILS). |
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Total properties:
9
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Patent #:
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Issue Dt:
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07/12/2016
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Application #:
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13647408
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Filing Dt:
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10/09/2012
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Publication #:
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Pub Dt:
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04/11/2013
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Title:
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X-RAY INSPECTION OF BUMPS ON A SEMICONDUCTOR SUBSTRATE
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Patent #:
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Issue Dt:
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07/12/2016
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Application #:
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14222635
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Filing Dt:
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03/23/2014
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Publication #:
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Pub Dt:
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09/25/2014
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Title:
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ESTIMATION OF XRF INTENSITY FROM AN ARRAY OF MICRO-BUMPS
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Patent #:
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Issue Dt:
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01/24/2017
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Application #:
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14555613
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Filing Dt:
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11/27/2014
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Publication #:
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Pub Dt:
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07/23/2015
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Title:
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ANGLE CALIBRATION FOR GRAZING-INCIDENCE X-RAY FLUORESCENCE (GIXRF)
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Patent #:
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Issue Dt:
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05/30/2017
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Application #:
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14565474
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Filing Dt:
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12/10/2014
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Publication #:
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Pub Dt:
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08/27/2015
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Title:
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X-RAY SOURCE ASSEMBLY
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Patent #:
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Issue Dt:
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04/25/2017
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Application #:
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14708323
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Filing Dt:
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05/11/2015
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Publication #:
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Pub Dt:
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11/19/2015
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Title:
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METHOD FOR ACCURATELY DETERMINING THE THICKNESS AND/OR ELEMENTAL COMPOSITION OF SMALL FEATURES ON THIN-SUBSTRATES USING MICRO-XRF
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Patent #:
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Issue Dt:
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03/28/2017
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Application #:
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14735162
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Filing Dt:
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06/10/2015
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Publication #:
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Pub Dt:
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12/24/2015
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Title:
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X-RAY SCATTEROMETRY APPARATUS
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Patent #:
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Issue Dt:
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08/08/2017
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Application #:
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14735168
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Filing Dt:
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06/10/2015
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Publication #:
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Pub Dt:
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12/24/2015
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Title:
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USING MULTIPLE SOURCES/DETECTORS FOR HIGH-THROUGHPUT X-RAY TOPOGRAPHY MEASUREMENT
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Patent #:
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Issue Dt:
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08/29/2017
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Application #:
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14849647
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Filing Dt:
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09/10/2015
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Title:
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X-RAY TUBE ANODE
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Patent #:
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Issue Dt:
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11/28/2017
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Application #:
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14922220
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Filing Dt:
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10/26/2015
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Publication #:
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Pub Dt:
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05/05/2016
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Title:
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MEASUREMENT OF SMALL FEATURES USING XRF
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Assignee
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| P.O. BOX 103 |
| MIGDAL HAEMEK, ISRAEL 23100 |
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Correspondence name and address
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D. KLIGLER I.P. SERVICES LTD.
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P.O. BOX 57651
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TEL AVIV, 61576 ISRAEL
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