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Patent Assignment Details
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Reel/Frame:016947/0213   Pages: 3
Recorded: 09/01/2005
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
NONE
Issue Dt:
Application #:
11178856
Filing Dt:
07/10/2005
Publication #:
Pub Dt:
12/21/2006
Title:
METHOD FOR MONITORING FILM THICKNESS USING HETERODYNE REFLECTOMETRY AND GRATING INTERFEROMETRY
Assignor
1
Exec Dt:
08/25/2005
Assignee
1
2901 EISENHOWER STREET
CARROLLTON, TEXAS 75007
Correspondence name and address
RUDOLPH J. BUCHEL, JR.
RUDOLPH J. BUCHEL, JR., P.C.
P.O. BOX 702526
DALLAS, TX 75370-2526

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