Patent Assignment Details
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| Reel/Frame: | 016444/0214 | |
| Pages: | 5 |
| | Recorded: | 04/11/2005 | | |
| Conveyance: | RERECORD TO CORRECT THE DOCUMENT EXECUTION DATE FOR THE 1ST AND 2ND ASSIGNOR, DOCUMENT PREVIOUSLY RECORDED ON REEL 014848 FRAME 0119. ASSIGNOR CONFIRMS THE ASSIGNMENT. |
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Total properties:
1
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Patent #:
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Issue Dt:
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06/13/2006
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Application #:
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10637347
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Filing Dt:
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08/08/2003
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Publication #:
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Pub Dt:
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02/10/2005
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Title:
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METHOD TO IMPROVE PHOTOMASK CRITICAL DIMENSION UNIFORMITY AND PHOTOMASK FABRICATION PROCESS
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Assignee
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| NO. 8, LI-HSIN ROAD 6 |
| SCIENCE BASED INDUSTRIAL PARK |
| SIN-CHU, TAIWAN 300-77, R.O.C. |
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Correspondence name and address
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WILLIAM H. MURRAY, ESQUIRE
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DUANE MORRIS LLP
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ONE LIBERTY PLACE
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PHILADELPHIA, PA 19103
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