Patent Assignment Details
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Reel/Frame: | 011491/0224 | |
| Pages: | 2 |
| | Recorded: | 01/29/2001 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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11/12/2002
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Application #:
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09770501
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Filing Dt:
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01/29/2001
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Publication #:
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Pub Dt:
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03/28/2002
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Title:
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EVALUATING PATTERN FOR MEASURING AN EROSION OF A SEMICONDUCTOR WAFER POLISHED BY A CHEMICAL MECHANICAL POLISHING
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Assignee
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7-12, TORANOMON 1-CHOME, MINATO-KU |
TOKYO, JAPAN |
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Correspondence name and address
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JONES VOLENTINE, LLC
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ADAM C. VOLENTINE
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12200 SUNRISE VALLEY DRIVE, SUITE 150
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RESTON, VA 20191
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